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Extract from the Register of European Patents

EP About this file: EP0532241

EP0532241 - Calibration method and apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  29.05.1998
Database last updated on 22.08.2024
Most recent event   Tooltip29.05.1998No opposition filed within time limitpublished on 15.07.1998 [1998/29]
Applicant(s)For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
[N/P]
Former [1997/06]For all designated states
International Business Machines Corporation
Old Orchard Road
Armonk, N.Y. 10504 / US
Former [1993/11]For all designated states
INTERNATIONAL BUSINESS MACHINES CORPORATION
Old Orchard Road
Armonk, N.Y. 10504 / US
Inventor(s)01 / Call, David Ernest
2440 Placita de Clavel
Tucson, Arizona 85749 / US
02 / Lewkowicz, Julian
8032 E Presidio
Tucson, Arizona 85715 / US
[1993/11]
Representative(s)Burt, Roger James
IBM United Kingdom Limited Intellectual Property Department Hursley Park Winchester
Hampshire SO21 2JN / GB
[N/P]
Former [1993/11]Burt, Roger James, Dr.
IBM United Kingdom Limited Intellectual Property Department Hursley Park
Winchester Hampshire SO21 2JN / GB
Application number, filing date92308043.604.09.1992
[1993/11]
Priority number, dateUS1991075774811.09.1991         Original published format: US 757748
[1993/11]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0532241
Date:17.03.1993
Language:EN
[1993/11]
Type: A3 Search report 
No.:EP0532241
Date:06.04.1994
Language:EN
[1994/14]
Type: B1 Patent specification 
No.:EP0532241
Date:23.07.1997
Language:EN
[1997/30]
Search report(s)(Supplementary) European search report - dispatched on:EP16.02.1994
ClassificationIPC:G11B7/125, G11B7/09, H01S3/00
[1994/13]
CPC:
G11B7/126 (EP,US)
Former IPC [1993/11]G11B7/125, G11B7/09
Designated contracting statesDE,   FR,   GB [1993/11]
TitleGerman:Kalibrierungsverfahren und -vorrichtung[1993/11]
English:Calibration method and apparatus[1993/11]
French:Méthode et appareil d'étalonnage[1993/11]
Examination procedure16.07.1993Examination requested  [1993/36]
22.11.1995Despatch of a communication from the examining division (Time limit: M04)
21.03.1996Reply to a communication from the examining division
11.10.1996Despatch of communication of intention to grant (Approval: Yes)
22.01.1997Communication of intention to grant the patent
11.02.1997Fee for grant paid
11.02.1997Fee for publishing/printing paid
Opposition(s)24.04.1998No opposition filed within time limit [1998/29]
Fees paidRenewal fee
27.09.1994Renewal fee patent year 03
07.09.1995Renewal fee patent year 04
21.09.1996Renewal fee patent year 05
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Documents cited:Search[DA]US4785443  (MINAMI AKIRA [JP], et al) [DA] 1,15,17 * column 8, line 55 - line 58 * * column 2, line 44 - line 64 * * claims 1-3,5,24,25 *;
 [A]US5018155  (MIYAIRI NOBUO [JP]) [A] 1-3,15,17 * column 6, line 56 - column 7, line 18 * * column 7, line 33 - line 35 * * figure 2; claims 1,3,5,7,9,11 *;
 [A]US4747091  (DOI MASANORI [JP]) [A] 11 * column 8, line 16 - column 9, line 45; figure 1; claims 4,5 *;
 [PA]EP0467616  (IBM [US]) [PA] 11 * column 11, line 1 - line 14 *;
 [A]EP0352125  (SHARP KK [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.