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Extract from the Register of European Patents

EP About this file: EP0631255

EP0631255 - A printed letter inspecting apparatus for solid objects [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.01.2003
Database last updated on 03.09.2024
Most recent event   Tooltip20.06.2008Change - representativepublished on 23.07.2008  [2008/30]
Applicant(s)For all designated states
Shionogi Qualicaps Co., Ltd.
321-5, Ikezawa-cho Yamatokoriyama-shi
Nara / JP
[N/P]
Former [2001/41]For all designated states
Shionogi Qualicaps Co., Ltd.
321-5, Ikezawa-cho
Yamatokoriyama-shi, Nara / JP
Former [1994/52]For all designated states
JAPAN ELANCO COMPANY LIMITED
Chiyoda Bldg. Annex, 1-2, Nishitenma 6-chome, Kita-ku
Osaka-shi, Osaka-fu 530 / JP
Inventor(s)01 / Yamamoto, Taizo
1-20-30, Sekime, Joto-ku
Osaka City 536 / JP
02 / Konishi, Hirokazu
66-3, Oaza-Tsuji
Sakurai City 633 / JP
03 / Kawaguchi, Yoshihisa
377-1, Shinga-cho
Kashihara City 634 / JP
04 / Nagao, Akira
173-31, Nikaido-Kaminosho-cho
Tenri City 632 / JP
[1994/52]
Representative(s)Bockhorni, Josef, et al
Bockhorni & Kollegen
Patent- und Rechtsanwälte
Elsenheimerstrasse 49
80687 München / DE
[N/P]
Former [2008/30]Bockhorni, Josef, et al
Bockhorni & Kollegen Patent- und Rechtsanwälte Elsenheimerstrasse 49
80687 München / DE
Former [1997/17]Bockhorni, Josef, Dipl.-Ing., et al
Patentanwälte Herrmann-Trentepohl Grosse - Bockhorni & Partner Forstenrieder Allee 59
81476 München / DE
Former [1994/52]Kirschner, Klaus Dieter, Dipl.-Phys.
Patentanwälte Herrmann-Trentepohl, Kirschner, Grosse, Bockhorni & Partner Forstenrieder Allee 59
D-81476 München / DE
Application number, filing date94109582.021.06.1994
[1994/52]
Priority number, dateJP1993014943021.06.1993         Original published format: JP 14943093
[1994/52]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0631255
Date:28.12.1994
Language:EN
[1994/52]
Type: A3 Search report 
No.:EP0631255
Date:05.07.1995
Language:EN
[1995/27]
Type: B1 Patent specification 
No.:EP0631255
Date:27.02.2002
Language:EN
[2002/09]
Search report(s)(Supplementary) European search report - dispatched on:EP22.05.1995
ClassificationIPC:G06K9/80, B41F33/00
[2001/11]
CPC:
B41F33/0036 (EP,US); G06V10/993 (EP,US)
Former IPC [1994/52]G06K9/80
Designated contracting statesDE,   ES,   FR,   GB,   IT [1994/52]
TitleGerman:Gerät zur Prüfung gedruckter Zeichen für Festkörper[1994/52]
English:A printed letter inspecting apparatus for solid objects[1994/52]
French:Appareil d'inspection de caractères imprimés pour des objets solides[2001/11]
Former [1994/52]Appareil d'inspection de caractères imprimés pour de objets solides
Examination procedure02.11.1995Examination requested  [1995/52]
24.05.1999Despatch of a communication from the examining division (Time limit: M06)
03.12.1999Reply to a communication from the examining division
21.06.2000Despatch of a communication from the examining division (Time limit: M06)
29.12.2000Reply to a communication from the examining division
22.02.2001Despatch of communication of intention to grant (Approval: Yes)
29.08.2001Communication of intention to grant the patent
06.12.2001Fee for grant paid
06.12.2001Fee for publishing/printing paid
Opposition(s)28.11.2002No opposition filed within time limit [2003/08]
Fees paidRenewal fee
21.06.1996Renewal fee patent year 03
26.06.1997Renewal fee patent year 04
23.06.1998Renewal fee patent year 05
22.06.1999Renewal fee patent year 06
26.06.2000Renewal fee patent year 07
28.06.2001Renewal fee patent year 08
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Documents cited:Search[A]EP0265529  (FANUC LTD [JP]) [A] 2,5* abstract *;
 [A]  - YOSHIHIRO SHIMA ET AL, "CONSIDERATION ON AUTOMATIC DEFECT DETECTION ALGORITHM FOR STAMPED PATTERNS IN ELECTRONIC PARTS", SYSTEMS & COMPUTERS IN JAPAN, vol. 20, no. 8, pages 48 - 57, XP000116717 [A] 1,4 * paragraph 3.1 (2) *
ExaminationUS4965829
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.