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Extract from the Register of European Patents

EP About this file: EP0695943

EP0695943 - Temporary package for bare die test and-burn-in [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  05.09.1997
Database last updated on 02.11.2024
Most recent event   Tooltip19.03.2010Change - representativepublished on 21.04.2010  [2010/16]
Applicant(s)For all designated states
MINNESOTA MINING AND MANUFACTURING COMPANY
P.O. Box 33427 St. Paul
Minnesota 55133-3427 / US
[N/P]
Former [1996/06]For all designated states
MINNESOTA MINING AND MANUFACTURING COMPANY
P.O. Box 33427
St. Paul, Minnesota 55133-3427 / US
Inventor(s)01 / Cearley-Cabbiness, Carol L., Minnesota Mining and
Manufacturing Co., 2501 Hudson Road, P.O.Box 33427
Saint Paul, Minnesota 55133-3427 / US
02 / Hardcastle, David S., c/o Minnesota Mining and
Manufacturing Co., 2501 Hudson Road, P.O.Box 33427
Saint Paul, Minnesota 55133-3427 / US
[1996/06]
Representative(s)dompatent von Kreisler Selting Werner - Partnerschaft von Patent- und Rechtsanwälten mbB
Deichmannhaus am Dom
Bahnhofsvorplatz 1
50667 Köln / DE
[N/P]
Former [2010/15]von Kreisler Selting Werner
Deichmannhaus am Dom Bahnhofsvorplatz 1
50667 Köln / DE
Former [1996/06]Hilleringmann, Jochen, Dipl.-Ing., et al
Patentanwälte von Kreisler-Selting-Werner, Bahnhofsvorplatz 1 (Deichmannhaus)
D-50667 Köln / DE
Application number, filing date95111638.325.07.1995
[1996/06]
Priority number, dateUS1994028130027.07.1994         Original published format: US 281300
[1996/06]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0695943
Date:07.02.1996
[1996/06]
Type: A3 Search report 
No.:EP0695943
Date:24.07.1996
[1996/30]
Search report(s)(Supplementary) European search report - dispatched on:EP24.05.1996
ClassificationIPC:G01R1/04
[1996/06]
CPC:
G01R1/0433 (EP,US)
Designated contracting statesDE,   FR,   GB [1996/06]
TitleGerman:Temporäre Gehäuse zum Einbrennen und Testen von unverpackten Chips[1996/06]
English:Temporary package for bare die test and-burn-in[1996/06]
French:Boîtier provisoir pour test et déterminage de pastille semi-conductrice nue[1996/06]
File destroyed:13.09.2003
Examination procedure25.01.1997Application deemed to be withdrawn, date of legal effect  [1997/43]
26.05.1997Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [1997/43]
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Documents cited:Search[A]US4993955  (SAVANT JOHN A [US]) [A] 1,4 * abstract *;
 [A]US5322446  (CEARLEY-CABBINESS CAROL L [US]) [A] 1,4 * column 2, line 1 - line 55; figure 2 *;
 [A]EP0398506  (AMP INC [US]) [A] 1,4 * abstract *;
 [A]  - GUCCIARDI ET AL., "bare die testing", ADVANCED PACKAGING, ISHING GROUP US, (199404), vol. 3, no. 2, pages 26 - 28, XP002003304 [A] 1,4 * page 26, column R, paragraph 4 - page 27, column L, paragraph 1; figure 2 *
by applicantEP0554622
 US5302891
 US4918513
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.