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Extract from the Register of European Patents

EP About this file: EP0635136

EP0635136 - DIGITAL DEVICE FOR MEASURING THE FREQUENCY OF AN ELECTRICAL SIGNAL [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.07.1997
Database last updated on 22.08.2024
Most recent event   Tooltip11.07.1997No opposition filed within time limitpublished on 27.08.1997 [1997/35]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1995/04]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
D-80333 München / DE
Inventor(s)01 / SEZI, Tevfik
Lauenburger Strasse 106
D-12169 Berlin / DE
[1995/04]
Application number, filing date93905213.018.03.1993
[1995/04]
WO1993DE00262
Priority number, dateDE1992421194606.04.1992         Original published format: DE 4211946
[1995/04]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO9320454
Date:14.10.1993
Language:DE
[1993/25]
Type: A1 Application with search report 
No.:EP0635136
Date:25.01.1995
Language:DE
The application published by WIPO in one of the EPO official languages on 14.10.1993 takes the place of the publication of the European patent application.
[1995/04]
Type: B1 Patent specification 
No.:EP0635136
Date:04.09.1996
Language:DE
[1996/36]
Search report(s)International search report - published on:EP14.10.1993
ClassificationIPC:G01R23/167
[1995/04]
CPC:
G01R23/167 (EP,US)
Designated contracting statesCH,   FR,   GB,   LI,   SE [1995/04]
TitleGerman:DIGITALE ANORDNUNG ZUM MESSEN DER FREQUENZ EINES ELEKTRISCHEN SIGNALS[1995/04]
English:DIGITAL DEVICE FOR MEASURING THE FREQUENCY OF AN ELECTRICAL SIGNAL[1995/04]
French:SYSTEME NUMERIQUE POUR MESURER LA FREQUENCE D'UN SIGNAL ELECTRIQUE[1995/04]
Entry into regional phase04.08.1994National basic fee paid 
04.08.1994Designation fee(s) paid 
04.08.1994Examination fee paid 
Examination procedure09.08.1993Request for preliminary examination filed
International Preliminary Examining Authority: EP
04.08.1994Examination requested  [1995/04]
23.10.1995Despatch of communication of intention to grant (Approval: Yes)
05.03.1996Communication of intention to grant the patent
20.05.1996Fee for grant paid
20.05.1996Fee for publishing/printing paid
Opposition(s)05.06.1997No opposition filed within time limit [1997/35]
Fees paidRenewal fee
21.03.1995Renewal fee patent year 03
21.03.1996Renewal fee patent year 04
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Cited inInternational search[A]DE3149165  (SIEMENS AG [DE]);
 [A]GB1434028  (SECR DEFENCE)
 [A]  - DOVEL G., "FFT ANALYSERS MAKE SPECTRUM ANALYSIS A SNAP.", EDN ELECTRICAL DESIGN NEWS.(TEXAS INSTRUMENT), REED BUSINESS INFORMATION, HIGHLANDS RANCH, CO., US, US, (19890119), vol. 34., no. 02., ISSN 0012-7515, pages 149 - 155., XP000105845
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.