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EP0534547
European procedure
Extract from the Register of European Patents
EP About this file: EP0534547
| EP0534547 - X-ray detector with charge pattern read-out [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 11.07.1997 Database last updated on 06.07.2024 | Most recent event Tooltip | 07.12.2007 | Lapse of the patent in a contracting state New state(s): NL | published on 09.01.2008 [2008/02] | Applicant(s) | For all designated states Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
| Former [1993/13] | For all designated states Philips Electronics N.V. Groenewoudseweg 1 NL-5621 BA Eindhoven / NL | Inventor(s) | 01 /
Van Aller, Gerardus, c/o INT. OCTROOIBUREAU B.V. Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | 02 /
Schiebel, Ulrich, c/o INT. OCTROOIBUREAU B.V. Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | [1993/13] | Representative(s) | Schouten, Marcus Maria, et al NXP B.V. Intellectual Property & Licensing High Tech Campus 60 5656 AG Eindhoven / NL | [N/P] |
| Former [1994/48] | Schouten, Marcus Maria, et al INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | ||
| Former [1993/13] | Zwaan, Andries Willem INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | Application number, filing date | 92202881.6 | 21.09.1992 | [1993/13] | Priority number, date | EP19910202532 | 27.09.1991 Original published format: EP 91202532 | [1993/13] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0534547 | Date: | 31.03.1993 | Language: | EN | [1993/13] | Type: | A3 Search report | No.: | EP0534547 | Date: | 06.10.1993 | Language: | EN | [1993/40] | Type: | B1 Patent specification | No.: | EP0534547 | Date: | 04.09.1996 | Language: | EN | [1996/36] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 18.08.1993 | Classification | IPC: | G01T1/28, H01J1/54, H01J1/78 | [1993/13] | CPC: |
H01J31/507 (EP,US);
G01T1/28 (EP,US);
H01J2231/50036 (EP,US);
H01J2231/50068 (EP,US)
| Designated contracting states | DE, FR, GB, IT, NL [1993/13] | Title | German: | Röntgendetektor mit Auslesung des Ladungsmusters | [1993/13] | English: | X-ray detector with charge pattern read-out | [1993/13] | French: | Détecteur de rayons X avec lecture d'image de charge | [1993/13] | Examination procedure | 23.03.1994 | Examination requested [1994/22] | 07.06.1995 | Despatch of a communication from the examining division (Time limit: M04) | 07.07.1995 | Reply to a communication from the examining division | 26.10.1995 | Despatch of communication of intention to grant (Approval: Yes) | 07.03.1996 | Communication of intention to grant the patent | 17.06.1996 | Fee for grant paid | 17.06.1996 | Fee for publishing/printing paid | Opposition(s) | 05.06.1997 | No opposition filed within time limit [1997/35] | Fees paid | Renewal fee | 28.09.1994 | Renewal fee patent year 03 | 02.10.1995 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 04.09.1996 | NL | 04.09.1996 | [2003/07] |
| Former [1999/42] | IT | 04.09.1996 | Documents cited: | Search | [A]US3699375 (WEIBEL GERHARD E); | [X]US4204118 (SHELDON EDWARD E [US]); | [A]US4300046 (WANG SHIH-PING); | [AD]US4382187 (FRALEUX JEAN [FR], et al); | [AD]US4413280 (ADLERSTEIN JOSEPH K [US], et al); | [A]US4482619 (BAYER EBERHARD [DE]) |