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Extract from the Register of European Patents

EP About this file: EP0750172

EP0750172 - Caliper gage for calibrating a reading apparatus of a spectacle frame shape and calibrating method therefore [Right-click to bookmark this link]
Former [1996/52]Caliper gage for calibrating a reading apparatus of a spectacle frame shape and calibrating method therefor
[2000/27]
StatusNo opposition filed within time limit
Status updated on  15.02.2002
Database last updated on 25.09.2024
Most recent event   Tooltip15.02.2002No opposition filed within time limitpublished on 03.04.2002  [2002/14]
Applicant(s)For all designated states
ESSILOR INTERNATIONAL (Compagnie Générale d'Optique)
147, rue de Paris
94220 Charenton-le-Pont / FR
[N/P]
Former [1996/52]For all designated states
ESSILOR INTERNATIONAL (Compagnie Générale d'Optique)
147, rue de Paris
F-94220 Charenton-le-Pont / FR
Inventor(s)01 / Guillermin, Laurent
10 Passage du Chantier
75012 Paris / FR
02 / Hougas, Henri
24 Allée des Charmes
77020 Ozoir la Ferriere / FR
03 / Horel, Patrick
13 rue Voltaire
92300 Levallois Perret / FR
[1996/52]
Representative(s)CABINET BONNET-THIRION
12, Avenue de la Grande-Armée
75017 Paris / FR
[N/P]
Former [1996/52]CABINET BONNET-THIRION
95 Boulevard Beaumarchais
75003 Paris / FR
Application number, filing date96401355.120.06.1996
[1996/52]
Priority number, dateFR1995000755523.06.1995         Original published format: FR 9507555
[1996/52]
Filing languageFR
Procedural languageFR
PublicationType: A2 Application without search report 
No.:EP0750172
Date:27.12.1996
Language:FR
[1996/52]
Type: A3 Search report 
No.:EP0750172
Date:25.06.1997
[1997/26]
Type: B1 Patent specification 
No.:EP0750172
Date:11.04.2001
Language:FR
[2001/15]
Search report(s)(Supplementary) European search report - dispatched on:EP07.05.1997
ClassificationIPC:G01B5/20, G01B7/28
[1996/52]
CPC:
G01B3/14 (EP,US)
Designated contracting statesBE,   DE,   ES,   GB,   IT [1996/52]
TitleGerman:Eichkaliber zum Eichen einer Konturlesevorrichtung für Brillenfassung und entsprechendes Eich-Verfahren[1996/52]
English:Caliper gage for calibrating a reading apparatus of a spectacle frame shape and calibrating method therefore[2000/27]
French:Calibre étalon pour l'étalonnage d'un appareil de lecture de contour pour monture de lunettes, et procédé d'étalonnage correspondant[1996/52]
Former [1996/52]Caliper gage for calibrating a reading apparatus of a spectacle frame shape and calibrating method therefor
Examination procedure26.05.1997Examination requested  [1997/30]
02.07.1998Despatch of a communication from the examining division (Time limit: M04)
24.09.1998Reply to a communication from the examining division
11.02.1999Despatch of a communication from the examining division (Time limit: M04)
20.05.1999Reply to a communication from the examining division
20.07.1999Despatch of a communication from the examining division (Time limit: M04)
30.11.1999Reply to a communication from the examining division
06.09.2000Despatch of communication of intention to grant (Approval: Yes)
29.09.2000Communication of intention to grant the patent
15.12.2000Fee for grant paid
15.12.2000Fee for publishing/printing paid
Opposition(s)12.01.2002No opposition filed within time limit [2002/14]
Fees paidRenewal fee
25.06.1998Renewal fee patent year 03
28.06.1999Renewal fee patent year 04
29.06.2000Renewal fee patent year 05
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Documents cited:Search[A]EP0424207  (ESSILOR INT [FR]) [A] 1 * column 3 - column 9 *;
 [D]FR2652893  (ESSILOR INT [FR]);
 [A]FR2669999  (GERBER OPTICAL INC [US]) [A] 1 * page 12 - page 28 *;
 [A]EP0639754  (TOPCON CORP [JP]) [A] 1-19 * column 4 - column 15 *;
 [A]EP0583915  (HOYA CORP [JP]) [A] 1-19 * claims 1-13 *;
 [A]JPH06270046
 [A]  - PATENT ABSTRACTS OF JAPAN, (19941221), vol. 018, no. 679, Database accession no. (M - 1728), & JP06270046 A 19940927 (TOPCON CORP) [A] 1 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.