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Extract from the Register of European Patents

EP About this file: EP0489580

EP0489580 - Confocal laser scanning differential interference contrast microscope [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.01.1997
Database last updated on 14.11.2024
Most recent event   Tooltip03.01.1997No opposition filed within time limitpublished on 19.02.1997 [1997/08]
Applicant(s)For all designated states
NIKON CORPORATION
2-3, Marunouchi 3-chome
Chiyoda-Ku
Tokyo / JP
[N/P]
Former [1992/24]For all designated states
NIKON CORPORATION
2-3, Marunouchi 3-chome Chiyoda-ku
Tokyo / JP
Inventor(s)01 / Oki, Hiroshi
Azamino Riiberu B-204, 1-4 Susukino 1-chome
Midori-ku, Yokohama-shi, Kanagawa-ken / JP
02 / Iwasaki, Jun
Daisan Ohfuna Pakutaun g-710, 1555-1 Kasama-cho
Sakae-ku, Yokohama-shi, Kanagawa-ken / JP
[1992/24]
Representative(s)Burke, Steven David, et al
R.G.C. Jenkins & Co 26 Caxton Street
London SW1H 0RJ / GB
[N/P]
Former [1992/24]Burke, Steven David, et al
R.G.C. Jenkins & Co. 26 Caxton Street
London SW1H 0RJ / GB
Application number, filing date91311256.103.12.1991
[1992/24]
Priority number, dateJP1990040021203.12.1990         Original published format: JP 40021290
JP1991006310727.03.1991         Original published format: JP 6310791
[1992/24]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0489580
Date:10.06.1992
Language:EN
[1992/24]
Type: B1 Patent specification 
No.:EP0489580
Date:28.02.1996
[1996/09]
Search report(s)(Supplementary) European search report - dispatched on:EP09.03.1992
ClassificationIPC:G02B21/00
[1992/24]
CPC:
B82Y15/00 (EP); G02B21/0056 (EP); G02B21/008 (EP)
Designated contracting statesDE,   FR,   GB [1992/24]
TitleGerman:Konfokales Laser-Abtastmikroskop mit Kontrast durch Differenz aus Interferenzsignalen[1992/24]
English:Confocal laser scanning differential interference contrast microscope[1992/24]
French:Microscope confocal à balayage laser de contraste d'interférence différentielle[1992/24]
Examination procedure27.10.1992Examination requested  [1992/52]
28.04.1994Despatch of a communication from the examining division (Time limit: M06)
01.12.1994Reply to a communication from the examining division
11.04.1995Despatch of communication of intention to grant (Approval: No)
17.08.1995Despatch of communication of intention to grant (Approval: later approval)
23.08.1995Communication of intention to grant the patent
29.11.1995Fee for grant paid
29.11.1995Fee for publishing/printing paid
Opposition(s)29.11.1996No opposition filed within time limit [1997/08]
Request for further processing for:01.12.1994Request for further processing filed
05.12.1994Full payment received (date of receipt of payment)
Request granted
19.12.1994Decision despatched
Fees paidRenewal fee
13.12.1993Renewal fee patent year 03
07.12.1994Renewal fee patent year 04
08.12.1995Renewal fee patent year 05
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Documents cited:Search[A]JP2267513  ;
 [A]EP0274155  ;
 [A]WO8906813
 [A]  - PATENT ABSTRACTS OF JAPAN vol. 15, no. 23 (P-1155)(4551) 18 January 1991 & JP-A-2 267 513 ( NIKON CORP. ) 1 November 1990, & JP2267513 A 19901101
 [XP]  - OPTICS COMMUNICATIONS. vol. 85, no. 2/3, 1 September 1991, AMSTERDAM NL pages 177 - 182; OOKI ET AL.: 'A novel type of laser scanning microscope: theoretical considerations'
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.