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EP0619551
European procedure
Extract from the Register of European Patents
EP About this file: EP0619551
| EP0619551 - Determining offset between images of an IC [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 10.11.2000 Database last updated on 19.07.2024 | Most recent event Tooltip | 10.11.2000 | No opposition filed within time limit | published on 27.12.2000 [2000/52] | Applicant(s) | For all designated states SCHLUMBERGER TECHNOLOGIES, INC. 1601 Technology Drive San Jose California 95110-1397 / US | [N/P] |
| Former [1994/41] | For all designated states SCHLUMBERGER TECHNOLOGIES, INC. 1601 Technology Drive San Jose, California 95110-1397 / US | Inventor(s) | 01 /
Barnard, Richard D. 709, Stardust Lane San Jose, California 95123 / US | [1994/41] | Representative(s) | Dupont, Henri Schlumberger Industries Centre de Recherches SMR 50, Avenue Jean Jaurès, B.P. 620-05 92542 Montrouge Cédex / FR | [N/P] |
| Former [1994/41] | Dupont, Henri Schlumberger Industries Centre de Recherches SMR 50, Avenue Jean Jaurès B.P. 620-05 F-92542 Montrouge Cédex / FR | Application number, filing date | 94200568.7 | 07.03.1994 | [1994/41] | Priority number, date | US19930031547 | 15.03.1993 Original published format: US 31547 | [1994/41] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0619551 | Date: | 12.10.1994 | Language: | EN | [1994/41] | Type: | A3 Search report | No.: | EP0619551 | Date: | 16.08.1995 | Language: | EN | [1995/33] | Type: | B1 Patent specification | No.: | EP0619551 | Date: | 12.01.2000 | Language: | EN | [2000/02] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 03.07.1995 | Classification | IPC: | G06T5/20 | [1999/19] | CPC: |
G06T5/20 (EP,US);
G06T7/70 (EP,US);
G01R31/307 (EP,US);
G06T2207/30148 (EP,US)
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| Former IPC [1994/41] | G06F15/70 | Designated contracting states | DE, FR, GB, IT, NL [1994/41] | Title | German: | Bestimmung einer Verschiebung zwischen IC-Bildern | [1994/41] | English: | Determining offset between images of an IC | [1994/41] | French: | Détermination du décalage entre images d'un circuit intégré | [1994/41] | Examination procedure | 07.12.1995 | Examination requested [1996/05] | 09.10.1998 | Despatch of a communication from the examining division (Time limit: M04) | 18.01.1999 | Reply to a communication from the examining division | 30.04.1999 | Despatch of communication of intention to grant (Approval: Yes) | 19.05.1999 | Communication of intention to grant the patent | 12.07.1999 | Fee for grant paid | 29.09.1999 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time | 06.11.1999 | Fee for publishing/printing paid | Opposition(s) | 13.10.2000 | No opposition filed within time limit [2000/52] | Request for further processing for: | 06.11.1999 | Request for further processing filed | 06.11.1999 | Full payment received (date of receipt of payment) Request granted | 22.11.1999 | Decision despatched | Fees paid | Renewal fee | 08.01.1996 | Renewal fee patent year 03 | 04.01.1997 | Renewal fee patent year 04 | 26.01.1998 | Renewal fee patent year 05 | 29.12.1998 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0254643 (FAIRCHILD SEMICONDUCTOR [US]); | [A]EP0381067 (SCHLUMBERGER TECHNOLOGIES INC [US]); | [Y] - SEMINO A ET AL, "Image registration by a region-based approach and by correction of elastic deformations", SIGNAL PROCESSING VI - THEORIES AND APPLICATIONS. PROCEEDINGS OF EUSIPCO-92, SIXTH EUROPEAN SIGNAL PROCESSING CONFERENCE, BRUSSELS, BELGIUM, 24-27 AUG. 1992, ISBN 0-444-89587-6, 1992, AMSTERDAM, NETHERLANDS, ELSEVIER, NETHERLANDS, pages 1441 - 1444 vol. 3 [Y] 1-11 * the whole document * | [Y] - NISHIHARA H K ET AL, "Measuring photolithographic overlay accuracy and critical dimensions by correlating binarized Laplacian of Gaussian convolutions", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, JAN. 1988, USA, ISSN 0162-8828, vol. 10, no. 1, doi:doi:10.1109/34.3864, pages 17 - 30, XP000119076 [Y] 1-11 * the whole document * DOI: http://dx.doi.org/10.1109/34.3864 |