Extract from the Register of European Patents

EP About this file: EP0762170

EP0762170 - Optical-axis alignment method, optical-axis alignment device, inspection method of optical devices, inspection device of optical devices, method of producing optical module, and apparatus of producing optical module [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.03.2005
Database last updated on 14.03.2026
Most recent event   Tooltip17.02.2006Lapse of the patent in a contracting statepublished on 05.04.2006  [2006/14]
Applicant(s)For all designated states
SUMITOMO ELECTRIC INDUSTRIES, LTD.
5-33, Kitahama 4-Chome, Chuo-ku
Osaka / JP
[1997/29]
Former [1997/11]For all designated states
SUMITOMO ELECTRIC INDUSTRIES, INC.
5-33, Kitahama 4-chome
Chuo-ku, Osaka / JP
Inventor(s)01 / Fujimura, Yasushi, Osaka Works of Sumitomo
Elec. Ind., Ltd., 1-3, Shimaya 1-chome
Konohana-ku, Osaka / JP
02 / Kuhara, Yoshiki, Osaka Works of Sumitomo
Elec. Ind., Ltd., 1-3, Shimaya 1-chome
Konohana-ku, Osaka / JP
03 / Yamabayashi, Naoyuki, Osaka Works of Sumitomo
Elec. Ind., Ltd., 1-3, Shimaya 1-chome
Konohana-ku, Osaka / JP
[1997/11]
Representative(s)Smith, Norman Ian, et al
Cleveland
40-43 Chancery Lane
London WC2A 1JQ / GB
[N/P]
Former [1997/11]Smith, Norman Ian, et al
F.J. CLEVELAND & COMPANY 40-43 Chancery Lane
London WC2A 1JQ / GB
Application number, filing date96306114.821.08.1996
[1997/11]
Priority number, dateJP1995023774522.08.1995         Original published format: JP 23774595
[1997/11]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0762170
Date:12.03.1997
Language:EN
[1997/11]
Type: B1 Patent specification 
No.:EP0762170
Date:06.05.2004
Language:EN
[2004/19]
Search report(s)(Supplementary) European search report - dispatched on:EP12.12.1996
ClassificationIPC:G02B6/42, G02B6/30
[1997/11]
CPC:
G02B6/30 (EP,US); G02B6/26 (KR); G02B6/4227 (EP,US);
G02B6/4207 (EP,US); G02B6/4237 (EP,US); G02B6/4249 (EP,US);
Y10S359/90 (EP,US) (-)
Designated contracting statesDE,   FR [1997/11]
TitleGerman:Verfahren zur Ausrichtung optischer Achsen, Vorrichtung dazu, Inspektionsverfahren für optische Geräte, Inspektionsgerät, Herstellungsverfahren optischer Module und Gerät zur Herstellung eines optischen Moduls[2003/46]
English:Optical-axis alignment method, optical-axis alignment device, inspection method of optical devices, inspection device of optical devices, method of producing optical module, and apparatus of producing optical module[1997/11]
French:Méthode et dispositif d'alignement d'axes optiques, méthode et dispositif d'inspection de dispositifs optiques, méthode et appareil de fabrication de module optique[2003/46]
Former [1997/11]Verfahren zur Ausrichtung in Richtung der optische Achse, Vorrichtung dazu, Inspektionsverfahren für optische Geräte, Inspektionsgerät, Herstellungsverfahren optischer Module und Gerät zur Herstellung eines optische Moduls
Former [1997/11]Méthode d'alignement suivant axe optique, dispositif d'alignement suivant axe optique, méthode d'inspection d'un dispositif optique, dispositif d'inspection des dispositifs optiques, méthode de fabrication de module optique et appareil de fabrication de module optique
Examination procedure24.01.1997Examination requested  [1997/13]
20.02.2003Despatch of a communication from the examining division (Time limit: M06)
29.08.2003Reply to a communication from the examining division
06.11.2003Communication of intention to grant the patent
10.02.2004Fee for grant paid
10.02.2004Fee for publishing/printing paid
Opposition(s)08.02.2005No opposition filed within time limit [2005/17]
Fees paidRenewal fee
17.08.1998Renewal fee patent year 03
11.08.1999Renewal fee patent year 04
17.08.2000Renewal fee patent year 05
18.08.2001Renewal fee patent year 06
12.08.2002Renewal fee patent year 07
22.08.2003Renewal fee patent year 08
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Lapses during opposition  TooltipFR06.05.2004
[2006/14]
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