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EP0487300
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EP About this file: EP0487300
| EP0487300 - Scanning probe microscopy [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 16.05.1995 Database last updated on 02.11.2024 | Most recent event Tooltip | 16.05.1995 | Application deemed to be withdrawn | published on 05.07.1995 [1995/27] | Applicant(s) | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho, Saiwai-ku Kawasaki-shi Kanagawa-ken 210-8572 / JP | [N/P] |
| Former [1995/01] | For all designated states KABUSHIKI KAISHA TOSHIBA 72, Horikawa-cho, Saiwai-ku Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP | ||
| Former [1992/22] | For all designated states Kabushiki Kaisha Toshiba 72, Horikawa-cho Saiwai-ku Kawasaki-shi / JP | Inventor(s) | 01 /
Watanabe, Miyoko, c/o Intellectual Property Div. Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome Minato-ku, Tokyo 105 / JP | 02 /
Tanaka, Kuniyoshi, c/o Intellectual Property Div. Kabushiki Kaisha Toshiba, 1-1 Shibaura 1-chome Minato-ku, Tokyo 105 / JP | [1992/22] | Representative(s) | Freed, Arthur Woolf, et al Marks & Clerk Incorporating Edward Evans Barker 90 Long Acre London WC2E 9RA / GB | [N/P] |
| Former [1992/22] | Freed, Arthur Woolf, et al MARKS & CLERK, 57-60 Lincoln's Inn Fields London WC2A 3LS / GB | Application number, filing date | 91310645.6 | 19.11.1991 | [1992/22] | Priority number, date | JP19900312904 | 20.11.1990 Original published format: JP 31290490 | JP19910056871 | 20.03.1991 Original published format: JP 5687191 | [1992/22] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0487300 | Date: | 27.05.1992 | Language: | EN | [1992/22] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 10.03.1992 | Classification | IPC: | G01N27/00, G01B7/34 | [1992/22] | CPC: |
G01Q10/065 (EP,US);
Y10S977/851 (EP,US)
| Designated contracting states | DE, GB [1992/22] | Title | German: | Rastertunnelmikroskop | [1992/22] | English: | Scanning probe microscopy | [1992/22] | French: | Microscope à balayage à effet tunnel | [1992/22] | File destroyed: | 03.03.2001 | Examination procedure | 11.12.1991 | Examination requested [1992/22] | 23.08.1994 | Despatch of a communication from the examining division (Time limit: M04) | 03.01.1995 | Application deemed to be withdrawn, date of legal effect [1995/27] | 06.02.1995 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [1995/27] | Fees paid | Renewal fee | 08.11.1993 | Renewal fee patent year 03 | 15.11.1994 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4877957 (OKADA TAKAO [JP], et al); | [A]EP0338083 (HITACHI LTD [JP]) | [A] - REVIEW OF SCIENTIFIC INSTRUMENTS. vol. 60, no. 10, October 1989, NEW YORK US pages 3113 - 3118; G.E. POIRIER ET AL.: 'A NEW ULTRA-HIGH VACUUM SCANNING TUNNELING MICROSCOPE DESIGN FOR SURFACE SCIENCE STUDIES' | [A] - JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART A. vol. 8, no. 1, January 1990, NEW YORK US pages 327 - 329; M.O. WATANABE ET AL.: 'HIGH-TEMPERATURE SCANNING TUNNELING MICROSCOPE' |