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Extract from the Register of European Patents

EP About this file: EP0781876

EP0781876 - Method and apparatus for production of single crystal [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.01.2001
Database last updated on 11.01.2025
Most recent event   Tooltip17.02.2006Change - lapse in a contracting state
Updated state(s): FR
published on 05.04.2006  [2006/14]
Applicant(s)For all designated states
SHIN-ETSU HANDOTAI COMPANY LIMITED
4-2, Marunouchi 1-Chome Chiyoda-ku
Tokyo / JP
[N/P]
Former [1997/27]For all designated states
SHIN-ETSU HANDOTAI COMPANY LIMITED
4-2, Marunouchi 1-Chome
Chiyoda-ku Tokyo / JP
Inventor(s)01 / Hoshi, Ryouji, 304, 89-2, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
02 / Sonokawa, Masashi, 202, 89-2, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
03 / Fusegawa, Izumi, A-305, 355-3, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
04 / Ohta, Tomohiko
11-4, Aza, Misaka 1-chome
Shirakawa-shi, Fukushima-ken / JP
[1997/28]
Former [1997/27]01 / Hoshi, Ryouji, 304, 89-2, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
02 / Sonokawa, Masashi, 202, 89-2, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
03 / Fusegawa, Izumi, A-305, 355-3, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
04 / Ohta, Tomohiko, 307, 89-2, Ohaza
Odakura, Aza Haranaka, Nishigo-mura
Nishishirakawa-gun, Fukushima-ken / JP
Representative(s)Cooper, John, et al
Murgitroyd & Company
Scotland House
165-169 Scotland Street
Glasgow G5 8PL / GB
[N/P]
Former [1997/27]Cooper, John, et al
Murgitroyd & Company, Chartered Patent Agents, 373 Scotland Street
Glasgow G5 8QA / GB
Application number, filing date96309408.123.12.1996
[1997/27]
Priority number, dateJP1995035391429.12.1995         Original published format: JP 35391495
[1997/27]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0781876
Date:02.07.1997
Language:EN
[1997/27]
Type: B1 Patent specification 
No.:EP0781876
Date:08.03.2000
Language:EN
[2000/10]
Search report(s)(Supplementary) European search report - dispatched on:EP01.04.1997
ClassificationIPC:C30B15/30, C30B15/00, C30B29/06
[1997/27]
CPC:
C30B29/06 (EP,US); C30B15/305 (EP,US); Y10S117/917 (EP,US)
Designated contracting statesDE,   FR,   GB [1997/27]
TitleGerman:Verfahren und Vorrichtung zur Herstellung eines Einkristalles[1997/27]
English:Method and apparatus for production of single crystal[1997/27]
French:Procédé et appareillage pour la production d'un monocristal[1997/27]
Examination procedure14.08.1997Examination requested  [1997/41]
21.10.1998Despatch of a communication from the examining division (Time limit: M06)
09.04.1999Reply to a communication from the examining division
23.06.1999Despatch of communication of intention to grant (Approval: Yes)
10.09.1999Communication of intention to grant the patent
22.11.1999Fee for grant paid
22.11.1999Fee for publishing/printing paid
Opposition(s)09.12.2000No opposition filed within time limit [2001/08]
Fees paidRenewal fee
24.12.1998Renewal fee patent year 03
29.12.1999Renewal fee patent year 04
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competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR08.03.2000
[2006/14]
Former [2001/16]FR04.08.2000
Documents cited:Search[PX]EP0745706  (SHINETSU HANDOTAI KK [JP]) [PX] 1,3,5,7-10 * claims 1-4 *;
 [X]JPS6360189  ;
 [A]US5178720  (FREDERICK ROGER A [US]);
 [A]GB2143746  (TOSHIBA KK);
 [A]GB2144338  (TOSHIBA KK);
 [A]GB2163672  (TOSHIBA KK)
 [X]  - PATENT ABSTRACTS OF JAPAN, (19880801), vol. 12, no. 279, Database accession no. (C - 517), & JP63060189 A 00000000 (TOSHIBA CORP.) [X] 1,7 * abstract *
by applicantUS4565671
 JP19950353914
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.