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Extract from the Register of European Patents

EP About this file: EP0447241

EP0447241 - Electron beam exposure system having an improved data transfer efficiency [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  18.04.1997
Database last updated on 16.09.2024
Most recent event   Tooltip17.02.2006Change - lapse in a contracting state
Updated state(s): FR
published on 05.04.2006  [2006/14]
Applicant(s)For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku Kawasaki-shi
Kanagawa 211 / JP
[N/P]
Former [1991/38]For all designated states
FUJITSU LIMITED
1015, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa 211 / JP
Inventor(s)01 / Fueki, Shunsuke
7-1-16-303, Hiyoshi, Kouhoku-ku
Yokohama-shi, Kanagawa 223 / JP
[1991/38]
Representative(s)Fane, Christopher Robin King, et al
Haseltine Lake & Co., Imperial House, 15-19 Kingsway
London WC2B 6UD / GB
[N/P]
Former [1991/38]Fane, Christopher Robin King, et al
HASELTINE LAKE & CO. Hazlitt House 28 Southampton Buildings Chancery Lane
London, WC2A 1AT / GB
Application number, filing date91302179.614.03.1991
[1991/38]
Priority number, dateJP1990006328914.03.1990         Original published format: JP 6328990
[1991/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0447241
Date:18.09.1991
Language:EN
[1991/38]
Type: A3 Search report 
No.:EP0447241
Date:22.01.1992
Language:EN
[1992/04]
Type: B1 Patent specification 
No.:EP0447241
Date:12.06.1996
Language:EN
[1996/24]
Search report(s)(Supplementary) European search report - dispatched on:EP29.11.1991
ClassificationIPC:H01J37/302, H01J37/317
[1992/04]
CPC:
B82Y10/00 (EP,US); H01J37/3174 (EP,US); B82Y40/00 (EP,US);
H01J37/3026 (EP,US); H01J2237/30416 (EP,US)
Former IPC [1991/38]H01J37/317, H01J37/302
Designated contracting statesDE,   FR,   GB [1991/38]
TitleGerman:Elektronenstrahl-Belichtungssystem mit verbesserter Datenübertragungsleistung[1991/38]
English:Electron beam exposure system having an improved data transfer efficiency[1991/38]
French:Système d'exposition par faisceau d'électrons à efficacité de transfert de données améliorée[1991/38]
Examination procedure25.03.1992Examination requested  [1992/21]
24.07.1995Despatch of communication of intention to grant (Approval: Yes)
09.10.1995Communication of intention to grant the patent
02.01.1996Fee for grant paid
02.01.1996Fee for publishing/printing paid
Opposition(s)13.03.1997No opposition filed within time limit [1997/23]
Fees paidRenewal fee
11.03.1993Renewal fee patent year 03
11.03.1994Renewal fee patent year 04
09.03.1995Renewal fee patent year 05
26.03.1996Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR12.06.1996
[2006/14]
Former [1997/17]FR08.11.1996
Documents cited:Search[A]US4641252  (TOKITA MASAKAZU [JP]);
 [A]EP0064639  ;
 [A]EP0327093  (FUJITSU LTD [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.