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Extract from the Register of European Patents

EP About this file: EP0857336

EP0857336 - METHOD AND APPARATUS FOR IDENTIFYING CHARACTERS ON A PLURALITY OF SILICON WAFERS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  19.03.2004
Database last updated on 24.08.2024
Most recent event   Tooltip25.07.2008Change - representativepublished on 27.08.2008  [2008/35]
Applicant(s)For all designated states
RECIF SA
ZI du Moulin, Route de Seilh
31840 Aussonne / FR
[1998/33]
Inventor(s)01 / POLI, Bernard
Route de Lagraulhet
F-31480 Cox / FR
02 / POLI, Alain
Lotissement Le Castelet
F-31840 Aussonne / FR
[1998/33]
Representative(s)Morelle, Guy Georges Alain
Cabinet Morelle & Bardou S.C.
9 Avenue de l'Europe
B.P. 72253
31522 Ramonville Cedex / FR
[N/P]
Former [2008/35]Morelle, Guy Georges Alain
Cabinet Morelle & Bardou S.C. 9 Avenue de l'Europe B.P. 72253
31522 Ramonville Cedex / FR
Former [1998/33]Morelle, Guy Georges Alain
Cabinet Morelle & Bardou, 5, Bd de la Méditerranée, B.P. 4127
31030 Toulouse Cedex 4 / FR
Application number, filing date97935629.225.07.1997
[1998/33]
WO1997FR01394
Priority number, dateFR1996000969829.07.1996         Original published format: FR 9609698
[1998/33]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO9804997
Date:05.02.1998
Language:FR
[1998/05]
Type: A1 Application with search report 
No.:EP0857336
Date:12.08.1998
Language:FR
The application published by WIPO in one of the EPO official languages on 05.02.1998 takes the place of the publication of the European patent application.
[1998/33]
Type: B1 Patent specification 
No.:EP0857336
Date:14.05.2003
Language:FR
[2003/20]
Search report(s)International search report - published on:EP05.02.1998
ClassificationIPC:G06K9/20
[1998/33]
CPC:
G06V10/145 (EP,US); G06V10/10 (KR)
Designated contracting statesAT,   BE,   CH,   DE,   ES,   GB,   IE,   IT,   LI,   NL,   SE [1998/33]
TitleGerman:VERFAHREN UND GERÄT ZUM IDENTIFIZIEREN VON ZEICHEN AUF MEHREREN SILIZIUMPLÄTTCHEN[1998/33]
English:METHOD AND APPARATUS FOR IDENTIFYING CHARACTERS ON A PLURALITY OF SILICON WAFERS[1998/33]
French:PROCEDE ET APPAREIL D'IDENTIFICATION DE CARACTERES FORMES SUR UNE PLURALITE DE PLAQUETTES DE SILICIUM[1998/33]
Entry into regional phase20.04.1998National basic fee paid 
20.04.1998Designation fee(s) paid 
20.04.1998Examination fee paid 
Examination procedure20.04.1998Examination requested  [1998/33]
01.10.2002Communication of intention to grant the patent
22.01.2003Fee for grant paid
22.01.2003Fee for publishing/printing paid
Opposition(s)17.02.2004No opposition filed within time limit [2004/19]
Fees paidRenewal fee
21.07.1999Renewal fee patent year 03
11.07.2000Renewal fee patent year 04
05.07.2001Renewal fee patent year 05
22.07.2002Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT14.05.2003
NL14.05.2003
BE31.07.2003
CH31.07.2003
LI31.07.2003
SE14.08.2003
ES25.08.2003
[2004/52]
Former [2004/33]AT14.05.2003
NL14.05.2003
CH31.07.2003
LI31.07.2003
SE14.08.2003
ES25.08.2003
Former [2004/03]AT14.05.2003
NL14.05.2003
SE14.08.2003
ES25.08.2003
Former [2004/02]NL14.05.2003
SE14.08.2003
Former [2003/50]SE14.08.2003
Cited inInternational search[A]US4983842  (TAKAMINE JUN [JP]) [A] 1-12* abstract *;
 [A]WO9511491  (RECIF SA [FR], et al) [A] 1-12 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.