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EP0442630
European procedure
Extract from the Register of European Patents
EP About this file: EP0442630
| EP0442630 - Combined scanning electron and scanning tunnelling microscope apparatus and method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 24.10.1997 Database last updated on 11.01.2025 | Most recent event Tooltip | 24.10.1997 | No opposition filed within time limit | published on 10.12.1997 [1997/50] | Applicant(s) | For all designated states Hitachi, Ltd. 6, Kanda Surugadai 4-chome Chiyoda-ku Tokyo 101 / JP | [N/P] |
| Former [1991/34] | For all designated states HITACHI, LTD. 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 101 / JP | Inventor(s) | 01 /
Yamada, Osamu 1938-13 Tsuda Katsuta-shi, Ibaraki 312 / JP | 02 /
Hazaki, Eiichi 14-27 Kandatsu chuo-2-chome Tsuchiura-shi, Ibaraki 300 / JP | 03 /
Nakaizumi, Yasushi 2032-35 Tsuda Katsuta-shi, Ibaraki 312 / JP | [1991/34] | Representative(s) | Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB | [N/P] |
| Former [1991/34] | Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB | Application number, filing date | 91300656.5 | 29.01.1991 | [1991/34] | Priority number, date | JP19900031142 | 09.02.1990 Original published format: JP 3114290 | [1991/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0442630 | Date: | 21.08.1991 | Language: | EN | [1991/34] | Type: | A3 Search report | No.: | EP0442630 | Date: | 15.01.1992 | Language: | EN | [1992/03] | Type: | B1 Patent specification | No.: | EP0442630 | Date: | 18.12.1996 | Language: | EN | [1996/51] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.11.1991 | Classification | IPC: | H01J37/28, G01N27/00 | [1991/34] | CPC: |
G01Q30/02 (EP,US);
B82Y35/00 (US);
G01Q10/06 (EP,US);
G01Q30/04 (EP,US);
G01Q60/16 (EP,US);
H01J37/28 (EP,US);
Y10S977/861 (EP,US)
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| Designated contracting states | DE, GB [1991/34] | Title | German: | In einem Gerät zusammengefügtes Rasterelektronenmikroskop und Rastertunnelmikroskop und Verfahren | [1991/34] | English: | Combined scanning electron and scanning tunnelling microscope apparatus and method | [1991/34] | French: | Appareil combinant un microscope électronique à balayage et un microscope à balayage à effet tunnel et méthode | [1991/34] | Examination procedure | 20.03.1991 | Examination requested [1991/34] | 16.12.1994 | Despatch of a communication from the examining division (Time limit: M04) | 10.03.1995 | Reply to a communication from the examining division | 19.02.1996 | Despatch of communication of intention to grant (Approval: Yes) | 24.06.1996 | Communication of intention to grant the patent | 16.09.1996 | Fee for grant paid | 16.09.1996 | Fee for publishing/printing paid | Opposition(s) | 19.09.1997 | No opposition filed within time limit [1997/50] | Fees paid | Renewal fee | 22.01.1993 | Renewal fee patent year 03 | 21.01.1994 | Renewal fee patent year 04 | 23.01.1995 | Renewal fee patent year 05 | 23.01.1996 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]GB2197752 (JAPAN RES DEV CORP, et al); | [A]EP0110301 (TOKYO SHIBAURA ELECTRIC CO [JP]) | [A] - REVIEW OF SCIENTIFIC INSTRUMENTS. vol. 59, no. 8, 1988, NEW YORK US pages 1286 - 1289; L. VAZQUEZ ET AL.: 'COMBINATION OF STM WITH SEM' |