EP0869351 - Measuring chip for optical analyzer [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 15.08.2008 Database last updated on 26.04.2025 | Most recent event Tooltip | 15.08.2008 | No opposition filed within time limit | published on 17.09.2008 [2008/38] | Applicant(s) | For all designated states DAI NIPPON PRINTING CO., LTD. 1-1, Ichigaya-Kaga-Cho 1-chome Shinjuku-ku Tokyo 162-01 / JP | [2007/41] |
Former [1998/41] | For all designated states DAI NIPPON PRINTING CO., LTD. 1-1, Ichigaya-Kaga-Cho 1-chome Shinjuku-ku Tokyo 162-01 / JP | Inventor(s) | 01 /
Nagata, Ryohei, Dai Nippon Printing Co. Ltd. 1-1, Ichigaya-Kaga-cho 1-chome Shinjuku-ku, Tokyo-To / JP | 02 /
Nakamura, Hiroyuki, Dai Nippon Printing Co. Ltd. 1-1, Ichigaya-Kaga-cho 1-chome Shinjuku-ku, Tokyo-To / JP | [1998/41] | Representative(s) | Müller-Boré & Partner Patentanwälte PartG mbB Friedenheimer Brücke 21 80639 München / DE | [N/P] |
Former [1998/41] | Müller-Boré & Partner Patentanwälte Grafinger Strasse 2 81671 München / DE | Application number, filing date | 98105524.7 | 26.03.1998 | [1998/41] | Priority number, date | JP19970073313 | 26.03.1997 Original published format: JP 7331397 | JP19970131315 | 21.05.1997 Original published format: JP 13131597 | JP19970179587 | 04.07.1997 Original published format: JP 17958797 | [1998/41] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0869351 | Date: | 07.10.1998 | Language: | EN | [1998/41] | Type: | A3 Search report | No.: | EP0869351 | Date: | 20.01.1999 | [1999/03] | Type: | B1 Patent specification | No.: | EP0869351 | Date: | 10.10.2007 | Language: | EN | [2007/41] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.11.1998 | Classification | IPC: | G01N21/55, G01N21/77, G01N21/78 | [1999/02] | CPC: |
G01N21/553 (EP,US)
|
Former IPC [1998/41] | G01N21/78 | Designated contracting states | DE, FR, GB [1999/39] |
Former [1998/41] | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Messchip für einen optischen Analysator | [2005/02] | English: | Measuring chip for optical analyzer | [1998/41] | French: | Chip de mesure pour un analyseur optique | [1998/41] |
Former [1998/41] | Messchip für einen optischesn Analysator | Examination procedure | 11.03.1999 | Examination requested [1999/19] | 04.04.2001 | Despatch of a communication from the examining division (Time limit: M06) | 15.10.2001 | Reply to a communication from the examining division | 27.02.2002 | Despatch of a communication from the examining division (Time limit: M04) | 20.06.2002 | Reply to a communication from the examining division | 06.12.2004 | Despatch of a communication from the examining division (Time limit: M04) | 13.04.2005 | Reply to a communication from the examining division | 18.04.2007 | Communication of intention to grant the patent | 23.08.2007 | Fee for grant paid | 23.08.2007 | Fee for publishing/printing paid | Opposition(s) | 11.07.2008 | No opposition filed within time limit [2008/38] | Fees paid | Renewal fee | 28.03.2000 | Renewal fee patent year 03 | 27.03.2001 | Renewal fee patent year 04 | 27.03.2002 | Renewal fee patent year 05 | 27.03.2003 | Renewal fee patent year 06 | 29.03.2004 | Renewal fee patent year 07 | 30.03.2005 | Renewal fee patent year 08 | 30.03.2006 | Renewal fee patent year 09 | 29.03.2007 | Renewal fee patent year 10 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4889427 (VAN VEEN JACOBUS J F [NL], et al) [A] 1,3,18* column A; figures 3,7,8,10; claim - *; | [A]ATE92186T (AMERSHAM INT PLC [GB]) [A] 1-3 * page 9, line 17 - line 39; figures 1-4; claim - *; | [A]US5327225 (BENDER WILLIAM J H [US], et al) [A] 1-3,17,18 * column A; figures 3,7,11,12,14; claim - *; | [A]US5397537 (KANDA ZENSHO [JP], et al) [A] 1,2 * column A; figure 3; claim 1 *; | [A]DE4424336 (SIGL HUBERT [DE]) [A] 1-3,28 * figures 1-7; claim - * |