EP0588572 - Electron microscope with camera and method of operating the same [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 03.10.1997 Database last updated on 02.11.2024 | Most recent event Tooltip | 03.10.1997 | No opposition filed within time limit | published on 19.11.1997 [1997/47] | Applicant(s) | For all designated states Hitachi, Ltd. 6, Kanda Surugadai 4-chome Chiyoda-ku Tokyo 101 / JP | [N/P] |
Former [1994/12] | For all designated states HITACHI, LTD. 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 101 / JP | Inventor(s) | 01 /
Yonehara, Katsuhisa 4948-19, Nakane Katsuta-shi, Ibaraki 312 / JP | 02 /
Katsuta, Teiji 1973-37, Sakado-cho Mito-shi, Ibaraki 310 / JP | 03 /
Matsui, Isao 9-1, Mishiooshima, 3-chome Katsuta-shi, Ibaraki 312 / JP | [1996/48] |
Former [1994/12] | 01 /
Yonehara, Katsuhisa 4948-19, Nakane Katsuta-shi, Ibaraki 312 / JP | ||
02 /
Katsuta, Teiji 1973-37, Sakado-cho Mito-shi, Ibaraki 310 / JP | |||
03 /
Matsui, Isao 9-1, Mishiooshima, 3-chome Katsuta-shi, Ibaraki 312 / US | Representative(s) | Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB | [N/P] |
Former [1995/01] | Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB | ||
Former [1994/12] | Calderbank, Thomas Roger MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB | Application number, filing date | 93307169.8 | 10.09.1993 | [1994/12] | Priority number, date | JP19920247544 | 17.09.1992 Original published format: JP 24754492 | [1994/12] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0588572 | Date: | 23.03.1994 | Language: | EN | [1994/12] | Type: | B1 Patent specification | No.: | EP0588572 | Date: | 27.11.1996 | Language: | EN | [1996/48] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 04.01.1994 | Classification | IPC: | H01J37/244, H01J37/26, H01J37/28 | [1994/12] | CPC: |
H01J37/28 (EP,US);
H01J37/244 (EP,US);
H01J37/26 (EP,US)
| Designated contracting states | DE, GB, NL [1994/12] | Title | German: | Elektronenmikroscop mit Kamera und Verfahren zum Betrieb desselben | [1994/12] | English: | Electron microscope with camera and method of operating the same | [1994/12] | French: | Microscope électronique avec une caméra et son procédé d'utilisation | [1994/12] | Examination procedure | 29.09.1993 | Examination requested [1994/12] | 12.05.1995 | Despatch of a communication from the examining division (Time limit: M04) | 20.09.1995 | Reply to a communication from the examining division | 12.03.1996 | Despatch of communication of intention to grant (Approval: Yes) | 20.05.1996 | Communication of intention to grant the patent | 12.08.1996 | Fee for grant paid | 12.08.1996 | Fee for publishing/printing paid | Opposition(s) | 28.08.1997 | No opposition filed within time limit [1997/47] | Fees paid | Renewal fee | 25.09.1995 | Renewal fee patent year 03 | 23.09.1996 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4399360 (FOTINO MIRCEA [US]) [A] 1,3,5,8-10,13,14,22-25 * column 1, line 11 - line 58 * * column 2, line 50 - line 65 * * column 3, line 8 - column 4, line 28; figure 1 *; | [A]GB2183898 (TEXAS INSTRUMENTS LTD) [A] 1,2,4-6,15,19-21 * abstract * * page 2, line 122 - page 3, line 28; figure 1 *; | [A]US3944817 (HILSUM CYRIL, et al) [A] 7,15,16,25 * column 1, line 4 - line 68 * * column 5, line 17 - line 65; figures 2,3 *; | [A]EP0379865 (SIEMENS AG [DE]) [A] 1,5 |