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EP0499357
European procedure
Extract from the Register of European Patents
EP About this file: EP0499357
| EP0499357 - Ion beam potential detection probe [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 28.02.1997 Database last updated on 03.08.2024 | Most recent event Tooltip | 28.02.1997 | No opposition filed within time limit | published on 16.04.1997 [1997/16] | Applicant(s) | For all designated states EATON CORPORATION Eaton Center Cleveland Ohio 44114 / US | [N/P] |
| Former [1992/34] | For all designated states EATON CORPORATION Eaton Center Cleveland, Ohio 44114 / US | Inventor(s) | 01 /
Sferlazzo, Piero 11 Doncaster Road Lynnfield, Massachusetts 01940 / US | [1992/34] | Representative(s) | Musker, David Charles, et al RGC Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB | [N/P] |
| Former [1996/18] | Musker, David Charles, et al R.G.C. Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB | ||
| Former [1992/34] | Wright, Peter David John, et al R.G.C. Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB | Application number, filing date | 92300354.5 | 16.01.1992 | [1992/34] | Priority number, date | US19910647509 | 29.01.1991 Original published format: US 647509 | [1992/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0499357 | Date: | 19.08.1992 | Language: | EN | [1992/34] | Type: | A3 Search report | No.: | EP0499357 | Date: | 26.08.1992 | Language: | EN | [1992/35] | Type: | B1 Patent specification | No.: | EP0499357 | Date: | 17.04.1996 | Language: | EN | [1996/16] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 08.07.1992 | Classification | IPC: | H01J37/317, H01J37/244 | [1992/34] | CPC: |
H01J37/026 (EP,US);
H01L21/42 (KR);
H01J37/244 (EP,US);
H01J37/3171 (EP,US);
H01J2237/24455 (EP,US);
H01J2237/2449 (EP,US);
H01J2237/24585 (EP,US)
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| Designated contracting states | DE, FR, GB, IT [1992/34] | Title | German: | Vorrichtung zur Messung eines Ionenstrahlpotentials | [1992/34] | English: | Ion beam potential detection probe | [1992/34] | French: | Sonde de détection du potentiel d'un faisceau d'ions | [1992/34] | Examination procedure | 26.11.1992 | Examination requested [1993/03] | 07.11.1994 | Despatch of a communication from the examining division (Time limit: M04) | 16.03.1995 | Reply to a communication from the examining division | 09.06.1995 | Despatch of communication of intention to grant (Approval: Yes) | 19.10.1995 | Communication of intention to grant the patent | 26.01.1996 | Fee for grant paid | 26.01.1996 | Fee for publishing/printing paid | Opposition(s) | 18.01.1997 | No opposition filed within time limit [1997/16] | Fees paid | Renewal fee | 20.12.1993 | Renewal fee patent year 03 | 09.01.1995 | Renewal fee patent year 04 | 08.01.1996 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JP2056842 ; | [A]JP63284500 ; | [A]US4361762 (DOUGLAS EDWARD C); | [A]FR2462718 (BALZERS HOCHVAKUUM [LI]); | [A]EP0397120 (SUMITOMO EATON NOVA [JP]) | [A] - PATENT ABSTRACTS OF JAPAN vol. 14, no. 222 (E-926)10 May 1990 & JP-A-2 056 842 ( NEC CORP. ) 26 February 1990, & JP2056842 A 19900226 | [A] - PATENT ABSTRACTS OF JAPAN vol. 13, no. 104 (P-842)13 March 1989 & JP-A-63 284 500 ( FUJITSU LTD. ) 21 November 1988, & JP63284500 A 19881121 |