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EP0762078

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EP About this file: EP0762078

EP0762078 - Apparatus and method for measuring the thickness of the layers of a multi-layer transparent film [Right-click to bookmark this link]
Former [1997/11]	System for determining the thickness and index of refraction of a film
	[2006/47]
Status	The application is deemed to be withdrawn Status updated on 14.09.2007 Database last updated on 14.09.2024
Most recent event Tooltip	14.09.2007	Application deemed to be withdrawn	published on 17.10.2007 [2007/42]
Applicant(s)	For all designated states Agilent Technologies, Inc. - a Delaware Corporation - 5301 Stevens Creek Boulevard Santa Clara CA 95051 / US
	[N/P]
Former [2007/04]	For all designated states Agilent Technologies, Inc. - a Delaware Corporation - 5301 Stevens Creek Boulevard Santa Clara, CA 95051 / US
Former [2001/41]	For all designated states Agilent Technologies, Inc. (a Delaware corporation) 395 Page Mill Road Palo Alto, CA 94303 / US
Former [2001/32]	For all designated states Agilent Technologies Inc. a Delaware Corporation 395 Page Mill Road Palo Alto, CA 94303 / US
Former [2001/31]	For all designated states Agilent Technologies Inc. a Delaware Corporation 395 Page Mill Road Palo Alto, CA 94303 / US
Former [2001/14]	For all designated states Agilent Technologies, Inc. 395 Page Mill Road Palo Alto, CA 94303 / US
Former [2001/13]	For all designated states Hewlett-Packard Company, A Delaware Corporation 3000 Hanover Street Palo Alto, CA 94304 / US
Former [1997/11]	For all designated states Hewlett-Packard Company 3000 Hanover Street Palo Alto, California 94304 / US
Inventor(s)	01 / Venkatesh, Shalini 1078 Pomeroy Avenue Santa Clara, California 95051 / US
	02 / Heffner, Brian L. 1449 Topar Avenue Los Altos, California 94024 / US
	03 / Sorin, Wayne V. 3579 Cambridge Lane Mountain View, California 94040 / US
	[1997/11]
Representative(s)	Jehan, Robert, et al Williams Powell 44 Prospect Place Bromley, Kent BR2 9HN / GB
	[N/P]
Former [1997/11]	Jehan, Robert, et al Williams, Powell & Associates, 34 Tavistock Street London WC2E 7PB / GB
Application number, filing date	96305828.4	08.08.1996
	[1997/11]
Priority number, date	US19950520198	28.08.1995 Original published format: US 520198
	[1997/11]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP0762078
	Date:	12.03.1997
	Language:	EN
	[1997/11]
	Type:	A3 Search report
	No.:	EP0762078
	Date:	07.01.1998
	[1998/02]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	13.11.1997
Classification	IPC:	G01B11/06, G01N21/41	[1997/11]
	CPC:	G01N21/41 (EP,US); G01B11/0675 (EP,US)
Designated contracting states	DE, FR, GB [1997/11]
Title	German:	Vorrichtung und Verfahren zur Messung der Dicke der Schichten einer transparenten Mehrschichtfilmstruktur	[2006/47]
	English:	Apparatus and method for measuring the thickness of the layers of a multi-layer transparent film	[2006/47]
	French:	Dispositif et procédé de mesure de l'épaisseur des couches d'une structure multicouche en film transparente	[2006/47]
	Former [1997/11]	System zum Determinieren der Dicke und des Bruchungsindexes eines Dünnfilms
	Former [1997/11]	System for determining the thickness and index of refraction of a film
	Former [1997/11]	Système pour la détermination de l'épaisseur et de l'indice de réfraction d'une pellicule
Examination procedure	04.05.1998	Examination requested [1998/27]
	24.04.2001	Despatch of a communication from the examining division (Time limit: M04)
	27.08.2001	Reply to a communication from the examining division
	15.01.2002	Despatch of a communication from the examining division (Time limit: M04)
	13.05.2002	Reply to a communication from the examining division
	28.11.2003	Date of oral proceedings
	16.12.2003	Despatch of communication that the application is refused, reason: substantive examination {1}
	16.12.2003	Minutes of oral proceedings despatched
	07.11.2006	Communication of intention to grant the patent
	20.03.2007	Application deemed to be withdrawn, date of legal effect [2007/42]
	23.05.2007	Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2007/42]
Appeal following examination	09.02.2004	Appeal received No. T0603/04
	13.04.2004	Statement of grounds filed
	07.04.2003	Appeal received
	23.06.2003	Statement of grounds filed
	29.07.2003	Interlocutory revision of appeal
Fees paid	Renewal fee
	27.07.1998	Renewal fee patent year 03
	21.07.1999	Renewal fee patent year 04
	21.07.2000	Renewal fee patent year 05
	21.08.2001	Renewal fee patent year 06
	21.08.2002	Renewal fee patent year 07
	25.08.2003	Renewal fee patent year 08
	23.08.2004	Renewal fee patent year 09
	19.08.2005	Renewal fee patent year 10
	29.08.2006	Renewal fee patent year 11
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[X]US4647205 (KALLIOMAEKI KALEVI J [FI], et al) [X] 1,5,6,10 * abstract * * column 4, line 29 - column 5, line 26; figure 3 *;
		[A]US5341205 (MCLANDRICH MATTHEW N [US], et al) [A] 1 * abstract *;
		[X] - SORIN W V ET AL, "SIMULTANEOUS THICKNESS AND GROUP INDEX MEASUREMENT USING OPTICAL LOW-COHERENCE REFLECTOMETRY", IEEE PHOTONICS TECHNOLOGY LETTERS, (19920101), vol. 4, no. 1, pages 105 - 107, XP000244587 [X] 1,3,5,6,8,10 * the whole document * DOI: http://dx.doi.org/10.1109/68.124892
		[A] - FLOURNOY P A ET AL, "WHITE-LIGHT INTERFEROMETRIC THICKNESS GAUGE", APPLIED OPTICS, (197209), vol. 11, no. 9, pages 1907 - 1915, XP002027922 [A] 1 * the whole document * DOI: http://dx.doi.org/10.1364/AO.11.001907
		[A] - GEERKENS J ET AL, "INTERFEROMETRIE MIT LICHT KURZER KOHARENZLANGE ZUR ABSOLUTEN MESSUNG VON ABSTANDEN UND DICKEN", MICROTECNIC, (19940101), no. 4, pages 8 - 10, XP000495354 [A] 1 * page 9, column M, line 24 - page 10, column R, line 8; figure 4 *

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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