EP0928486 - DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.09.2002 Database last updated on 29.10.2024 | Most recent event Tooltip | 18.01.2008 | Lapse of the patent in a contracting state New state(s): IT | published on 20.02.2008 [2008/08] | Applicant(s) | For all designated states Micron Technology, Inc. 8000 South Federal Way Boise, ID 83707-0006 / US | [N/P] |
Former [1999/28] | For all designated states MICRON TECHNOLOGY, INC. 8000 South Federal Way Boise, ID 83707-0006 / US | Inventor(s) | 01 /
FARNWORTH, Warren, M. 2004 S. Banner Nampa, ID 83686-7271 / US | 02 /
WARK, James, M. 5718 W. Drawbridge Drive Boise, ID 83703 / US | 03 /
NELSON, Eric, S. 3539 Buckboard Way Boise, ID 83713 / US | 04 /
DUESMAN, Kevin, G. 4884 S. Suntree Way Boise, ID 83706 / US | [1999/28] | Representative(s) | Ottevangers, Sietse Ulbe, et al Vereenigde, Postbus 87930 2508 DH Den Haag / NL | [N/P] |
Former [1999/28] | Ottevangers, Sietse Ulbe, et al Vereenigde Octrooibureaux Nieuwe Parklaan 97 2587 BN 's-Gravenhage / NL | Application number, filing date | 97938416.1 | 20.08.1997 | [1999/28] | WO1997US14564 | Priority number, date | US19960718173 | 19.09.1996 Original published format: US 718173 | [1999/28] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO9812706 | Date: | 26.03.1998 | Language: | EN | [1998/12] | Type: | A1 Application with search report | No.: | EP0928486 | Date: | 14.07.1999 | Language: | EN | The application published by WIPO in one of the EPO official languages on 26.03.1998 takes the place of the publication of the European patent application. | [1999/28] | Type: | B1 Patent specification | No.: | EP0928486 | Date: | 14.11.2001 | Language: | EN | [2001/46] | Search report(s) | International search report - published on: | EP | 26.03.1998 | Classification | IPC: | G11C29/00, G06F11/267 | [1999/28] | CPC: |
H01L22/22 (EP,US);
G11C29/00 (KR);
G11C29/46 (EP,US);
G11C29/785 (EP,US);
G11C29/80 (EP,US);
G11C29/808 (EP,US);
| C-Set: |
H01L2224/48091, H01L2924/00014 (EP,US)
| Designated contracting states | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [1999/28] | Extension states | AL | 06.04.1999 | LT | 06.04.1999 | LV | 06.04.1999 | RO | 06.04.1999 | SI | 06.04.1999 | Title | German: | VERFAHREN UND VORRICHTUNG ZUM PRÜFEN INTEGRIERTER SCHALTKREISCHIPS IN EINEM INTEGRIERTEN SCHALTKREISMODUL | [1999/28] | English: | DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE | [1999/28] | French: | DISPOSITIF ET PROCEDE D'ESSAI DES DES D'UN CIRCUIT INTEGRE DANS UN MODULE DE CIRCUIT INTEGRE | [1999/28] | Entry into regional phase | 06.04.1999 | National basic fee paid | 06.04.1999 | Designation fee(s) paid | 06.04.1999 | Examination fee paid | Examination procedure | 14.04.1998 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 06.04.1999 | Examination requested [1999/28] | 09.09.1999 | Despatch of a communication from the examining division (Time limit: M06) | 13.04.2000 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time | 22.06.2000 | Reply to a communication from the examining division | 08.02.2001 | Despatch of communication of intention to grant (Approval: Yes) | 28.03.2001 | Communication of intention to grant the patent | 28.06.2001 | Fee for grant paid | 28.06.2001 | Fee for publishing/printing paid | Opposition(s) | 15.08.2002 | No opposition filed within time limit [2002/45] | Request for further processing for: | 22.06.2000 | Request for further processing filed | 22.06.2000 | Full payment received (date of receipt of payment) Request granted | 10.07.2000 | Decision despatched | Fees paid | Renewal fee | 04.08.1999 | Renewal fee patent year 03 | 03.08.2000 | Renewal fee patent year 04 | 21.08.2001 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 14.11.2001 | BE | 14.11.2001 | CH | 14.11.2001 | FI | 14.11.2001 | FR | 14.11.2001 | GR | 14.11.2001 | IT | 14.11.2001 | LI | 14.11.2001 | NL | 14.11.2001 | DK | 14.02.2002 | PT | 14.02.2002 | SE | 14.02.2002 | ES | 30.05.2002 | [2008/08] |
Former [2006/14] | AT | 14.11.2001 | |
BE | 14.11.2001 | ||
CH | 14.11.2001 | ||
FI | 14.11.2001 | ||
FR | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
NL | 14.11.2001 | ||
DK | 14.02.2002 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
ES | 30.05.2002 | ||
Former [2004/04] | AT | 14.11.2001 | |
BE | 14.11.2001 | ||
CH | 14.11.2001 | ||
FI | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
NL | 14.11.2001 | ||
DK | 14.02.2002 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
ES | 30.05.2002 | ||
Former [2003/46] | AT | 14.11.2001 | |
BE | 14.11.2001 | ||
CH | 14.11.2001 | ||
FI | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
NL | 14.11.2001 | ||
DK | 14.02.2002 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2003/09] | AT | 14.11.2001 | |
BE | 14.11.2001 | ||
CH | 14.11.2001 | ||
FI | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
NL | 14.11.2001 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2003/06] | BE | 14.11.2001 | |
CH | 14.11.2001 | ||
FI | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
NL | 14.11.2001 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2003/01] | CH | 14.11.2001 | |
FI | 14.11.2001 | ||
GR | 14.11.2001 | ||
LI | 14.11.2001 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2002/49] | FI | 14.11.2001 | |
GR | 14.11.2001 | ||
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2002/48] | FI | 14.11.2001 | |
PT | 14.02.2002 | ||
SE | 14.02.2002 | ||
Former [2002/33] | FI | 14.11.2001 | |
SE | 14.02.2002 | ||
Former [2002/27] | SE | 14.02.2002 | Cited in | International search | [A]EP0218852 (SIEMENS AG [DE]) [A] 1,3-5,14-16,19-21 * column 2, line 34 - column 3, line 17 * * column 3, line 29 - line 41 ** figures 1,2,4 *; | [YA]EP0584739 (TOSHIBA KK [JP]) [Y] 19 * abstract * * column 1, line 10 - column 2, line 20 * [A] 1,2,9,12-14,18; | [XAY]US5305267 (HARAGUCHI YOSHIYUKI [JP], et al) [X] 1-5,7,9,10,12,14-18 * column A * * column 7, line 28 - column 8, line 54 * * column 9, line 26 - line 65 * * column 10, line 10 - line 30 * * figures 1,2 * [A] 8,11,20,21 [Y] 19 |