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Extract from the Register of European Patents

EP About this file: EP0782141

EP0782141 - Voltage pumping circuit for semiconductor memory device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  24.01.2004
Database last updated on 02.11.2024
Most recent event   Tooltip24.01.2004No opposition filed within time limitpublished on 10.03.2004  [2004/11]
Applicant(s)For all designated states
Samsung Electronics Co., Ltd.
416 Maetan-dong
Paldal-gu
Suwon City, Kyungki-do / KR
[N/P]
Former [1997/27]For all designated states
Samsung Electronics Co., Ltd.
416 Maetan-dong, Paldal-gu
Suwon City, Kyungki-do / KR
Inventor(s)01 / Bae, Yong-Cheol
Sanga Apt. No.4-1105
Ohgeum-dong, Songpa-gu, Seoul / KR
02 / Yoon, Sei-Seung
40-118. Hangangro 3-ga
Yongsan-gu. Seoul / KR
03 / Seo, Dong-Il
35, Woncheon-dong
Paldal-gu, Suwon-city, Kyungki-do / KR
[1997/27]
Representative(s)Tunstall, Christopher Stephen
Harrison Goddard Foote
Fountain Precinct
Balm Green
Sheffield
S1 2JA / GB
[N/P]
Former [1998/03]Tunstall, Christopher Stephen
Dibb Lupton Alsop, Fountain Precinct
Balm Green, Sheffield S1 1RZ / GB
Former [1997/27]Tunstall, Christopher Stephen
Dibb Lupton Alsop, 117 The Headrow
Leeds, West Yorkshire LS1 5JX / GB
Application number, filing date96309400.823.12.1996
[1997/27]
Priority number, dateKR1959004149527.12.1995         Original published format: KR 5941495
[1997/27]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0782141
Date:02.07.1997
Language:EN
[1997/27]
Type: A3 Search report 
No.:EP0782141
Date:29.12.1997
[1997/52]
Type: B1 Patent specification 
No.:EP0782141
Date:19.03.2003
Language:EN
[2003/12]
Search report(s)(Supplementary) European search report - dispatched on:EP11.11.1997
ClassificationIPC:G11C5/14, G11C11/407
[1997/51]
CPC:
G11C5/145 (EP,US); G11C5/14 (KR)
Former IPC [1997/27]G11C5/14
Designated contracting statesDE,   FR,   GB,   IT [1997/27]
TitleGerman:Spannungspumpenschaltung für Halbleiterspeicheranordnung[1997/27]
English:Voltage pumping circuit for semiconductor memory device[1997/27]
French:Circuit de pompage de tension pour dispositif de mémoire à semi-conducteurs[1997/27]
Examination procedure07.01.1997Examination requested  [1997/27]
14.07.2000Despatch of a communication from the examining division (Time limit: M04)
22.11.2000Reply to a communication from the examining division
19.12.2000Despatch of a communication from the examining division (Time limit: M06)
26.06.2001Reply to a communication from the examining division
03.09.2001Despatch of a communication from the examining division (Time limit: M04)
20.12.2001Reply to a communication from the examining division
27.05.2002Despatch of communication of intention to grant (Approval: Yes)
30.09.2002Communication of intention to grant the patent
25.11.2002Fee for grant paid
25.11.2002Fee for publishing/printing paid
Opposition(s)22.12.2003No opposition filed within time limit [2004/11]
Fees paidRenewal fee
16.11.1998Renewal fee patent year 03
26.10.1999Renewal fee patent year 04
20.11.2000Renewal fee patent year 05
04.12.2001Renewal fee patent year 06
28.10.2002Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[YA]US4769792  (NOGAMI KAZUTAKA [JP], et al);
 [XY]US5267214  (FUJISHIMA KAZUYASU [JP], et al);
 [PA]GB2296986  (SAMSUNG ELECTRONICS CO LTD [KR]);
 [EA]GB2306718  (HYUNDAI ELECTRONICS IND [KR])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.