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Extract from the Register of European Patents

EP About this file: EP0507052

EP0507052 - Contamination dosimeter with radiation-RAM for alpha particles [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.10.1993
Database last updated on 03.10.2024
Most recent event   Tooltip20.10.1993Application deemed to be withdrawnpublished on 08.12.1993 [1993/49]
Applicant(s)For all designated states
MIKROELEKTRONIK UND TECHNOLOGIE GESELLSCHAFT mbH
Grenzstrasse 28, PF 34
01109 Dresden / DE
[N/P]
Former [1992/41]For all designated states
MIKROELEKTRONIK UND TECHNOLOGIE GESELLSCHAFT mbH
Grenzstrasse 28, PF 34
D-01109 Dresden / DE
Inventor(s)01 / Junghans, Bernd, Prof. Dr.
Strasse der Befreiung 2
O-8060 Dresden / DE
02 / Hübler, Peter
Leutewitzer Ring 70
O-8038 Dresden / DE
03 / Streil, Thomas, Dr.
Helbigsdorfer Weg 20
O-8038 Dresden / DE
04 / Kelm, Georg, Dr.
Alexander-Herzen-Strasse 32
O-8080 Dresden / DE
05 / Sauer, Bodo
Lange Strasse 41
O-8028 Dresden / DE
06 / Scade, Andreas, Dipl.-Phys.
Schützenhofstrasse 6
O-8023 Dresden / DE
07 / Raab, Michael
Mittlere Bergstrasse 57
O-8122 Radebeul / DE
08 / Mach, Wolfgang
Leutewitzer Strasse 23
O-8010 Dresden / DE
09 / Jähne, Rolf
Rostocker Strasse 13
O-8080 Dresden / DE
10 / Kluge, Wolfram
Alexander-Herzen-Strasse 30
O-8080 Dresden / DE
11 / Lippmann, Frank, Dr.
Liebigstrasse 22
O-8027 Dresden / DE
12 / Ullmann, Werner, Dr.
Helmholtzstrasse 32
O-1160 Berlin / DE
13 / Feddersen, Christian, Dr.
K.-Polcern-Strasse 14
O-1162 Berlin / DE
[1992/41]
Application number, filing date92101581.431.01.1992
[1992/41]
Priority number, dateDE1991411009028.03.1991         Original published format: DE 4110090
[1992/41]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0507052
Date:07.10.1992
Language:DE
[1992/41]
Search report(s)(Supplementary) European search report - dispatched on:EP03.08.1992
ClassificationIPC:G01T1/00
[1992/41]
CPC:
G01T1/026 (EP)
Designated contracting statesAT,   BE,   CH,   DK,   ES,   FR,   GB,   GR,   IT,   LI,   LU,   NL,   PT,   SE [1992/41]
TitleGerman:Kontaminationsdosimeter mit Radiation-RAM für Alpha-Strahlen[1992/41]
English:Contamination dosimeter with radiation-RAM for alpha particles[1992/41]
French:Dosimètre de contamination muni d'une radiation-RAM pour rayons alpha[1992/41]
File destroyed:16.08.2001
Examination procedure08.04.1993Application deemed to be withdrawn, date of legal effect  [1993/49]
13.07.1993Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [1993/49]
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US4983843  ;
 [A]US4413401  ;
 [AD]DE3049153  ;
 [AD]DE2926491  ;
 [Y]JPS6361983
 [Y]  - PATENT ABSTRACTS OF JAPAN vol. 12no. 284 (P-740)4. August 1988 & JP-A-63 061 983 ( NEC CORP. ) 18. März 1988
 [Y]  - IEEE TRANSACTIONS ON ELECTRON DEVICES. Bd. 37, Nr. 3, M{rz 1990NEW YORK US Seiten 804 - 806; J.W. PABST ET AL.: 'Ion-Implanted p-n Junction Capacitors for Ga-As DRAM's'
 [A]  - IEEE TRANSACTIONS ON ELECTRON DEVICES. Bd. 36, Nr. 9-I, September 1989NEW YORK US Seiten 1644 - 1650; KAN TAKEUCHI ET AL.: 'Alpha-particle-induced charge collection measurements for Megabit DRAM cell'
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.