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EP0441153
European procedure
Extract from the Register of European Patents
EP About this file: EP0441153
| EP0441153 - Procedure and device for absolute interferometric testing of flat surfaces [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 30.03.1995 Database last updated on 03.09.2024 | Most recent event Tooltip | 30.03.1995 | No opposition filed within time limit | published on 17.05.1995 [1995/20] | Applicant(s) | For:CH
DE
FR
LI
NL
SE
Firma Carl Zeiss D-73446 Oberkochen / DE | For:GB
CARL-ZEISS-STIFTUNG, HANDELND ALS CARL ZEISS 73446 Oberkochen / DE | [N/P] |
| Former [1991/33] | For:CH
DE
FR
LI
NL
SE
Firma Carl Zeiss D-73446 Oberkochen / DE | ||
| For:GB
CARL-ZEISS-STIFTUNG, HANDELND ALS CARL ZEISS D-73446 Oberkochen / DE | Inventor(s) | 01 /
Küchel, Michael, Dr. Keplerstrasse 3 W-7082 Oberkochen / DE | [1991/33] | Application number, filing date | 91100644.3 | 19.01.1991 | [1991/33] | Priority number, date | DE19904003100 | 02.02.1990 Original published format: DE 4003100 | [1991/33] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP0441153 | Date: | 14.08.1991 | Language: | DE | [1991/33] | Type: | A3 Search report | No.: | EP0441153 | Date: | 23.10.1991 | Language: | DE | [1991/43] | Type: | B1 Patent specification | No.: | EP0441153 | Date: | 25.05.1994 | Language: | DE | [1994/21] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 05.09.1991 | Classification | IPC: | G01B11/30 | [1991/33] | CPC: |
G01B11/306 (EP,US)
| Designated contracting states | CH, DE, FR, GB, LI, NL, SE [1991/33] | Title | German: | Verfahren und Vorrichtung zur interferometrischen Absolutprüfung von Planflächen | [1991/33] | English: | Procedure and device for absolute interferometric testing of flat surfaces | [1991/33] | French: | Procédé et dispositif pour tester de façon absolue interférométriquement des surfaces planes | [1991/33] | Examination procedure | 17.03.1992 | Examination requested [1992/20] | 09.07.1993 | Despatch of communication of intention to grant (Approval: No) | 15.11.1993 | Despatch of communication of intention to grant (Approval: later approval) | 22.11.1993 | Communication of intention to grant the patent | 03.02.1994 | Fee for grant paid | 03.02.1994 | Fee for publishing/printing paid | Opposition(s) | 28.02.1995 | No opposition filed within time limit [1995/20] | Fees paid | Renewal fee | 24.12.1992 | Renewal fee patent year 03 | 11.12.1993 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4859061 (INOUE KATSUYO [JP]); | [A]DE3443175 (AKAD WISSENSCHAFTEN DDR [DD]) |