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EP0509849
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EP About this file: EP0509849
| EP0509849 - Measuring the cross-sectional distribution of the refractive index of an optical waveguide [Right-click to bookmark this link] | Status | The application has been refused Status updated on 18.04.1997 Database last updated on 18.01.2025 | Most recent event Tooltip | 18.04.1997 | Change - refusal | published on 04.06.1997 [1997/23] | Applicant(s) | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo / JP | [N/P] |
| Former [1992/43] | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo / JP | Inventor(s) | 01 /
Gisin, Nicolas 12, ch. Champendal 1206 Geneva / CH | 02 /
Stamp, Patrick 20, rue J. Dalphin CH-1227 Carouge / CH | 03 /
Hori, Nobuo, c/o Kabushiki Kaisha Topcon 75-1, Hasunuma-cho, Itabashi-ku Tokyo-to / CH | [1992/43] | Representative(s) | Maggs, Michael Norman, et al Kilburn & Strode LLP 20 Red Lion Street London WC1R 4PJ / GB | [N/P] |
| Former [1992/43] | Maggs, Michael Norman, et al Kilburn & Strode 30 John Street London WC1N 2DD / GB | Application number, filing date | 92303545.5 | 21.04.1992 | [1992/43] | Priority number, date | JP19910115481 | 19.04.1991 Original published format: JP 11548191 | [1992/43] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0509849 | Date: | 21.10.1992 | Language: | EN | [1992/43] | Type: | A3 Search report | No.: | EP0509849 | Date: | 28.07.1993 | Language: | EN | [1993/30] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 07.06.1993 | Classification | IPC: | G01N21/41 | [1992/43] | CPC: |
G01N21/412 (EP,US)
| Designated contracting states | CH, DE, FR, GB, LI [1992/43] | Title | German: | Verfahren zur Messung der Brechungsindexquerschnittverteilung eines optischen Wellenleiters | [1992/43] | English: | Measuring the cross-sectional distribution of the refractive index of an optical waveguide | [1992/43] | French: | Procédé pour mesurer la repartition transversale de l'indice de réfraction d'un guide d'ondes optique | [1992/43] | Examination procedure | 27.01.1994 | Examination requested [1994/13] | 02.02.1996 | Despatch of communication of intention to grant (Approval: ) | 13.06.1996 | Application refused, date of legal effect [1997/22] | 10.07.1996 | Despatch of communication that the application is refused, reason: formalities examination [1997/22] | 10.07.1996 | Despatch of communication that the application is refused, reason: formalities examination [1997/23] | 20.07.1996 | Application refused, date of legal effect [1997/23] | Fees paid | Renewal fee | 11.04.1994 | Renewal fee patent year 03 | 04.04.1995 | Renewal fee patent year 04 | 16.04.1996 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AE]JP02244106 ; | [A]US3873209 (SCHINKE DAVID PAUL, et al) | [A] - NACHRICHTEN TECHNIK ELEKTRONIK vol. 36, no. 4, 1986, BERLIN DE pages 139 - 142 S. ROSSNER: 'Ermittlung des Brechzahlprofilverlaufs von Multi- und Monomode-Lichwellenleitern mit Hilfe des Refracted Near-Field-Messverfahren' | [AE] - PATENT ABSTRACTS OF JAPAN vol. 14, no. 569 (P-1144)18 December 1990 & JP-A-02 244 106 ( HITACHI ) 28 September 1990, & JP02244106 A 19900928 |