Extract from the Register of European Patents

EP About this file: EP0810429

EP0810429 - Optical measuring apparatus for light scattering [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.01.2004
Database last updated on 26.03.2026
Most recent event   Tooltip11.01.2008Lapse of the patent in a contracting state
New state(s): IT
published on 13.02.2008  [2008/07]
Applicant(s)For all designated states
Kurashiki Boseki Kabushiki Kaisha
7-1, Hommachi Kurashiki-shi
Okayama 710 / JP
For all designated states
Kyoto Dai-ichi Kagaku Co., Ltd.
57, Nishiaketa-cho Higashikujo, Minato-ku Kyoto-shi
Kyoto 601 / JP
[N/P]
Former [1997/49]For all designated states
Kurashiki Boseki Kabushiki Kaisha
7-1, Hommachi
Kurashiki-shi Okayama 710 / JP
For all designated states
Kyoto Dai-ichi Kagaku Co., Ltd.
57, Nishiaketa-cho Higashikujo, Minato-ku
Kyoto-shi, Kyoto 601 / JP
Inventor(s)01 / Kimura, Eiichi, c/o Kurashiki Boseki K.K.
Gijutsu Kenkyusho, 14-5, Shimokida-cho
Neyagawa-shi, Osaka 572 / JP
[1997/49]
Representative(s)Schoppe, Fritz
Schoppe, Zimmermann, Stöckeler & Zinkler
Patentanwälte
Postfach 246
82043 Pullach bei München / DE
[N/P]
Former [1997/49]Schoppe, Fritz, Dipl.-Ing.
Patentanwalt, P.O. Box 71 08 67
81458 München / DE
Application number, filing date97108406.623.05.1997
[1997/49]
Priority number, dateJP1996016086031.05.1996         Original published format: JP 16086096
[1997/49]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0810429
Date:03.12.1997
Language:EN
[1997/49]
Type: B1 Patent specification 
No.:EP0810429
Date:26.02.2003
Language:EN
[2003/09]
Search report(s)(Supplementary) European search report - dispatched on:EP19.08.1997
ClassificationIPC:G01N21/47, G02B6/04, A61B5/00
[1997/49]
CPC:
A61B5/1455 (EP,US); G01N21/47 (KR); A61B5/14532 (EP,US);
G01N21/474 (EP,US); G02B6/04 (EP,US); G01N2021/4747 (EP,US);
G01N21/49 (EP,US) (-)
Designated contracting statesCH,   DE,   FR,   GB,   IT,   LI [1997/49]
TitleGerman:Optische Vorrichtung zur Messung von Streulicht[1997/49]
English:Optical measuring apparatus for light scattering[1997/49]
French:Appareil optique pour mesurer la lumière diffusée[1997/49]
Examination procedure25.05.1998Examination requested  [1998/30]
11.04.2001Despatch of a communication from the examining division (Time limit: M04)
17.05.2001Reply to a communication from the examining division
29.04.2002Despatch of communication of intention to grant (Approval: Yes)
27.08.2002Communication of intention to grant the patent
28.11.2002Fee for grant paid
28.11.2002Fee for publishing/printing paid
Opposition(s)27.11.2003No opposition filed within time limit [2004/08]
Fees paidRenewal fee
30.04.1999Renewal fee patent year 03
28.04.2000Renewal fee patent year 04
30.04.2001Renewal fee patent year 05
25.04.2002Renewal fee patent year 06
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Lapses during opposition  TooltipCH26.02.2003
FR26.02.2003
IT26.02.2003
LI26.02.2003
[2008/07]
Former [2006/14]CH26.02.2003
FR26.02.2003
LI26.02.2003
Former [2003/40]CH26.02.2003
LI26.02.2003
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