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Extract from the Register of European Patents

EP About this file: EP0588572

EP0588572 - Electron microscope with camera and method of operating the same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.10.1997
Database last updated on 02.11.2024
Most recent event   Tooltip03.10.1997No opposition filed within time limitpublished on 19.11.1997 [1997/47]
Applicant(s)For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku
Tokyo 101 / JP
[N/P]
Former [1994/12]For all designated states
HITACHI, LTD.
6, Kanda Surugadai 4-chome
Chiyoda-ku, Tokyo 101 / JP
Inventor(s)01 / Yonehara, Katsuhisa
4948-19, Nakane
Katsuta-shi, Ibaraki 312 / JP
02 / Katsuta, Teiji
1973-37, Sakado-cho
Mito-shi, Ibaraki 310 / JP
03 / Matsui, Isao
9-1, Mishiooshima, 3-chome
Katsuta-shi, Ibaraki 312 / JP
[1996/48]
Former [1994/12]01 / Yonehara, Katsuhisa
4948-19, Nakane
Katsuta-shi, Ibaraki 312 / JP
02 / Katsuta, Teiji
1973-37, Sakado-cho
Mito-shi, Ibaraki 310 / JP
03 / Matsui, Isao
9-1, Mishiooshima, 3-chome
Katsuta-shi, Ibaraki 312 / US
Representative(s)Calderbank, Thomas Roger, et al
Mewburn Ellis LLP
City Tower
40 Basinghall Street
London EC2V 5DE / GB
[N/P]
Former [1995/01]Calderbank, Thomas Roger, et al
MEWBURN ELLIS York House 23 Kingsway
London WC2B 6HP / GB
Former [1994/12]Calderbank, Thomas Roger
MEWBURN ELLIS York House 23 Kingsway
London WC2B 6HP / GB
Application number, filing date93307169.810.09.1993
[1994/12]
Priority number, dateJP1992024754417.09.1992         Original published format: JP 24754492
[1994/12]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0588572
Date:23.03.1994
Language:EN
[1994/12]
Type: B1 Patent specification 
No.:EP0588572
Date:27.11.1996
Language:EN
[1996/48]
Search report(s)(Supplementary) European search report - dispatched on:EP04.01.1994
ClassificationIPC:H01J37/244, H01J37/26, H01J37/28
[1994/12]
CPC:
H01J37/28 (EP,US); H01J37/244 (EP,US); H01J37/26 (EP,US)
Designated contracting statesDE,   GB,   NL [1994/12]
TitleGerman:Elektronenmikroscop mit Kamera und Verfahren zum Betrieb desselben[1994/12]
English:Electron microscope with camera and method of operating the same[1994/12]
French:Microscope électronique avec une caméra et son procédé d'utilisation[1994/12]
Examination procedure29.09.1993Examination requested  [1994/12]
12.05.1995Despatch of a communication from the examining division (Time limit: M04)
20.09.1995Reply to a communication from the examining division
12.03.1996Despatch of communication of intention to grant (Approval: Yes)
20.05.1996Communication of intention to grant the patent
12.08.1996Fee for grant paid
12.08.1996Fee for publishing/printing paid
Opposition(s)28.08.1997No opposition filed within time limit [1997/47]
Fees paidRenewal fee
25.09.1995Renewal fee patent year 03
23.09.1996Renewal fee patent year 04
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Documents cited:Search[A]US4399360  (FOTINO MIRCEA [US]) [A] 1,3,5,8-10,13,14,22-25 * column 1, line 11 - line 58 * * column 2, line 50 - line 65 * * column 3, line 8 - column 4, line 28; figure 1 *;
 [A]GB2183898  (TEXAS INSTRUMENTS LTD) [A] 1,2,4-6,15,19-21 * abstract * * page 2, line 122 - page 3, line 28; figure 1 *;
 [A]US3944817  (HILSUM CYRIL, et al) [A] 7,15,16,25 * column 1, line 4 - line 68 * * column 5, line 17 - line 65; figures 2,3 *;
 [A]EP0379865  (SIEMENS AG [DE]) [A] 1,5
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.