EP0631255 - A printed letter inspecting apparatus for solid objects [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 04.01.2003 Database last updated on 03.09.2024 | Most recent event Tooltip | 20.06.2008 | Change - representative | published on 23.07.2008 [2008/30] | Applicant(s) | For all designated states Shionogi Qualicaps Co., Ltd. 321-5, Ikezawa-cho Yamatokoriyama-shi Nara / JP | [N/P] |
Former [2001/41] | For all designated states Shionogi Qualicaps Co., Ltd. 321-5, Ikezawa-cho Yamatokoriyama-shi, Nara / JP | ||
Former [1994/52] | For all designated states JAPAN ELANCO COMPANY LIMITED Chiyoda Bldg. Annex, 1-2, Nishitenma 6-chome, Kita-ku Osaka-shi, Osaka-fu 530 / JP | Inventor(s) | 01 /
Yamamoto, Taizo 1-20-30, Sekime, Joto-ku Osaka City 536 / JP | 02 /
Konishi, Hirokazu 66-3, Oaza-Tsuji Sakurai City 633 / JP | 03 /
Kawaguchi, Yoshihisa 377-1, Shinga-cho Kashihara City 634 / JP | 04 /
Nagao, Akira 173-31, Nikaido-Kaminosho-cho Tenri City 632 / JP | [1994/52] | Representative(s) | Bockhorni, Josef, et al Bockhorni & Kollegen Patent- und Rechtsanwälte Elsenheimerstrasse 49 80687 München / DE | [N/P] |
Former [2008/30] | Bockhorni, Josef, et al Bockhorni & Kollegen Patent- und Rechtsanwälte Elsenheimerstrasse 49 80687 München / DE | ||
Former [1997/17] | Bockhorni, Josef, Dipl.-Ing., et al Patentanwälte Herrmann-Trentepohl Grosse - Bockhorni & Partner Forstenrieder Allee 59 81476 München / DE | ||
Former [1994/52] | Kirschner, Klaus Dieter, Dipl.-Phys. Patentanwälte Herrmann-Trentepohl, Kirschner, Grosse, Bockhorni & Partner Forstenrieder Allee 59 D-81476 München / DE | Application number, filing date | 94109582.0 | 21.06.1994 | [1994/52] | Priority number, date | JP19930149430 | 21.06.1993 Original published format: JP 14943093 | [1994/52] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0631255 | Date: | 28.12.1994 | Language: | EN | [1994/52] | Type: | A3 Search report | No.: | EP0631255 | Date: | 05.07.1995 | Language: | EN | [1995/27] | Type: | B1 Patent specification | No.: | EP0631255 | Date: | 27.02.2002 | Language: | EN | [2002/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 22.05.1995 | Classification | IPC: | G06K9/80, B41F33/00 | [2001/11] | CPC: |
B41F33/0036 (EP,US);
G06V10/993 (EP,US)
|
Former IPC [1994/52] | G06K9/80 | Designated contracting states | DE, ES, FR, GB, IT [1994/52] | Title | German: | Gerät zur Prüfung gedruckter Zeichen für Festkörper | [1994/52] | English: | A printed letter inspecting apparatus for solid objects | [1994/52] | French: | Appareil d'inspection de caractères imprimés pour des objets solides | [2001/11] |
Former [1994/52] | Appareil d'inspection de caractères imprimés pour de objets solides | Examination procedure | 02.11.1995 | Examination requested [1995/52] | 24.05.1999 | Despatch of a communication from the examining division (Time limit: M06) | 03.12.1999 | Reply to a communication from the examining division | 21.06.2000 | Despatch of a communication from the examining division (Time limit: M06) | 29.12.2000 | Reply to a communication from the examining division | 22.02.2001 | Despatch of communication of intention to grant (Approval: Yes) | 29.08.2001 | Communication of intention to grant the patent | 06.12.2001 | Fee for grant paid | 06.12.2001 | Fee for publishing/printing paid | Opposition(s) | 28.11.2002 | No opposition filed within time limit [2003/08] | Fees paid | Renewal fee | 21.06.1996 | Renewal fee patent year 03 | 26.06.1997 | Renewal fee patent year 04 | 23.06.1998 | Renewal fee patent year 05 | 22.06.1999 | Renewal fee patent year 06 | 26.06.2000 | Renewal fee patent year 07 | 28.06.2001 | Renewal fee patent year 08 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0265529 (FANUC LTD [JP]) [A] 2,5* abstract *; | [A] - YOSHIHIRO SHIMA ET AL, "CONSIDERATION ON AUTOMATIC DEFECT DETECTION ALGORITHM FOR STAMPED PATTERNS IN ELECTRONIC PARTS", SYSTEMS & COMPUTERS IN JAPAN, vol. 20, no. 8, pages 48 - 57, XP000116717 [A] 1,4 * paragraph 3.1 (2) * | Examination | US4965829 |