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Extract from the Register of European Patents

EP About this file: EP0704901

EP0704901 - Tolerant integrated circuit to great manufacturing faults [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.10.2000
Database last updated on 16.09.2024
Most recent event   Tooltip13.10.2000No opposition filed within time limitpublished on 29.11.2000 [2000/48]
Applicant(s)For all designated states
STMicroelectronics Srl
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
[N/P]
Former [1998/35]For all designated states
STMicroelectronics S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
Former [1996/14]For all designated states
SGS-THOMSON MICROELECTRONICS S.r.l.
Via C. Olivetti, 2
I-20041 Agrate Brianza (Milano) / IT
Inventor(s)01 / Mazzali, Stefano
Via Sardegna, 21
I-20040 Carnate (Milano) / IT
[1996/14]
Representative(s)Botti, Mario
Botti & Ferrari S.p.A.
Via Cappellini, 11
20124 Milano / IT
[N/P]
Former [1999/17]Botti, Mario
Botti & Ferrari S.r.l. Via Locatelli, 5
20124 Milano / IT
Former [1998/13]Checcacci, Giorgio, et al
PORTA, CHECCACCI & BOTTI Viale Sabotino, 19/2
20135 Milano / IT
Former [1997/45]Checcacci, Giorgio, et al
PORTA, CHECCACCI & BOTTI Corso di Porta Romana, 123
20122 Milano / IT
Application number, filing date94830468.830.09.1994
[1996/14]
Filing languageIT
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0704901
Date:03.04.1996
Language:EN
[1996/14]
Type: A1 / A2 RE Reissue of A-publication
No.:EP0704901
Date:24.07.1996
[1996/30]
Type: B1 Patent specification 
No.:EP0704901
Date:15.12.1999
Language:EN
[1999/50]
Search report(s)(Supplementary) European search report - dispatched on:EP10.03.1995
ClassificationIPC:H01L23/528, H01L27/115
[1996/14]
CPC:
H01L23/528 (EP,US); H10B69/00 (EP,US); H01L2924/0002 (EP,US)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [1996/14]
TitleGerman:Integrierte Schaltung mit Toleranz bei wichtigen Herstellungsfehlern[1996/14]
English:Tolerant integrated circuit to great manufacturing faults[1996/14]
French:Circuit intégré tolérant des défauts majeurs de fabrication[1996/14]
Examination procedure25.09.1996Examination requested  [1996/50]
29.04.1997Despatch of a communication from the examining division (Time limit: M04)
08.09.1997Reply to a communication from the examining division
17.03.1998Despatch of a communication from the examining division (Time limit: M06)
28.10.1998Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
07.01.1999Reply to a communication from the examining division
03.03.1999Despatch of communication of intention to grant (Approval: Yes)
19.05.1999Communication of intention to grant the patent
07.09.1999Fee for grant paid
07.09.1999Fee for publishing/printing paid
Opposition(s)16.09.2000No opposition filed within time limit [2000/48]
Request for further processing for:07.09.1999Request for further processing filed
07.09.1999Full payment received (date of receipt of payment)
Request granted
27.09.1999Decision despatched
07.01.1999Request for further processing filed
23.11.1998Full payment received (date of receipt of payment)
Request deemed not to be filed
02.02.1999Decision despatched
Fees paidRenewal fee
23.09.1996Renewal fee patent year 03
20.09.1997Renewal fee patent year 04
22.09.1998Renewal fee patent year 05
28.09.1999Renewal fee patent year 06
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Documents cited:Search[X]US4827449  (INOUE HIROSHI [JP])
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