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Extract from the Register of European Patents

EP About this file: EP0678571

EP0678571 - pH Adjusted nonionic surfactant containing alkaline cleaner composition for cleaning microelectronics substrates [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.11.2001
Database last updated on 02.11.2024
Most recent event   Tooltip25.07.2008Change - representativepublished on 27.08.2008  [2008/35]
Applicant(s)For all designated states
Mallinckrodt Baker, Inc.
222 Red School Lane
Phillipsburg, New Jersey 08865 / US
[N/P]
Former [1995/50]For all designated states
MALLINCKRODT BAKER, Inc.
222 Red School Lane
Phillipsburg, New Jersey 08865 / US
Former [1995/43]For all designated states
J.T. BAKER INC.
222 Red School Lane
Phillipsburg New Jersey 08865 / US
Inventor(s)01 / Ilardi, Joseph M.
111 Skyline Drive
Sparta, NJ 07871 / US
02 / Schwartzkopf, George
Bickel Road
Franklin Township, NJ 07882 / US
03 / Dailey, Gary G.
804 Hunter Road
Easton, PA 18042 / US
[1995/43]
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstrasse 3
81675 München / DE
[N/P]
Former [2008/35]Vossius & Partner
Siebertstrasse 3
81675 München / DE
Former [1995/43]VOSSIUS & PARTNER
Siebertstrasse 4
D-81675 München / DE
Application number, filing date95105743.918.04.1995
[1995/43]
Priority number, dateUS1994023013220.04.1994         Original published format: US 230132
[1995/43]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0678571
Date:25.10.1995
Language:EN
[1995/43]
Type: A3 Search report 
No.:EP0678571
Date:15.01.1997
[1997/03]
Type: B1 Patent specification 
No.:EP0678571
Date:24.01.2001
Language:EN
[2001/04]
Search report(s)(Supplementary) European search report - dispatched on:EP02.12.1996
ClassificationIPC:C11D3/30, C11D3/20, C11D1/74, C11D1/72, C11D1/66
[1995/43]
CPC:
C11D3/30 (EP,US); C11D7/06 (KR); C11D1/66 (EP,US);
C11D3/0047 (EP,US); C11D3/042 (EP,US); C11D3/044 (EP,US);
C11D3/046 (EP,US); H01L21/02063 (EP,US); C11D2111/22 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   DE,   ES,   FR,   GB,   IE,   IT,   LI,   LU,   NL,   SE [1995/43]
TitleGerman:PH-regulierter alkalischer Reiniger mit nicht ionischem Tensid zur Reinigung mikroelektronischer Substrate[1995/43]
English:pH Adjusted nonionic surfactant containing alkaline cleaner composition for cleaning microelectronics substrates[1995/43]
French:Composition de nettoyage ayant un pH determiné contenant un agent tensioactif nonionique pour nettoyer les substrats microélectronics[1995/43]
Examination procedure21.02.1997Examination requested  [1997/17]
10.12.1997Despatch of a communication from the examining division (Time limit: M06)
18.06.1998Reply to a communication from the examining division
22.10.1998Despatch of a communication from the examining division (Time limit: M04)
24.11.1998Reply to a communication from the examining division
12.10.1999Despatch of communication of intention to grant (Approval: No)
09.05.2000Despatch of communication of intention to grant (Approval: later approval)
26.07.2000Communication of intention to grant the patent
02.11.2000Fee for grant paid
02.11.2000Fee for publishing/printing paid
Opposition(s)25.10.2001No opposition filed within time limit [2002/03]
Request for further processing for:09.05.2000Request for further processing filed
09.05.2000Full payment received (date of receipt of payment)
Request granted
08.06.2000Decision despatched
Fees paidRenewal fee
07.04.1997Renewal fee patent year 03
29.04.1998Renewal fee patent year 04
30.04.1999Renewal fee patent year 05
28.04.2000Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT24.01.2001
SE24.01.2001
LU18.04.2001
[2004/39]
Former [2002/23]AT24.01.2001
SE24.01.2001
Former [2002/10]AT24.01.2001
Documents cited:Search[A]US3886099  (HALL ROBERT M) [A] 1-16 * whole document *;
 [A]GB1573208  (TOKYO SHIBAURA ELECTRIC LTD) [A] 3,4,8,9,15,16 * whole document *;
 [AD]US4239661  (ASANO MASAFUMI [JP], et al) [AD] 3,4,8-11,15,16 * column 6, line 38 - column 10, line 45; claims 1-32 *;
 [AD]US4339340  (MURAOKA HISASHI, et al) [AD] 3,4,8-11,15,16 * column 6, line 38 - column 10, line 48; claims 1-34 *;
 [X]US4612058  (GEKE JUERGEN [DE], et al) [X] 1,2,5,6 * column 2, line 6 - column 3, line 28; examples 6-9; claims 1-7 *;
 [A]US4833067  (TANAKA HATSUYUKI [JP], et al) [A] 6,7,15,16* column 3, line 51 - column 4, line 59; claim 1 *;
 [A]WO9314884  (SACHEM INC [US]) [A] 3,4,8,9,15,16 * page 5, line 12 - page 12, line 10; claims 1-19 *;
 [A]EP0578507  (EKC TECHNOLOGY INC [US]) [A] 5,8,9,15,16 * page 6, line 29 - page 8, line 14; claims 1-19 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.