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EP0671630

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EP About this file: EP0671630

EP0671630 - Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 18.07.2003 Database last updated on 02.11.2024
Most recent event Tooltip	18.07.2003	Application deemed to be withdrawn	published on 03.09.2003 [2003/36]
Applicant(s)	For all designated states Hitachi Chemical Co., Ltd. 2-1-1, Nishishinjuku Shinjuku-ku Tokyo / JP
	For all designated states YAMADA DEN-ON CO., LTD. 2-12-20, Nagara-nishi, Kita-ku Osaka 531 / JP
	[N/P]
Former [1995/37]	For all designated states HITACHI CHEMICAL CO., LTD. 2-1-1, Nishishinjuku Shinjuku-ku, Tokyo / JP
	For all designated states YAMADA DEN-ON CO., LTD. 2-12-20, Nagara-nishi, Kita-ku Osaka 531 / JP
Inventor(s)	01 / Yokoya, Yasuhiko 1278-387, Tamado Shimodate-shi / JP
	02 / Yamazaki, Noboru 6-1, Hyakurakuso-3-chome Minoo-shi / JP
	03 / Nakamura, Mitsuo 3-30-803, Yuhigaokacho, Tennoji-ku Osaka-shi / JP
	04 / Hasuda, Syuuichi 164, Ozakata Shimodate-shi / JP
	05 / Namai, Eisaku 91, Noda Shimodate-shi / JP
	06 / Yamada, Syuuzou 2-12-20, Nagara-Nishi, Kita-ku Osaka-shi / JP
	[1995/37]
Representative(s)	Senior, Alan Murray, et al J A Kemp 14 South Square Gray's Inn London WC1R 5JJ / GB
	[N/P]
Former [1995/37]	Senior, Alan Murray, et al J.A. KEMP & CO., 14 South Square, Gray's Inn London WC1R 5LX / GB
Application number, filing date	95301426.3	06.03.1995
	[1995/37]
Priority number, date	JP19940035708	07.03.1994 Original published format: JP 3570894
	[1995/37]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	EP0671630
	Date:	13.09.1995
	Language:	EN
	[1995/37]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	03.07.1995
Classification	IPC:	G01R1/073	[1995/37]
	CPC:	G01R1/07378 (EP,US); G01R31/2886 (EP,US)
Designated contracting states	DE, FR, GB [1995/37]
Title	German:	Haltevorrichtung zur Messung der Eigenschaften eines Halbleiters, Herstellungsverfahren und Verwendung derselben	[1995/37]
	English:	Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof	[1995/37]
	French:	Guide-gabarit pour la mesure des propriétés d'un semi-conducteur, sa méthode de production et son utilisation	[1995/37]
Examination procedure	26.01.1996	Examination requested [1996/13]
	17.10.2002	Despatch of a communication from the examining division (Time limit: M04)
	28.02.2003	Application deemed to be withdrawn, date of legal effect [2003/36]
	04.04.2003	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2003/36]
Fees paid	Renewal fee
	12.03.1997	Renewal fee patent year 03
	10.03.1998	Renewal fee patent year 04
	11.03.1999	Renewal fee patent year 05
	13.03.2000	Renewal fee patent year 06
	16.03.2001	Renewal fee patent year 07
	13.03.2002	Renewal fee patent year 08
	Penalty fee
	Additional fee for renewal fee
	31.03.2003	09 M06 Not yet paid
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[Y]JPH04118985 ;
		[A]JPH05232141 ;
		[A]JPH01284778 ;
		[A]JPH01209379 ;
		[A]EP0142119 (MANIA GMBH [DE], et al) [A] 1,4,11,16 * figures 1-3; claims 1,2 *;
		[A]EP0180013 (IBM [US]) [A] 1,10,11,16 * column 5, line 35 - column 6, line 1; figure -; claims 4,5 *;
		[A]EP0227002 (KOLLMORGEN TECH CORP [US]) [A] 12;
		[Y]FR2621131 (THOMSON CSF [FR]) [Y] 1,11,12,16 * page 2, line 34 - page 3, line 30; figure - *;
		[A]EP0462706 (ITT [US]) [A] 1,2,11,16 * column 1, line 35 - column 2, line 2; figure 2 *;
		[Y]EP0468767 (HITACHI CHEMICAL CO LTD [JP]) [Y] 1,11,16 * page 4, line 24 - line 33; figure 7 *
		[Y] - PATENT ABSTRACTS OF JAPAN, (19920811), vol. 16, no. 372, Database accession no. (E - 1246), & JP04118985 A 19920420 (HITACHI CHEM CO LTD) [Y] 12 * abstract *
		[A] - PATENT ABSTRACTS OF JAPAN, (19931215), vol. 17, no. 684, Database accession no. (P - 1661), & JP05232141 A 19930907 (HITACHI CHEM CO LTD) [A] 1,11,16 * abstract *
		[A] - PATENT ABSTRACTS OF JAPAN, (19900205), vol. 14, no. 61, Database accession no. (P - 1001), & JP01284778 A 19891116 (MITSUBISHI ELECTRIC CORP) [A] 1,11,16 * abstract *
		[A] - PATENT ABSTRACTS OF JAPAN, (19891120), vol. 13, no. 517, Database accession no. (P - 962), & JP01209379 A 19890823 (HITACHI LTD) [A] 10 * abstract *

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