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EP0449417
European procedure
Extract from the Register of European Patents
EP About this file: EP0449417
| EP0449417 - Testing random access memories [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 19.07.1996 Database last updated on 19.07.2024 | Most recent event Tooltip | 19.07.1996 | No opposition filed within time limit | published on 04.09.1996 [1996/36] | Applicant(s) | For all designated states Sony Corporation 7-35 Kitashinagawa 6-chome Shinagawa-ku Tokyo 141 / JP | [N/P] |
| Former [1991/40] | For all designated states SONY CORPORATION 7-35 Kitashinagawa 6-chome Shinagawa-ku Tokyo 141 / JP | Inventor(s) | 01 /
Huckstepp, Stephen Arthur 9 Darant Court, Riverdene, Basingstoke Hampshire, RG21 2DH / GB | [1991/40] | Representative(s) | Cotter, Ivan John, et al D Young & Co LLP 120 Holborn London EC1N 2DY / GB | [N/P] |
| Former [1991/40] | Cotter, Ivan John, et al D. YOUNG & CO. 21 New Fetter Lane London EC4A 1DA / GB | Application number, filing date | 91301400.7 | 21.02.1991 | [1991/40] | Priority number, date | GB19900006915 | 28.03.1990 Original published format: GB 9006915 | [1991/40] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0449417 | Date: | 02.10.1991 | Language: | EN | [1991/40] | Type: | A3 Search report | No.: | EP0449417 | Date: | 02.09.1992 | Language: | EN | [1992/36] | Type: | B1 Patent specification | No.: | EP0449417 | Date: | 13.09.1995 | Language: | EN | [1995/37] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.07.1992 | Classification | IPC: | G11C29/00 | [1991/40] | CPC: |
G11C29/10 (EP,US)
| Designated contracting states | DE, FR, GB [1991/40] | Title | German: | Prüfen von Direktzugriffsspeichern | [1991/40] | English: | Testing random access memories | [1991/40] | French: | Test de mémoires à accès aléatoire | [1991/40] | Examination procedure | 23.01.1993 | Examination requested [1993/12] | 05.12.1994 | Despatch of communication of intention to grant (Approval: Yes) | 17.03.1995 | Communication of intention to grant the patent | 05.05.1995 | Fee for grant paid | 05.05.1995 | Fee for publishing/printing paid | Opposition(s) | 14.06.1996 | No opposition filed within time limit [1996/36] | Fees paid | Renewal fee | 13.02.1993 | Renewal fee patent year 03 | 10.02.1994 | Renewal fee patent year 04 | 26.01.1995 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y] - IBM TECHNICAL DISCLOSURE BULLETIN. vol. 27, no. 4A, September 1984, NEW YORK US pages 1984 - 1987; D.C. HAIGH: 'Data patterns for bus or RAM checkout' | [Y] - PROCEEDINGS OF THE INTERNATIONAL TEST CONFEREN- CE, September 1-3, 1987, pages 759-764, IEEE, New York, US; E.F. SARKANY ET AL.:' Minimal set of patterns to test RAM components' | [A] - DIGEST OF PAPERS OF THE 1980 TEST CONFERENCE, November 11-13, 1980, pages 131-136, IEEE, New York, US; F.D. PATCH ET AL.:'Evaluation of array tests' |