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EP0554935
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Extract from the Register of European Patents
EP About this file: EP0554935
| EP0554935 - Combined X-ray spectrometer [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 07.09.1994 Database last updated on 16.11.2024 | Most recent event Tooltip | 07.09.1994 | Application deemed to be withdrawn | published on 26.10.1994 [1994/43] | Applicant(s) | For all designated states Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
| Former [1993/32] | For all designated states Philips Electronics N.V. Groenewoudseweg 1 NL-5621 BA Eindhoven / NL | Inventor(s) | 01 /
Kuipers, Johan G.H., c/o INT. OCTROOIBUREAU B.V. Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | 02 /
Brinker, Robertus J.M., c/o INT. OCTROOIBUREAU B.V Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | 03 /
Van Egeraat, W.A.L.A., c/o INT. OCTROOIBUREAU B.V Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | [1993/32] | Representative(s) | WP Thompson 138 Fetter Lane London EC4A 1BT / GB | [N/P] |
| Former [1994/29] | W.P. THOMPSON & CO. Celcon House 289-293 High Holborn London WC1V 7HU / GB | ||
| Former [1993/32] | Bakker, Hendrik INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | Application number, filing date | 93200181.1 | 26.01.1993 | [1993/32] | Priority number, date | EP19920200300 | 03.02.1992 Original published format: EP 92200300 | [1993/32] | Filing language | NL | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0554935 | Date: | 11.08.1993 | Language: | EN | [1993/32] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.05.1993 | Classification | IPC: | G01N23/207, G01N23/225, G01N23/223 | [1993/32] | CPC: |
G01N23/223 (EP,US);
G01N23/2076 (EP,US);
G01T1/36 (EP);
G01N2223/076 (EP)
| Designated contracting states | DE, FR, GB, NL [1993/32] | Title | German: | Kombiniertes Röntgenspektrometer | [1993/32] | English: | Combined X-ray spectrometer | [1993/32] | French: | Spectromètre combiné à rayonnements - X | [1993/34] |
| Former [1993/32] | Spectromètre à rayons X combine | File destroyed: | 02.08.2001 | Examination procedure | 12.02.1994 | Application deemed to be withdrawn, date of legal effect [1994/43] | 01.06.1994 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [1994/43] |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]US4959848 (PAROBEK LUBOMIR [US]); | [X]FR2634889 (JEOL LTD [JP]); | [X]GB2209596 (JEOL LTD [JP]); | [AD]DE3524379 (SIEMENS AG [DE]); | [A]DE2054464 (SIEMENS AG); | [X]JPS6193938 | [X] - PATENT ABSTRACTS OF JAPAN vol. 10no. 271 (P-497)(2327) 16 September 1986 & JP-61 093 938 ( JEOL LTD ) 12 May 1986 |