blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0615243

EP0615243 - Offset amount measuring apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.06.1999
Database last updated on 01.02.2025
Most recent event   Tooltip04.06.1999No opposition filed within time limitpublished on 21.07.1999 [1999/29]
Applicant(s)For all designated states
Sony Corporation
7-35 Kitashinagawa 6-chome
Shinagawa-ku
Tokyo 141 / JP
[N/P]
Former [1994/37]For all designated states
SONY CORPORATION
7-35 Kitashinagawa 6-chome Shinagawa-ku
Tokyo 141 / JP
Inventor(s)01 / Tomisaki, Itaru, c/o Sony Corporation
7-35 Kitashinagawa 6-chome
Shinagawa-ku, Tokyo / JP
02 / Takeda, Toru, c/o Sony Corporation
7-35 Kitashinagawa 6-chome
Shinagawa-ku, Tokyo / JP
[1994/37]
Representative(s)Nicholls, Michael John
J A Kemp
14 South Square
Gray's Inn
London WC1R 5JJ / GB
[N/P]
Former [1994/40]Nicholls, Michael John
J.A. KEMP & CO. 14, South Square Gray's Inn
London WC1R 5LX / GB
Former [1994/37]Nicholls, Michael John
J.A. KEMP & CO. 14, South Square Gray's Inn
London WC1R 5LX / GB
Application number, filing date94301327.624.02.1994
[1994/37]
Priority number, dateJP1993006624802.03.1993         Original published format: JP 6624893
[1994/37]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0615243
Date:14.09.1994
Language:EN
[1994/37]
Type: B1 Patent specification 
No.:EP0615243
Date:29.07.1998
Language:EN
[1998/31]
Search report(s)(Supplementary) European search report - dispatched on:EP25.07.1994
ClassificationIPC:G11B21/10
[1994/37]
CPC:
G11B21/106 (EP,US); G11B20/14 (KR); G11B7/0953 (EP,US)
Designated contracting statesDE,   FR,   GB [1994/37]
TitleGerman:Abweichungsmessgerät[1994/37]
English:Offset amount measuring apparatus[1994/37]
French:Appareil de mesure d'offset[1994/37]
Examination procedure21.02.1995Examination requested  [1995/16]
07.07.1997Despatch of a communication from the examining division (Time limit: M04)
11.09.1997Reply to a communication from the examining division
06.10.1997Despatch of communication of intention to grant (Approval: Yes)
02.02.1998Communication of intention to grant the patent
29.04.1998Fee for grant paid
29.04.1998Fee for publishing/printing paid
Opposition(s)30.04.1999No opposition filed within time limit [1999/29]
Fees paidRenewal fee
08.02.1996Renewal fee patent year 03
10.02.1997Renewal fee patent year 04
11.02.1998Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]JPH0330156  ;
 [A]JPH01211279  ;
 [A]JPH03160674  ;
 [A]JPH04221473  ;
 [A]EP0233606  (HEWLETT PACKARD CO [US]) [A] 1-10 * page 3, line 47 - page 10, line 56; figure - *;
 [A]EP0238318  (FUJITSU LTD [JP]) [A] 1-10 * page 3, column 3, line 46 - page 5, column 7, line 59; figure - *;
 [XA]EP0516125  (SONY CORP [JP]) [X] 1,9 * page 3, column 3, line 26 - page 5, column 7, line 41; figure - * [A] 2-8,10
 [A]  - PATENT ABSTRACTS OF JAPAN, (19910423), vol. 15, no. 162, Database accession no. (P - 1194), & JP03030156 A 19910208 (HITACH) [A] 1-10 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19891121), vol. 13, no. 520, Database accession no. (P - 963), & JP01211279 A 19890824 (FUJITSU) [A] 1-10 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19911014), vol. 15, no. 402, Database accession no. (P - 1262), & JP03160674 A 19910710 (FUJITSU) [A] 1-10 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19921211), vol. 16, no. 571, Database accession no. (P - 1459), & JP04221473 A 19920811 (FUJITSU) [A] 1-10 * abstract *
Examination   - PATENT ABSTRACTS OF JAPAN vol. 13, no. 520 (P-963) 21 November 1989 & JP-A-01
    - 211 279 (FUJITSU) 24 August 1989
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.