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Extract from the Register of European Patents

EP About this file: EP0889516

EP0889516 - Formation of sub-lithographic features [Right-click to bookmark this link]
Former [1999/01]Formation of sublithographic features
[1999/41]
StatusNo opposition filed within time limit
Status updated on  15.11.2002
Database last updated on 14.09.2024
Most recent event   Tooltip15.11.2002No opposition filed within time limitpublished on 02.01.2003  [2003/01]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [1999/01]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
80333 München / DE
Inventor(s)01 / Ploessl, Robert
11816 Park Forest Court
Glen Allen, VA 23060 / US
[1999/01]
Representative(s)Westphal, Mussgnug & Partner Patentanwälte mbB
Am Riettor 5
78048 Villingen-Schwenningen / DE
[N/P]
Former [1999/01]Patentanwälte Westphal, Buchner, Mussgnug Neunert, Göhring
Waldstrasse 33
78048 Villingen-Schwenningen / DE
Application number, filing date98109829.629.05.1998
[1999/01]
Priority number, dateUS1997088473230.06.1997         Original published format: US 884732
[1999/01]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0889516
Date:07.01.1999
Language:EN
[1999/01]
Type: A3 Search report 
No.:EP0889516
Date:13.10.1999
[1999/41]
Type: B1 Patent specification 
No.:EP0889516
Date:02.01.2002
Language:EN
[2002/01]
Search report(s)(Supplementary) European search report - dispatched on:EP31.08.1999
ClassificationIPC:H01L21/768
[1999/01]
CPC:
H01L21/76801 (EP,US); H01L21/28 (KR); H01L21/76816 (EP,US)
Designated contracting statesDE,   FR,   GB,   IE,   IT,   NL [2000/26]
Former [1999/01]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Herstellung von sub-lithographischen Strukturen[1999/01]
English:Formation of sub-lithographic features[1999/41]
French:Formation de structures sub-lithographique[1999/01]
Former [1999/01]Formation of sublithographic features
Examination procedure08.12.1999Examination requested  [2000/07]
14.04.2000Loss of particular rights, legal effect: designated state(s)
20.07.2000Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, LI, LU, MC, PT, SE
01.12.2000Despatch of a communication from the examining division (Time limit: M04)
17.03.2001Reply to a communication from the examining division
27.04.2001Despatch of communication of intention to grant (Approval: Yes)
20.06.2001Communication of intention to grant the patent
20.09.2001Fee for grant paid
20.09.2001Fee for publishing/printing paid
Opposition(s)03.10.2002No opposition filed within time limit [2003/01]
Fees paidRenewal fee
20.05.2000Renewal fee patent year 03
23.05.2001Renewal fee patent year 04
Penalty fee
Penalty fee Rule 85a EPC 1973
17.05.2000AT   M01   Not yet paid
17.05.2000BE   M01   Not yet paid
17.05.2000CH   M01   Not yet paid
17.05.2000CY   M01   Not yet paid
17.05.2000DK   M01   Not yet paid
17.05.2000ES   M01   Not yet paid
17.05.2000FI   M01   Not yet paid
17.05.2000GR   M01   Not yet paid
17.05.2000LU   M01   Not yet paid
17.05.2000MC   M01   Not yet paid
17.05.2000PT   M01   Not yet paid
17.05.2000SE   M01   Not yet paid
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Documents cited:Search[A]JPH10107161  ;
 [A]JPH09148430  ;
 [A]US5506172  (TANG SANH [US]) [A] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19980731), vol. 098, no. 009, & JP10107161 A 19980424 (SONY CORP) [A] 1 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19971031), vol. 097, no. 010, & JP09148430 A 19970606 (SONY CORP) [A] 1 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.