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Extract from the Register of European Patents

EP About this file: EP0569204

EP0569204 - Method of making N-channel and P-channel junction field-effect transistors using a BiCMOS process [Right-click to bookmark this link]
Former [1993/45]Method of making N-channel and P-channel junction field-effect transistors and CMOS transistors using a CMOS or bipolar/CMOS process
[1998/39]
StatusNo opposition filed within time limit
Status updated on  30.07.1999
Database last updated on 25.09.2024
Most recent event   Tooltip28.12.2007Lapse of the patent in a contracting state
New state(s): IT
published on 30.01.2008  [2008/05]
Applicant(s)For all designated states
NATIONAL SEMICONDUCTOR CORPORATION
2900 Semiconductor Drive, P.O. Box 58090 Santa Clara
California 95052-8090 / US
[N/P]
Former [1993/45]For all designated states
NATIONAL SEMICONDUCTOR CORPORATION
2900 Semiconductor Drive, P.O. Box 58090
Santa Clara, California 95052-8090 / US
Inventor(s)01 / Merrill, Richard B.
258 Alta Vista
Daly City, California 94014 / US
02 / Farrenkopf, Doug R.
2815 Steinhart Ct.
Santa Clara, California 95051 / US
[1993/45]
Representative(s)Bowles, Sharon Margaret, et al
BOWLES HORTON
Felden House
Dower Mews
High Street
Berkhamsted Hertfordshire HP4 2BL / GB
[N/P]
Former [1993/45]Bowles, Sharon Margaret, et al
BOWLES HORTON Felden House Dower Mews High Street
Berkhamsted Hertfordshire HP4 2BL / GB
Application number, filing date93303427.430.04.1993
[1993/45]
Priority number, dateUS1992088067708.05.1992         Original published format: US 880677
[1993/45]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0569204
Date:10.11.1993
Language:EN
[1993/45]
Type: A3 Search report 
No.:EP0569204
Date:02.11.1994
Language:EN
[1994/44]
Type: B1 Patent specification 
No.:EP0569204
Date:23.09.1998
Language:EN
[1998/39]
Search report(s)(Supplementary) European search report - dispatched on:EP19.09.1994
ClassificationIPC:H01L21/82, H01L27/06
[1998/39]
CPC:
H01L21/8249 (EP,US); H01L29/70 (KR); H01L27/0623 (EP,US)
Former IPC [1994/45]H01L21/82, H01L27/085, H01L27/06
Former IPC [1993/45]H01L21/82, H01L27/085
Designated contracting statesDE,   FR,   GB,   IT [1993/45]
TitleGerman:Verfahren zur Herstellung von N-Kanal- und P-Kanal-Sperrschicht-Feldeffekttransistoren unter Verwendung eines BiCMOS-Verfahrens[1998/39]
English:Method of making N-channel and P-channel junction field-effect transistors using a BiCMOS process[1998/39]
French:Procédé de fabrication des transistors à effet de champ à jonction à canal N et à canal P avec un procédé BiCMOS[1998/39]
Former [1993/45]Verfahren zur Herstellung von N-Kanal- und P-Kanal-Sperrschicht-Feldeffekttransistoren unter Verwendung eines CMOS- oder Bipolar/CMOS-Verfahrens
Former [1993/45]Method of making N-channel and P-channel junction field-effect transistors and CMOS transistors using a CMOS or bipolar/CMOS process
Former [1993/45]Procédé de fabrication des transistors à effet de champ à jonction à canal N et à canal P en mettant en oeuvre une technologie CMOS ou bipolaire/CMOS
Examination procedure01.05.1995Examination requested  [1995/26]
29.10.1996Despatch of a communication from the examining division (Time limit: M06)
09.06.1997Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
02.07.1997Reply to a communication from the examining division
04.02.1998Despatch of communication of intention to grant (Approval: Yes)
30.03.1998Communication of intention to grant the patent
25.06.1998Fee for grant paid
25.06.1998Fee for publishing/printing paid
Opposition(s)24.06.1999No opposition filed within time limit [1999/37]
Request for further processing for:02.07.1997Request for further processing filed
02.07.1997Full payment received (date of receipt of payment)
Request granted
02.07.1997Decision despatched
Fees paidRenewal fee
13.04.1995Renewal fee patent year 03
09.04.1996Renewal fee patent year 04
07.04.1997Renewal fee patent year 05
26.03.1998Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR23.09.1998
IT23.09.1998
[2008/05]
Former [2006/14]FR23.09.1998
Former [1999/36]FR19.02.1999
Documents cited:Search[X]US4403395  (CURRAN PATRICK A [US]) [X] 1-19 * abstract *;
 [X]DE2753704  (HOEFFLINGER BERND PROF DR RER) [X] 1-19 * page 6, paragraph 2; figure - *;
 [A]JPS6185855  ;
 [A]US4412238  (KHADDER WADIE N [US], et al) [A] 4,5,12-16 * abstract *;
 [A]JPS60258948  ;
 [A]JPS63292666  ;
 [A]EP0267882  (SGS MICROELETTRONICA SPA [IT]) [A] 9,15,16 * abstract *;
 [A]JPS6064475
 [X]  - W.J.PODMIOTKO ET A.BAKOWSKI, "A MIXED CMOS-DMOS-JFET TECHNOLOGY FOR SWITCHING CIRCUITS WITH HIGH VOLTAGE OUTPUT STAGES", MICROELECTRONICS AND RELIABILITY, OXFORD GB, (1987), vol. 27, no. 1, pages 33 - 37, XP001625720 [X] 1-7 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19860904), vol. 10, no. 259, Database accession no. (E - 434)<2315>, & JP61085855 A 19860501 (NEC CORP) [A] 1-7 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19860514), vol. 10, no. 129, Database accession no. (E - 403), & JP60258948 A 19851220 (CLARION K.K.) [A] 9,10,15,16 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19890327), vol. 13, no. 123, Database accession no. (E - 733)<3471>, & JP63292666 A 19881129 (NEC CORP) [A] 9,15,16 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19850814), vol. 9, no. 197, Database accession no. (E - 335), & JP60064475 A 19850413 (FUJITSU K.K) [A] 10 * abstract *
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