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Extract from the Register of European Patents

EP About this file: EP0871228

EP0871228 - Semiconductor substrate, semiconductor device and method of manufacturing the same [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  09.04.2010
Database last updated on 02.09.2024
Most recent event   Tooltip09.04.2010Refusal of applicationpublished on 12.05.2010  [2010/19]
Applicant(s)For all designated states
Panasonic Corporation
1006, Oaza Kadoma
Kadoma-shi
Osaka 571-8501 / JP
[N/P]
Former [2008/47]For all designated states
Panasonic Corporation
1006, Oaza Kadoma Kadoma-shi
Osaka 571-8501 / JP
Former [2001/37]For all designated states
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, Oaza Kadoma
Kadoma-shi, Osaka / JP
Former [1998/42]For all designated states
Matsushita Electronics Corporation
1-1, Saiwai-cho
Takatsuki-shi, Osaka 569-1193 / JP
Inventor(s)01 / Hashimoto, Tadao
1-23-2-202, Mizudo-cho
Amagasaki-shi, Hyogo 661-0027 / JP
02 / Imafuji, Osamu
1-10-5-507, Kamihamuro
Takatsuki-shi, Osaka 569-1044 / JP
03 / Yuri, Masaaki
6-26-1201, Funaki-cho
Ibaraki-shi, Osaka 567-0829 / JP
04 / Ishida, Masahiro
2-30-10, Takayanagi
Neyagawa-shi, Osaka 572-0051 / JP
[1998/42]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[N/P]
Former [1998/42]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date98106483.508.04.1998
[1998/42]
Priority number, dateJP1997009067509.04.1997         Original published format: JP 9067597
[1998/42]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0871228
Date:14.10.1998
Language:EN
[1998/42]
Type: A3 Search report 
No.:EP0871228
Date:24.10.2001
[2001/43]
Search report(s)(Supplementary) European search report - dispatched on:EP10.09.2001
ClassificationIPC:H01L33/00, H01S3/19, H01L27/15
[2001/43]
CPC:
H01L33/007 (EP,US); B82Y20/00 (EP,US); C30B25/18 (EP,US);
H01S2301/173 (EP,US); H01S5/0207 (EP,US); H01S5/021 (EP,US);
H01S5/2231 (EP,US); H01S5/3201 (EP,US); H01S5/34333 (EP,US) (-)
Former IPC [1998/42]H01L33/00, H01S3/19
Designated contracting statesDE,   GB [2002/29]
Former [1998/42]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Halbleitersubstrat, Halbleitervorrichtung und Herstellungsverfahren[1998/42]
English:Semiconductor substrate, semiconductor device and method of manufacturing the same[1998/42]
French:Substrat semi-conducteur, dispositif semi-conducteur et procédé de fabrication[1998/42]
Examination procedure28.03.2002Examination requested  [2002/23]
11.05.2006Despatch of a communication from the examining division (Time limit: M06)
17.11.2006Reply to a communication from the examining division
27.08.2007Despatch of a communication from the examining division (Time limit: M06)
07.02.2008Reply to a communication from the examining division
17.11.2009Application refused, date of legal effect [2010/19]
17.11.2009Date of oral proceedings
10.12.2009Despatch of communication that the application is refused, reason: substantive examination [2010/19]
10.12.2009Minutes of oral proceedings despatched
Fees paidRenewal fee
26.04.2000Renewal fee patent year 03
26.04.2001Renewal fee patent year 04
29.04.2002Renewal fee patent year 05
29.04.2003Renewal fee patent year 06
30.04.2004Renewal fee patent year 07
29.04.2005Renewal fee patent year 08
29.03.2006Renewal fee patent year 09
27.04.2007Renewal fee patent year 10
26.03.2008Renewal fee patent year 11
29.04.2009Renewal fee patent year 12
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Documents cited:Search[Y]EP0332329  (FUJITSU LTD [JP]) [Y] 15,17 * the whole document *;
 [XY]US4990972  (SATOH SHIRO [JP], et al) [X] 1,2,4,6-14,16 * column 3, line 42 - column 4, line 26 * [Y] 15,17;
 [X]JPH08330628  (TOSHIBA CORP) [X] 1,2,4,6,7,9,10,12-14,16;
 [PX]EP0810674  (SUMITOMO ELECTRIC INDUSTRIES [JP]) [PX] 1,2,4,6-14,16* the whole document *;
 [E]US5864171  (YAMAMOTO MASAHIRO [JP], et al) [E] 1,2,4,6,7,9,10,12-14,16 * column 13, line 38 - column 15, line 21 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.