Extract from the Register of European Patents

EP About this file: EP0806083

EP0806083 - MOS CIRCUIT FOR SWITCHING HIGH VOLTAGES ON A SEMICONDUCTOR CHIP [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.08.1999
Database last updated on 28.03.2026
Most recent event   Tooltip13.08.1999No opposition filed within time limitpublished on 29.09.1999 [1999/39]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1997/46]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
80333 München / DE
Inventor(s)01 / HANNEBERG, Armin
Wieselweg 2
D-85540 Haar / DE
02 / TEMPEL, Georg
Flaschenträgerstrasse 17
D-81927 München / DE
[1997/46]
Application number, filing date95942654.529.12.1995
[1997/46]
WO1995DE01875
Priority number, dateDE199510211624.01.1995         Original published format: DE 19502116
[1997/46]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO9623356
Date:01.08.1996
Language:DE
[1996/35]
Type: A1 Application with search report 
No.:EP0806083
Date:12.11.1997
Language:DE
The application published by WIPO in one of the EPO official languages on 01.08.1996 takes the place of the publication of the European patent application.
[1997/46]
Type: B1 Patent specification 
No.:EP0806083
Date:07.10.1998
Language:DE
[1998/41]
Search report(s)International search report - published on:EP01.08.1996
ClassificationIPC:H03K17/10, H03K17/693, G11C16/06
[1997/46]
CPC:
G11C5/143 (EP,US); H03K17/10 (KR); G11C16/12 (EP,US);
G11C16/14 (EP,US); G11C5/14 (EP,US); H03K17/102 (EP,US);
H03K17/693 (EP,US); H03K3/356017 (EP,US); H03K3/356147 (EP,US) (-)
Designated contracting statesAT,   CH,   DE,   ES,   FR,   GB,   IT,   LI [1997/46]
TitleGerman:MOS-SCHALTUNGSANORDNUNG ZUM SCHALTEN HOHER SPANNUNGEN AUF EINEM HALBLEITERCHIP[1997/46]
English:MOS CIRCUIT FOR SWITCHING HIGH VOLTAGES ON A SEMICONDUCTOR CHIP[1997/46]
French:CIRCUIT MOS PERMETANT LA COMMUTATION DE TENSIONS ELEVEES SUR UNE PUCE DE SEMICONDUCTEUR[1997/46]
Entry into regional phase21.07.1997National basic fee paid 
21.07.1997Designation fee(s) paid 
21.07.1997Examination fee paid 
Examination procedure18.06.1996Request for preliminary examination filed
International Preliminary Examining Authority: EP
21.07.1997Examination requested  [1997/46]
13.03.1998Despatch of communication of intention to grant (Approval: Yes)
09.04.1998Communication of intention to grant the patent
07.07.1998Fee for grant paid
07.07.1998Fee for publishing/printing paid
Opposition(s)08.07.1999No opposition filed within time limit [1999/39]
Fees paidRenewal fee
18.12.1997Renewal fee patent year 03
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