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Extract from the Register of European Patents

EP About this file: EP0731492

EP0731492 - Method of growing a single crystal thin film with a uniform thickness, in the vapor phase [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  18.05.2001
Database last updated on 03.10.2024
Most recent event   Tooltip18.05.2001Application deemed to be withdrawnpublished on 04.07.2001 [2001/27]
Applicant(s)For all designated states
SHIN-ETSU HANDOTAI COMPANY LIMITED
4-2, Marunouchi 1-Chome Chiyoda-ku
Tokyo / JP
[N/P]
Former [1996/37]For all designated states
SHIN-ETSU HANDOTAI COMPANY LIMITED
4-2, Marunouchi 1-Chome
Chiyoda-ku Tokyo / JP
Inventor(s)01 / Nagoya, Takatoshi, c/o Isobe Kojo
Shin-Etsu Handotai Co., Ltd., 13-1 Isobe 2-chome
Annaka-shi, Gunma-ken / JP
02 / Kashino, Hisashi, c/o Isobe Kojo
Shin-Etsu Handotai Co., Ltd., 13-1 Isobe 2-chome
Annaka-shi, Gunma-ken / JP
03 / Habuka, Hitoshi, c/o Handotai Isobe Kenkyusho
Shin-Etsu Handotai Co., Ltd., 13-1 Isobe 2-chome
Annaka-shi, Gunma-ken / JP
[1996/37]
Representative(s)Ter Meer Steinmeister & Partner
Patentanwälte mbB
Nymphenburger Strasse 4
80335 München / DE
[N/P]
Former [1996/37]TER MEER - MÜLLER - STEINMEISTER & PARTNER
Mauerkircherstrasse 45
81679 München / DE
Application number, filing date96103695.108.03.1996
[1996/37]
Priority number, dateJP1995007945310.03.1995         Original published format: JP 7945395
[1996/37]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0731492
Date:11.09.1996
Language:EN
[1996/37]
Type: A3 Search report 
No.:EP0731492
Date:08.04.1998
[1998/15]
Search report(s)(Supplementary) European search report - dispatched on:EP18.02.1998
ClassificationIPC:H01L21/205, C30B25/14, C30B25/02, C30B25/16
[1998/13]
CPC:
C30B25/14 (EP,US)
Former IPC [1996/37]H01L21/205, C30B25/02, C30B25/16
Designated contracting statesDE,   FR,   GB [1996/37]
TitleGerman:Verfahren zum Aufwachsen einer Einkristall-Dünnschicht mit konstanter Dicke in der Gasphase[1996/37]
English:Method of growing a single crystal thin film with a uniform thickness, in the vapor phase[1996/37]
French:Méthode de croissance en phase vapeur d'un film mince monocristallin, présentant une épaisseur uniforme[1996/37]
Examination procedure29.04.1998Examination requested  [1998/27]
03.09.2000Application deemed to be withdrawn, date of legal effect  [2001/27]
15.01.2001Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2001/27]
Fees paidRenewal fee
09.03.1998Renewal fee patent year 03
15.03.1999Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.03.200005   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XAY]US5108540  (FRIJLINK PETER M [FR]) [X] 1 * column 1, line 10 - line 18 * * column 1, line 53 - column 2, line 44 * * column 3, line 29 - column 4, line 41; figures 1,2 * * column 5, line 1 - line 16; figures 4A,4B * * column 5, line 36 - column 6, line 12; figure 6 * [A] 2 [Y] 3;
 [A]JPS62235728  ;
 [A]JPS61248518  ;
 [XY]  - YOSUKE INOUE ET AL., "RF induction heated hot-wall type reactor for high volume, low cost Si epitaxy", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, MANCHESTER, NEW HAMPSHIRE US, (199004), vol. 137, no. 4, pages 1228 - 1234, XP000242172 [X] 1,2 * page 1228, column R - page 1229, column L * * page 1231 - page 1234; figures 11-14 * [Y] 3

DOI:   http://dx.doi.org/10.1149/1.2086637
 [A]  - PATENT ABSTRACTS OF JAPAN, (19880406), vol. 012, no. 106, Database accession no. (E - 596), & JP62235728 A 19871015 (NEC CORP) [A] 1-3 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19870327), vol. 011, no. 099, Database accession no. (E - 493), & JP61248518 A 19861105 (OKI ELECTRIC IND CO LTD) [A] 1,2 * abstract *
 [A]  - NAKAMURA S ET AL, THE UNIFORMITY CONTROL ON SILICON EPITAXIAL GROWTH USING A LAMINAR FLOW, EXTENDED ABSTRACTS, VOL. 92/2, PAGE(S) 622/623, (19920101), XP000549968 [A] 1,2 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.