EP0552394 - Method and apparatus for adjusting the wavelength in an optical device and laser using the method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 26.08.1995 Database last updated on 21.05.2024 | Most recent event Tooltip | 26.08.1995 | No opposition filed within time limit | published on 18.10.1995 [1995/42] | Applicant(s) | For all designated states Hewlett-Packard GmbH Postfach 14 30 D-71004 Böblingen / DE | [1993/30] | Inventor(s) | 01 /
Becker, Michael, Dr. Bergstrasse 26 W-7034 Gärtringen 2 / DE | 02 /
Müller, Emmerich Finkenweg 7 W-7042 Aidlingen 3 / DE | 03 /
Reichert, Wolfgang Oberer Wengertweg 33 W-7042 Aidlingen 2 / DE | [1993/30] | Representative(s) | Harbach, Thomas Agilent Technologies Deutschland GmbH Patentabteilung Herrenbergerstrasse 130 71034 Böblingen / DE | [N/P] |
Former [1993/30] | Harbach, Thomas Hewlett-Packard GmbH, Europ. Patent- und Lizenzabteilung, Postfach 14 30 D-71004 Böblingen / DE | Application number, filing date | 92101168.0 | 24.01.1992 | [1993/30] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0552394 | Date: | 28.07.1993 | Language: | EN | [1993/30] | Type: | B1 Patent specification | No.: | EP0552394 | Date: | 26.10.1994 | Language: | EN | [1994/43] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.08.1992 | Classification | IPC: | G02B27/00, G01J3/26, H01S3/106, H01S3/1055 | [1994/43] | CPC: |
H01S3/1055 (EP,US);
H01S3/106 (EP,US);
H01S5/141 (EP,US)
|
Former IPC [1993/30] | H01S3/106, H01S3/1055 | Designated contracting states | DE, FR, GB, IT, SE [1993/30] | Title | German: | Verfahren und Apparat zum Abstimmen der Wellenlänge in einer optischen Vorrichtung und deren Anwendung in einem Laser | [1994/43] | English: | Method and apparatus for adjusting the wavelength in an optical device and laser using the method | [1993/30] | French: | Méthode et appareil pour ajuster la longueur d'onde dans un dispositif optique et laser utilisant la méthode | [1993/30] |
Former [1993/30] | Verfahren und Apparat zum Nachstellen der Wellenlänge einer optischen Anlage und Laser zum Benuzten eines solchen Verfahrens | Examination procedure | 20.01.1993 | Examination requested [1993/30] | 12.04.1994 | Despatch of communication of intention to grant (Approval: Yes) | 28.04.1994 | Communication of intention to grant the patent | 06.05.1994 | Fee for grant paid | 06.05.1994 | Fee for publishing/printing paid | Opposition(s) | 27.07.1995 | No opposition filed within time limit [1995/42] | Fees paid | Renewal fee | 19.01.1994 | Renewal fee patent year 03 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US3622909 (WOODCOCK BRIAN HANSON, et al) | [Y] - APPLIED SPECTROSCOPY vol. 35, no. 6, November 1981, BALTIMORE pages 593 - 598; G.J.BEENEN ET AL.: 'ACCURATE WAVELENGHT CALIBRATION OF AN ETALON-TUNED DYE LASER' | [Y] - APPLIED OPTICS vol. 15, no. 2, February 1976, pages 472 - 476; M.OKADA ET AL.: 'TILTED BIREFRINGENT FABRY-PEROT ETALON FOR TUNING DYE LASERS' | [Y] - LASER FOCUS/ELECTRO-OPTICS vol. 21, no. 11, November 1985, LITTLETON pages 92 - 106; D.W.SMITH: 'COHERENT FIBEROPTIC COMMUNICATIONS' |