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Extract from the Register of European Patents

EP About this file: EP0740339

EP0740339 - Method of forming a capacitor electrode of a semiconductor memory device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.01.2004
Database last updated on 05.10.2024
Most recent event   Tooltip30.01.2004No opposition filed within time limitpublished on 17.03.2004  [2004/12]
Applicant(s)For all designated states
NEC Electronics Corporation
1753 Shimonumabe Nakahara-ku
Kawasaki, Kanagawa 211-8668 / JP
[N/P]
Former [2003/18]For all designated states
NEC Electronics Corporation
1753 Shimonumabe, Nakahara-ku
Kawasaki, Kanagawa 211-8668 / JP
Former [2003/13]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome, Minato-ku
Tokyo / JP
Former [1996/44]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Hirota, Toshiyuki, c/o NEC Corporation
7-1, Shiba 5-chome, Minato-ku
Tokyo / JP
02 / Fujiwara, Shuji, c/o NEC Corporation
7-1, Shiba 5-chome, Minato-ku
Tokyo / JP
[1996/44]
Representative(s)Glawe, Delfs, Moll
Partnerschaft mbB von
Patent- und Rechtsanwälten
Postfach 26 01 62
80058 München / DE
[N/P]
Former [1996/44]Glawe, Delfs, Moll & Partner
Patentanwälte Postfach 26 01 62
80058 München / DE
Application number, filing date96106454.024.04.1996
[1996/44]
Priority number, dateJP1995010376027.04.1995         Original published format: JP 10376095
[1996/44]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0740339
Date:30.10.1996
Language:EN
[1996/44]
Type: A3 Search report 
No.:EP0740339
Date:29.07.1998
[1998/31]
Type: B1 Patent specification 
No.:EP0740339
Date:26.03.2003
Language:EN
[2003/13]
Search report(s)(Supplementary) European search report - dispatched on:EP16.06.1998
ClassificationIPC:H01L21/8242, H01L21/3205, H01L27/108
[1998/30]
CPC:
H10B12/318 (EP,US); H10B12/033 (EP,US)
Former IPC [1996/44]H01L21/8242, H01L21/108, H01L21/3205
Designated contracting statesDE,   GB [1996/44]
TitleGerman:Verfahren zum Herstellen einer Kondensatorelektrode einer Halbleiterspeicheranordnung[1996/44]
English:Method of forming a capacitor electrode of a semiconductor memory device[1996/44]
French:Procédé de fabrication d'une électrode de condensateur pour un dispositif de mémoire semi-conductrice[1996/44]
Examination procedure08.07.1998Examination requested  [1998/37]
01.02.1999Despatch of a communication from the examining division (Time limit: M06)
11.08.1999Reply to a communication from the examining division
29.05.2000Despatch of a communication from the examining division (Time limit: M06)
01.12.2000Reply to a communication from the examining division
25.04.2001Despatch of a communication from the examining division (Time limit: M06)
26.10.2001Reply to a communication from the examining division
28.05.2002Despatch of communication of intention to grant (Approval: Yes)
08.10.2002Communication of intention to grant the patent
08.01.2003Fee for grant paid
08.01.2003Fee for publishing/printing paid
Opposition(s)30.12.2003No opposition filed within time limit [2004/12]
Fees paidRenewal fee
20.04.1998Renewal fee patent year 03
19.04.1999Renewal fee patent year 04
14.04.2000Renewal fee patent year 05
19.04.2001Renewal fee patent year 06
19.04.2002Renewal fee patent year 07
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipDE27.06.2003
[2004/05]
Documents cited:Search[YD]JPH0629463  ;
 [Y]JPS5539634  ;
 [A]JPS58204540  ;
 [A]JPS6130046
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.