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EP0724168
European procedure
Extract from the Register of European Patents
EP About this file: EP0724168
| EP0724168 - Position measuring device using a phase grating and fabrication method [Right-click to bookmark this link] | |||
| Former [1996/31] | Phase grating | ||
| [2001/43] | Status | No opposition filed within time limit Status updated on 21.02.2003 Database last updated on 10.07.2024 | Most recent event Tooltip | 21.02.2003 | No opposition filed within time limit | published on 09.04.2003 [2003/15] | Applicant(s) | For all designated states Dr. Johannes Heidenhain GmbH Postfach 12 60 83292 Traunreut / DE | [2002/16] |
| Former [1996/31] | For all designated states Dr. Johannes Heidenhain GmbH Postfach 12 60 D-83292 Traunreut / DE | Inventor(s) | 01 /
Franz, Andreas, Dr. Herzog-Ludwig-Strasse 31 D-83308 Trostberg / DE | 02 /
Huber, Walter Wartbergfeldstrasse 20 D-83278 Traunstein / DE | [1996/31] | Application number, filing date | 95119686.4 | 14.12.1995 | [1996/31] | Priority number, date | DE1995102727 | 28.01.1995 Original published format: DE 19502727 | [1996/31] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0724168 | Date: | 31.07.1996 | Language: | DE | [1996/31] | Type: | B1 Patent specification | No.: | EP0724168 | Date: | 17.04.2002 | Language: | DE | [2002/16] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 10.06.1996 | Classification | IPC: | G02B5/18, G02B27/44 | [1996/31] | CPC: |
G02B5/1871 (EP,US)
| Designated contracting states | AT, CH, DE, FR, GB, IT, LI [1996/31] | Title | German: | Positionsmesseinrichtung mit Phasengitter und Herstellungsverfahren | [2001/43] | English: | Position measuring device using a phase grating and fabrication method | [2001/43] | French: | Dispositif de mesure de position utilisant un réseau de phase et méthode de fabrication | [2001/43] |
| Former [1996/31] | Phasengitter | ||
| Former [1996/31] | Phase grating | ||
| Former [1996/31] | Réseau de phase | Examination procedure | 29.06.1996 | Examination requested [1996/35] | 16.09.1996 | Despatch of a communication from the examining division (Time limit: M06) | 18.03.1997 | Reply to a communication from the examining division | 26.09.1997 | Despatch of a communication from the examining division (Time limit: M06) | 26.03.1998 | Reply to a communication from the examining division | 11.12.1998 | Despatch of a communication from the examining division (Time limit: M06) | 11.06.1999 | Reply to a communication from the examining division | 25.10.1999 | Despatch of a communication from the examining division (Time limit: M04) | 23.02.2000 | Reply to a communication from the examining division | 24.03.2000 | Despatch of a communication from the examining division (Time limit: M02) | 23.05.2000 | Reply to a communication from the examining division | 28.09.2001 | Despatch of communication of intention to grant (Approval: Yes) | 22.10.2001 | Communication of intention to grant the patent | 02.11.2001 | Fee for grant paid | 02.11.2001 | Fee for publishing/printing paid | Opposition(s) | 20.01.2003 | No opposition filed within time limit [2003/15] | Fees paid | Renewal fee | 02.01.1998 | Renewal fee patent year 03 | 04.01.1999 | Renewal fee patent year 04 | 05.01.2000 | Renewal fee patent year 05 | 02.01.2001 | Renewal fee patent year 06 | 02.01.2002 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]GB2200765 (SHARP KK) [X] 1-3 * page 6, line 22 - page 7, line 20 * * page 9, line 9 - line 11; figures 1A,B *; | [X]US4828356 (HOBROCK LOWELL M [US], et al) [X] 1-3 * column 3, line 31 - line 51; figure 2 * * column 4, line 61 - line 65 *; | [A]EP0409188 (HONEYWELL INC [US]) [A] 4 * abstract ** page 3, line 47 - line 51; figure 4 *; | [X]EP0424110 (KONISHIROKU PHOTO IND [JP]) [X] 1-3 * column 1, line 8 - line 18; figure 2 * * column 3, line 26 - line 33 *; | [X]EP0478055 (PHILIPS PATENTVERWALTUNG [DE], et al) [X] 1-3 * column 2, line 15 - line 19 * * column 3, line 9 - line 17; figures 2-4 * | Examination | DE3412958 | EP0390610 |