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Extract from the Register of European Patents

EP About this file: EP0865605

EP0865605 - DEVICE AND PROCESS FOR INSPECTING A SURFACE OF A GLASS MASTER [Right-click to bookmark this link]
Former [1998/39]GLASS MASTER SURFACE INSPECTOR
[2003/31]
StatusNo opposition filed within time limit
Status updated on  28.01.2005
Database last updated on 05.10.2024
Most recent event   Tooltip18.01.2008Lapse of the patent in a contracting state
New state(s): IT, PT		published on 20.02.2008  [2008/08]
Applicant(s)For all designated states
WEA Manufacturing, Inc.
1444 East Lackawanna Avenue, P.O. Box 321
Olyphant, PA 18447 / US
[N/P]
Former [2004/13]For all designated states
WEA Manufacturing, Inc.
1444 East Lackawanna Avenue, P.O. Box 321
Olyphant, PA 18447 / US
Former [1998/39]For all designated states
Wea Manufacturing Inc.
1444 East Lackawanna Avenue, P.O. Box 321
Olyphant, PA 18447 / US
Inventor(s)01 / SUHAN, John, M.
224 Second Street
Blakely, PA 18447 / US
[1998/39]
Representative(s)Lewin, John Harvey
Elkington and Fife LLP
Prospect House
8 Pembroke Road
Sevenoaks
Kent TN13 1XR / GB
[N/P]
Former [1998/39]Lewin, John Harvey
Elkington and Fife, Prospect House, 8 Pembroke Road
Sevenoaks, Kent TN13 1XR / GB
Application number, filing date97941167.505.09.1997
[1998/39]
WO1997IB01232
Priority number, dateUS1996070867105.09.1996         Original published format: US 708671
[1998/39]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO9810268
Date:12.03.1998
Language:EN
[1998/10]
Type: A1 Application with search report 
No.:EP0865605
Date:23.09.1998
Language:EN
The application published by WIPO in one of the EPO official languages on 12.03.1998 takes the place of the publication of the European patent application.
[1998/39]
Type: B1 Patent specification 
No.:EP0865605
Date:24.03.2004
Language:EN
[2004/13]
Search report(s)International search report - published on:US12.03.1998
(Supplementary) European search report - dispatched on:EP20.10.1999
ClassificationIPC:G01N21/00, G01N21/84, G01B11/30, G01N21/88, G11B7/00
[1999/49]
CPC:
G01N21/9506 (EP); G01B11/30 (EP); G01N21/958 (EP)
Former IPC [1998/39]G01N21/00, G01N21/84, G01B11/30
Designated contracting statesAT,   BE,   CH,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [1998/39]
TitleGerman:VORRICHTUNG UND VERFAHREN ZUM PRÜFEN EINER OBERFLÄCHE EINER RUNDEN GLASSCHEIBE[2003/31]
English:DEVICE AND PROCESS FOR INSPECTING A SURFACE OF A GLASS MASTER[2003/31]
French:DISPOSITIF ET PROCEDE D'INSPECTION D'UNE SURFACE D'UN DISQUE DE VERRE[2003/31]
Former [1998/39]VORRICHTUNG ZUM PRUFEN DER OBERFLACHE EINER GLASSCHEIBE
Former [1998/39]GLASS MASTER SURFACE INSPECTOR
Former [1998/39]DISPOSITIF D'INSPECTION DE LA SURFACE D'UN DISQUE DE VERRE
Entry into regional phase05.06.1998National basic fee paid 
05.06.1998Search fee paid 
05.06.1998Designation fee(s) paid 
05.06.1998Examination fee paid 
Examination procedure05.06.1998Examination requested  [1998/39]
01.07.2002Despatch of a communication from the examining division (Time limit: M06)
08.01.2003Reply to a communication from the examining division
10.07.2003Communication of intention to grant the patent
17.12.2003Fee for grant paid
17.12.2003Fee for publishing/printing paid
Opposition(s)28.12.2004No opposition filed within time limit [2005/11]
Fees paidRenewal fee
13.09.1999Renewal fee patent year 03
13.09.2000Renewal fee patent year 04
12.09.2001Renewal fee patent year 05
12.09.2002Renewal fee patent year 06
12.09.2003Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT24.03.2004
BE24.03.2004
CH24.03.2004
ES24.03.2004
FI24.03.2004
IT24.03.2004
LI24.03.2004
NL24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
PT24.08.2004
LU05.09.2004
IE06.09.2004
MC30.09.2004
[2008/08]
Former [2007/17]AT24.03.2004
BE24.03.2004
CH24.03.2004
ES24.03.2004
FI24.03.2004
LI24.03.2004
NL24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
LU05.09.2004
IE06.09.2004
MC30.09.2004
Former [2006/13]AT24.03.2004
BE24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
NL24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
IE06.09.2004
MC30.09.2004
Former [2005/46]AT24.03.2004
BE24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
IE06.09.2004
MC30.09.2004
Former [2005/22]AT24.03.2004
BE24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
MC30.09.2004
Former [2005/18]AT24.03.2004
BE24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
DK24.06.2004
GR24.06.2004
SE24.06.2004
Former [2005/01]AT24.03.2004
BE24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
GR24.06.2004
SE24.06.2004
Former [2004/51]AT24.03.2004
CH24.03.2004
FI24.03.2004
LI24.03.2004
GR24.06.2004
SE24.06.2004
Former [2004/43]AT24.03.2004
FI24.03.2004
GR24.06.2004
SE24.06.2004
Former [2004/41]FI24.03.2004
GR24.06.2004
SE24.06.2004
Former [2004/40]FI24.03.2004
SE24.06.2004
Documents cited:Search[Y]US4477890  (MOONEY DONALD G [US], et al) [Y] 1,4,5 * column 3, line 4 - line 40 * * column 4, line 56 - line 65 * * column 5, line 11 - line 23 * * figures 1B,2 *;
 [Y]US4954723  (TAKAHASHI IPPEI [JP], et al) [Y] 1,4,5 * abstract * * column 3, line 66 - column 4, line 37 * * figures 5,8B,8C *;
 [A]JPH07140089  (HITACHI ELECTR ENG) [A] 2-4* abstract *
International search[Y]US4865445  (KURIYAMA KAZUMI [JP], et al);
 [Y]US4954723  (TAKAHASHI IPPEI [JP], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.