EP0911109 - Method for monitoring laser weld quality via plasma light intensity measurements [Right-click to bookmark this link] | |||
Former [1999/17] | Method an apparatus for monitoring laser weld quality via plasma light intensity measurements | ||
[2003/01] | Status | No opposition filed within time limit Status updated on 16.07.2004 Database last updated on 10.05.2025 | Most recent event Tooltip | 16.07.2004 | No opposition filed within time limit | published on 01.09.2004 [2004/36] | Applicant(s) | For all designated states TRW INC. One Space Park Redondo Beach California 90278 / US | [N/P] |
Former [1999/17] | For all designated states TRW Inc. One Space Park Redondo Beach, California 90278 / US | Inventor(s) | 01 /
Chou, Mau-Song 5526 Scotwood Drive Rancho Palos Verdes, CA 90275 / US | 02 /
Shih, Christopher C. 19945 Linda Torrance, CA 90503 / US | 03 /
Shirk, Bryan W. 2662 North Robin Lane Mesa, Arizona 85213 / US | [1999/17] | Representative(s) | Schmidt, Steffen J. Wuesthoff & Wuesthoff Patentanwälte und Rechtsanwalt PartG mbB Schweigerstrasse 2 81541 München / DE | [N/P] |
Former [1999/17] | Schmidt, Steffen J., Dipl.-Ing. Wuesthoff & Wuesthoff, Patent- und Rechtsanwälte, Schweigerstrasse 2 81541 München / DE | Application number, filing date | 98119779.1 | 23.10.1998 | [1999/17] | Priority number, date | US19970956607 | 23.10.1997 Original published format: US 956607 | [1999/17] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0911109 | Date: | 28.04.1999 | Language: | EN | [1999/17] | Type: | A3 Search report | No.: | EP0911109 | Date: | 22.03.2000 | [2000/12] | Type: | B1 Patent specification | No.: | EP0911109 | Date: | 10.09.2003 | Language: | EN | [2003/37] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 08.02.2000 | Classification | IPC: | B23K26/02 | [1999/17] | CPC: |
B23K26/032 (EP,US);
B23K26/06 (EP,US);
B23K26/064 (EP,US);
B23K26/0648 (EP,US);
B23K26/0665 (EP,US);
B23K26/123 (EP,US);
B23K26/21 (EP)
(-)
| Designated contracting states | DE, IT [2000/48] |
Former [1999/17] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verfahren zur Überwachung der Schweissqualität durch Messungen der Plasmalichtintensität | [2003/01] | English: | Method for monitoring laser weld quality via plasma light intensity measurements | [2003/01] | French: | Méthode de contrôle de la qualité du soudage par mesures de l'intensité lumineuse du plasma | [2003/01] |
Former [1999/17] | Verfahren und Vorrichtung zur Überwachung der Schweissqualität durch Messungen der Plasmalichtintensität | ||
Former [1999/17] | Method an apparatus for monitoring laser weld quality via plasma light intensity measurements | ||
Former [1999/17] | Méthode et appareil de contrôle de la qualité du soudage par mesures de l'intensité lumineuse du plasma | Examination procedure | 11.11.1998 | Amendment by applicant (claims and/or description) | 13.07.2000 | Examination requested [2000/36] | 15.04.2002 | Despatch of a communication from the examining division (Time limit: M06) | 07.10.2002 | Reply to a communication from the examining division | 22.01.2003 | Communication of intention to grant the patent | 11.07.2003 | Fee for grant paid | 11.07.2003 | Fee for publishing/printing paid | Opposition(s) | 14.06.2004 | No opposition filed within time limit [2004/36] | Fees paid | Renewal fee | 09.10.2000 | Renewal fee patent year 03 | 08.10.2001 | Renewal fee patent year 04 | 07.10.2002 | Renewal fee patent year 05 |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US4839493 (HERZIGER GERD [DE], et al) [Y] 3,6,11 * figure 3A *; | [X]DE4124162 (OVERMEYER, LUDGER) [X] 9,12 * column 2, line 7 - line 63; figure . *; | [Y]US5256852 (BOUDOT CECILE [FR]) [Y] 13 * column 1, line 49 - column 2, line 26 *; | [A]US5272312 (JURCA MARIUS-CHRISTIAN [DE]); | [X]US5329091 (BISSINGER NORBERT [DE]) [X] 9,12 * column 3, line 64 - column 4, line 27; figures 1,2 *; | [A]DE4313287 (FRAUNHOFER GES FORSCHUNG [DE]); | [XAY]US5360960 (SHIRK BRYAN W [US]) [X] 1,2,9,12 * column 2, line 43 - column 4, line 47; figures 1,2 * [A] 4,5,7,8,10,14 [Y] 3,6,11,13; | [A]DE4439714 (FRAUNHOFER GES FORSCHUNG [DE]) [A] 13 |