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EP0611946
European procedure
Extract from the Register of European Patents
EP About this file: EP0611946
| EP0611946 - Minute step height measuring method and apparatus therefor [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 11.09.1998 Database last updated on 18.11.2024 | Most recent event Tooltip | 11.09.1998 | No opposition filed within time limit | published on 28.10.1998 [1998/44] | Applicant(s) | For all designated states NIKON CORPORATION 2-3, Marunouchi 3-chome Chiyoda-Ku Tokyo / JP | [N/P] |
| Former [1997/45] | For all designated states NIKON CORPORATION 2-3, Marunouchi 3-chome, Chiyoda-Ku Tokyo / JP | ||
| Former [1994/34] | For all designated states NIKON CORPORATION 2-3, Marunouchi 3-chome Chiyoda-ku Tokyo / JP | Inventor(s) | 01 /
Oki, Hiroshi, Azamino Riiberu B-204 1-4, Susukino 1-chome, Midori-ku Yokohama-shi, Kanagawa-ken / JP | 02 /
Iwasaki, Yutaka, Kosumo Yokohama Kozukue Sekandouingu 404, 61-1, Kozukue-cho, Kohoku-ku Yokohama-shi, Kanagawa-ken / JP | 03 /
Iwasaki, Jun, Daisan Ohfuna Pakutaun G-710 1555-1, Kasama-cho, Sakae-ku Yokohama-shi, Kanagawa-ken / JP | [1994/34] | Representative(s) | Burke, Steven David, et al R.G.C. Jenkins & Co 26 Caxton Street London SW1H 0RJ / GB | [N/P] |
| Former [1994/34] | Burke, Steven David, et al R.G.C. Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB | Application number, filing date | 94301190.8 | 18.02.1994 | [1994/34] | Priority number, date | JP19930030158 | 19.02.1993 Original published format: JP 3015893 | [1994/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0611946 | Date: | 24.08.1994 | Language: | EN | [1994/34] | Type: | B1 Patent specification | No.: | EP0611946 | Date: | 05.11.1997 | Language: | EN | [1997/45] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 14.06.1994 | Classification | IPC: | G01B11/06, G01B9/02 | [1994/34] | CPC: |
B82Y15/00 (EP);
G01B11/0608 (EP);
G01B9/02042 (EP);
G01B9/02083 (EP);
G01B9/02097 (EP);
G02B21/0056 (EP);
| Designated contracting states | DE, FR, GB [1994/34] | Title | German: | Verfahren und Gerät zum Messen einer geringen Schritthöhe | [1994/34] | English: | Minute step height measuring method and apparatus therefor | [1994/34] | French: | Méthode et appareil pour mesurer un gradin en hauteur infinie | [1994/34] | Examination procedure | 28.10.1994 | Examination requested [1994/52] | 11.06.1996 | Despatch of a communication from the examining division (Time limit: M06) | 20.12.1996 | Reply to a communication from the examining division | 26.02.1997 | Despatch of communication of intention to grant (Approval: No) | 28.04.1997 | Despatch of communication of intention to grant (Approval: later approval) | 06.05.1997 | Communication of intention to grant the patent | 11.08.1997 | Fee for grant paid | 11.08.1997 | Fee for publishing/printing paid | Opposition(s) | 06.08.1998 | No opposition filed within time limit [1998/44] | Fees paid | Renewal fee | 08.02.1996 | Renewal fee patent year 03 | 10.02.1997 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0094835 (DOWNS) [A] 1,3,5,7 * page 8, line 35 - page 9, line 24; figure - *; | [A]JPH03278009 | [DYA] - HIROSHI OOKI E.A., "A NOVEL TYPE OF LASER SCANNING MICROSCOPE: THEORETICAL CONSIDERATIONS", OPTICS COMMUNICATIONS, NORTH-HOLLAND, (1991), vol. 85, pages 177 - 182, XP000220039 [DY] 1,3,5,7 * the whole document * [A] 2,6 DOI: http://dx.doi.org/10.1016/0030-4018(91)90390-Y | [Y] - R.L. JUNGERMAN E.A., "PHASE SENSITIVE SCANNING OPTICAL MICROSCOPE", APPLIED PHYSICS LETTERS, NEW YORK US, (198410), vol. 45, no. 8, doi:doi:10.1063/1.95422, pages 846 - 848, XP002028937 [Y] 1,3,5,7 * the whole document * DOI: http://dx.doi.org/10.1063/1.95422 | [A] - PATENT ABSTRACTS OF JAPAN, (19920311), vol. 16, no. 100, Database accession no. (P - 1323), & JP03278009 A 19911209 (NIKON CORP.) [A] 1 * abstract * |