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EP0862061
European procedure
Extract from the Register of European Patents
EP About this file: EP0862061
| EP0862061 - Circuit board inspection apparatus and method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.11.2003 Database last updated on 20.12.2024 | Most recent event Tooltip | 21.11.2003 | No opposition filed within time limit | published on 07.01.2004 [2004/02] | Applicant(s) | For all designated states Nidec-Read Corporation 126, Megawa, Makishima-cho Uji-city Kyoto 611-0041 / JP | [N/P] |
| Former [1998/36] | For all designated states Nidec-Read Corporation 126, Megawa, Makishima-cho Uji-city, Kyoto 611-0041 / JP | Inventor(s) | 01 /
Yamashita, Munehiro 126, Megawa, Makishima-cho Uji-city, Kyoto 611-0041 / JP | [1998/36] | Representative(s) | von Fischern, Bernhard, et al Hoffmann - Eitle Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | [N/P] |
| Former [1998/36] | von Fischern, Bernhard, Dipl.-Ing., et al Hoffmann - Eitle, Patent- und Rechtsanwälte, Arabellastrasse 4 81925 München / DE | Application number, filing date | 98103453.1 | 27.02.1998 | [1998/36] | Priority number, date | JP19970046127 | 28.02.1997 Original published format: JP 4612797 | [1998/36] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0862061 | Date: | 02.09.1998 | Language: | EN | [1998/36] | Type: | A3 Search report | No.: | EP0862061 | Date: | 02.02.2000 | [2000/05] | Type: | B1 Patent specification | No.: | EP0862061 | Date: | 15.01.2003 | Language: | EN | [2003/03] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 17.12.1999 | Classification | IPC: | G01R31/312, G01R31/28 | [2000/05] | CPC: |
G01R31/2805 (EP,US);
G01R31/2812 (EP,US);
G01R31/312 (EP,US);
H05K1/0266 (EP,US);
H05K1/11 (EP,US)
|
| Former IPC [1998/36] | G01R31/28 | Designated contracting states | DE, FR, GB [2000/41] |
| Former [1998/36] | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verfahren und Vorrichtung zum Prüfen von Leiterplatten | [1998/36] | English: | Circuit board inspection apparatus and method | [1998/36] | French: | Procédé et dispositif de contrôle de cartes de circuit | [1998/36] | Examination procedure | 17.07.2000 | Examination requested [2000/37] | 03.08.2000 | Loss of particular rights, legal effect: designated state(s) | 15.11.2000 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, DK, ES, FI, GR, IE, IT, LI, LU, MC, NL, PT, SE | 21.06.2001 | Request for accelerated examination filed | 10.08.2001 | Despatch of a communication from the examining division (Time limit: M04) | 10.08.2001 | Decision about request for accelerated examination - accepted: Yes | 14.12.2001 | Reply to a communication from the examining division | 17.01.2002 | Despatch of a communication from the examining division (Time limit: M04) | 17.05.2002 | Reply to a communication from the examining division | 12.07.2002 | Communication of intention to grant the patent | 12.11.2002 | Fee for grant paid | 12.11.2002 | Fee for publishing/printing paid | Opposition(s) | 16.10.2003 | No opposition filed within time limit [2004/02] | Fees paid | Renewal fee | 16.02.2000 | Renewal fee patent year 03 | 16.02.2001 | Renewal fee patent year 04 | 26.02.2002 | Renewal fee patent year 05 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 01.09.2000 | AT M01 Not yet paid | 01.09.2000 | BE M01 Not yet paid | 01.09.2000 | CH M01 Not yet paid | 01.09.2000 | DK M01 Not yet paid | 01.09.2000 | ES M01 Not yet paid | 01.09.2000 | FI M01 Not yet paid | 01.09.2000 | GR M01 Not yet paid | 01.09.2000 | IE M01 Not yet paid | 01.09.2000 | IT M01 Not yet paid | 01.09.2000 | LU M01 Not yet paid | 01.09.2000 | MC M01 Not yet paid | 01.09.2000 | NL M01 Not yet paid | 01.09.2000 | PT M01 Not yet paid | 01.09.2000 | SE M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]EP0551564 (HEWLETT PACKARD CO [US]) [X] 1-12 * abstract * * column 18, line 35 - column 19, line 36 *; | [A]EP0572060 (IBM [US]) [A] 1-13* abstract *; | [A]EP0633478 (SPEA SRL [IT]) [A] 1-13 * abstract *; | [A]EP0636887 (GENRAD INC [US]) [A] 1-13 * abstract * * column 4, line 22 - column 5, line 52 *; | [X]DE4417580 (HEWLETT PACKARD CO [US]) [X] 1-12 * abstract * * column 8, line 49 - line 60 *; | [X]JPH0854448 (OKANO HIGHTECH KK) [X] 1-13 * figures 2,3 *; | [L]US5747999 (YAMAOKA SYUUZI [JP]) [L] * abstract * * column 2, line 14 - line 60 * * column 4, line 13 - line 59 * | Examination | JPH03154879 |