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Extract from the Register of European Patents

EP About this file: EP0663694

EP0663694 - Semiconductor device having a protective circuit against electrostatic discharge [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  09.01.1998
Database last updated on 24.08.2024
Most recent event   Tooltip09.01.1998Application deemed to be withdrawnpublished on 25.02.1998 [1998/09]
Applicant(s)For all designated states
NEC Corporation
7-1, Shiba 5-chome Minato-ku
Tokyo 108-8001 / JP
[N/P]
Former [1995/29]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Kondo, Yasuo, c/o NEC Corporation
7-1, Shiba 5-chome
Minato-ku, Tokyo / JP
[1995/29]
Representative(s)Betten & Resch
Patent- und Rechtsanwälte PartGmbB
Postfach 10 02 51
80076 München / DE
[N/P]
Former [1995/29]Betten & Resch
Reichenbachstrasse 19
D-80469 München / DE
Application number, filing date94120553.623.12.1994
[1995/29]
Priority number, dateJP1993032713424.12.1993         Original published format: JP 32713493
[1995/29]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0663694
Date:19.07.1995
Language:EN
[1995/29]
Search report(s)(Supplementary) European search report - dispatched on:EP02.06.1995
ClassificationIPC:H01L27/02, H02H9/04
[1995/29]
CPC:
H01L27/0251 (EP,US); H01L27/04 (KR); H01L2924/0002 (EP,US)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Designated contracting statesDE,   FR,   GB [1995/29]
TitleGerman:Halbleiterbauelement mit Schutzschaltung gegen elektrostatische Entladungen[1995/29]
English:Semiconductor device having a protective circuit against electrostatic discharge[1995/29]
French:Dispositif à semi-conducteur ayant un circuit de protection contre des décharges électrostatiques[1995/29]
Examination procedure20.10.1995Examination requested  [1995/51]
18.02.1997Despatch of a communication from the examining division (Time limit: M06)
29.08.1997Application deemed to be withdrawn, date of legal effect  [1998/09]
29.09.1997Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1998/09]
Fees paidRenewal fee
27.12.1996Renewal fee patent year 03
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Documents cited:Search[A]US4342045  (KIM KYOUNG) [A] 1 * column 2, line 16 - line 49; figures 1A,1B *;
 [A]US4811155  (KURIYAMA HIROTADA [JP], et al) [A] 1,6 * column A; figure 7 *;
 [A]JPH0465867  ;
 [PA]JPH0685176  ;
 [A]JPH0228362
 [A]  - W. D. GREASON ET AL, IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, NEW YORK US, (199301), vol. 29, no. 1, pages 88 - 97 [A] 1,5 * page 89 - page 90; figures 4,5 *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19920619), vol. 16, no. 275, Database accession no. (E - 1219), & JP04065867 A 19920302 (TOSHIBA CORP.) [A] 1 * abstract *
 [PA]  - PATENT ABSTRACTS OF JAPAN, (19940624), vol. 18, no. 336, Database accession no. (E - 1568), & JP06085176 A 19940325 (KAWASAKI STEEL CORP.) [PA] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19900406), vol. 14, no. 175, Database accession no. (E - 914)<4118> , & JP02028362 A 19900130 (NEC IC MICROCOMPUT SYST. LTD.) [A] 1 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.