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Extract from the Register of European Patents

EP About this file: EP0785572

EP0785572 - Dry etching method for aluminium alloy and etching gas therefor [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  21.02.2003
Database last updated on 08.01.2025
Most recent event   Tooltip17.10.2008Change - applicantpublished on 19.11.2008  [2008/47]
Applicant(s)For all designated states
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, Oaza Kadoma Kadoma-shi Osaka
571-8501 / JP
[2008/47]
Former [1997/30]For all designated states
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, Oaza Kadoma
Kadoma-shi, Osaka 571 / JP
Inventor(s)01 / Yamanaka, Michinari
6-1-207, Kawahara-cho
Hirakata-shi, Osaka 573 / JP
[1997/30]
Representative(s)Kügele, Bernhard, et al
Novagraaf International SA
Chemin de l'Echo 3
1213 Onex / CH
[N/P]
Former [1997/30]Kügele, Bernhard, et al
NOVAPAT INTERNATIONAL SA, 9, Rue du Valais
1202 Genève / CH
Application number, filing date97100846.121.01.1997
[1997/30]
Priority number, dateJP1996000852522.01.1996         Original published format: JP 852596
[1997/30]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0785572
Date:23.07.1997
Language:EN
[1997/30]
Type: A3 Search report 
No.:EP0785572
Date:20.08.1997
[1997/34]
Search report(s)(Supplementary) European search report - dispatched on:EP08.07.1997
ClassificationIPC:H01L21/321
[1997/33]
CPC:
H01L21/32135 (EP,US)
Former IPC [1997/30]H01L21/302
Designated contracting statesDE,   FR,   GB [1997/30]
TitleGerman:Trockenätzverfahren für Aluminium-Legierung und dazugehörendes Ätzgas[1997/30]
English:Dry etching method for aluminium alloy and etching gas therefor[1997/30]
French:Méthode de gravure sèche d'un alliage d'aluminium et gaz d'attaque[1997/30]
Examination procedure14.11.1997Amendment by applicant (claims and/or description)
17.11.1997Examination requested  [1998/03]
04.02.2000Despatch of a communication from the examining division (Time limit: M04)
31.05.2000Reply to a communication from the examining division
15.02.2002Despatch of a communication from the examining division (Time limit: M04)
11.06.2002Reply to a communication from the examining division
14.02.2003Application withdrawn by applicant  [2003/15]
Fees paidRenewal fee
12.01.1999Renewal fee patent year 03
18.01.2000Renewal fee patent year 04
18.01.2001Renewal fee patent year 05
21.01.2002Renewal fee patent year 06
28.01.2003Renewal fee patent year 07
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Documents cited:Search[X]US4734157  (CARBAUGH SUSANNA R [US], et al) [X] 1-3,8 * column 4, line 41 - line 46 * * column 5, line 27 - line 32 * * claim 1 *;
 [A]US4073669  (HEINECKE RUDOLF AUGUST HERBERT, et al) [A] 1-4,8,9 * claim 1 *;
 [A]US4308089  (IIDA SHINYA, et al) [A] 1-4,7-9 * example 1 *;
 [A]US5200031  (LATCHFORD IAN S [US], et al) [A] 1-4,8,9 * claim 1 *;
 [A]DE4124543  (MICRON TECHNOLOGY INC [US]) [A] 1-4,8,9 * claims 1,4 *;
 [A]EP0485802  (NEC CORP [JP]) [A] 1-4,8,9 * claims 1,2 *;
 [A]US3994793  (HARVILCHUCK JOSEPH M, et al) [A] 1-11 * claim 1 *
by applicantJPH01186622
 JPH05206082
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.