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Extract from the Register of European Patents

EP About this file: EP0579286

EP0579286 - Method of fabricating a semiconductor device with Schottky barrier [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  11.07.1997
Database last updated on 29.10.2024
Most recent event   Tooltip11.07.1997Withdrawal of applicationpublished on 27.08.1997 [1997/35]
Applicant(s)For all designated states
SANKEN ELECTRIC CO., LTD.
3-6-3, Kitano Niiza-shi
Saitama-ken / JP
[N/P]
Former [1994/03]For all designated states
SANKEN ELECTRIC CO., LTD.
3-6-3, Kitano
Niiza-shi Saitama-ken / JP
Inventor(s)01 / Ohtsuka, Koji
3-1-80,Iseharamachi
Kawagoe-shi, Saitama-ken / JP
02 / Goto, Hirokazu
6-15, Honcho
Hannou-shi, Saitama-ken / JP
[1994/19]
Former [1994/15]01 / Ohtsaku, Koji
3-1-80,Iseharamachi
Kawagoe-shi, Saitama-ken / JP
02 / Goto, Hirokazu
6-15, Honcho
Hannou-shi, Saitama-ken / JP
Former [1994/03]01 / Ohtsuka, Koji
4-7-15, Kashiwacho
Shiki-shi, Saitama-ken / JP
02 / Goto, Hirokazu
6-15, Honcho
Hannou-shi, Saitama-ken / JP
Representative(s)Vogeser, Werner, et al
Hansmann & Vogeser
Patent- und Rechtsanwälte
Albert-Rosshaupter-Strasse 65
81369 München / DE
[N/P]
Former [1994/11]Vogeser, Werner, Dipl.-Ing., et al
Patent- und Rechtsanwälte Hansmann, Vogeser, Dr. Boecker, Alber, Dr. Strych, Liedl Albert-Rosshaupter-Strasse 65
D-81369 München / DE
Former [1994/03]Vogeser, Werner, Dipl.-Ing.
Patent- und Rechtsanwälte, Hansmann Vogeser Dr. Boecker Alber Dr. Strych, Albert-Rosshaupter-Strasse 65
D-81369 München / DE
Application number, filing date93115576.631.10.1989
[1994/03]
Priority number, dateJP1988028504811.11.1988         Original published format: JP 28504888
[1994/03]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0579286
Date:19.01.1994
Language:EN
[1994/03]
Type: A3 Search report 
No.:EP0579286
Date:07.09.1994
Language:EN
[1994/36]
Search report(s)(Supplementary) European search report - dispatched on:EP22.07.1994
ClassificationIPC:H01L29/91, H01L29/40, H01L29/06, H01L29/48, H01L21/329
[1994/34]
CPC:
H01L29/66143 (EP,US); H01L29/872 (EP,KR,US); H01L27/095 (KR);
H01L29/47 (KR); H01L29/475 (EP,US); Y10S148/139 (EP,US);
Y10S148/14 (EP,US); Y10S438/934 (EP,US) (-)
Former IPC [1994/03]H01L29/56, H01L29/91
Designated contracting statesDE,   FR,   GB [1994/03]
TitleGerman:Verfahren zur Herstellung einer Halbleiteranordnung mit Schottky-Sperrschicht[1994/03]
English:Method of fabricating a semiconductor device with Schottky barrier[1994/03]
French:Méthode de fabrication d'un dispositif semi-conducteur avec barrière Schottky[1994/03]
Examination procedure19.12.1994Examination requested  [1995/07]
26.02.1997Despatch of a communication from the examining division (Time limit: M04)
04.07.1997Application withdrawn by applicant  [1997/35]
Parent application(s)   TooltipEP89120211.1  / EP0368127
Fees paidRenewal fee
27.09.1993Renewal fee patent year 03
27.09.1993Renewal fee patent year 04
27.09.1993Renewal fee patent year 05
27.10.1994Renewal fee patent year 06
26.10.1995Renewal fee patent year 07
29.10.1996Renewal fee patent year 08
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Documents cited:Search[A]JPS6394674  ;
 [A]JPS6394673  ;
 [A]JPS60157268  ;
 [A]JPS59220976  ;
 [A]JPS59132661
 [A]  - PATENT ABSTRACTS OF JAPAN, (19880907), vol. 12, no. 330, Database accession no. (E - 655), & JP63094674 A 19880425 (SANKEN ELECTRIC CO LTD) [A] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19880907), vol. 12, no. 330, Database accession no. (E - 655), & JP63094673 A 19880425 (SANKEN ELECTRIC CO LTD) [A] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19851220), vol. 9, no. 325, Database accession no. (E - 368)<2048> , & JP60157268 A 19850817 (ROOMU K.K.) [A] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19850424), vol. 9, no. 95, Database accession no. (E - 310), & JP59220976 A 19841212 (NEC HOME ELECTRONICS K.K.) [A] 2 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19841130), vol. 8, no. 261, Database accession no. (E - 281), & JP59132661 A 19840730 (MATSUSHITA DENSHI KOGYO K.K.) [A] 2 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.