EP0921619 - A power source circuit of a semiconductor integrated circuit [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 19.11.1999 Database last updated on 27.07.2024 | Most recent event Tooltip | 19.11.1999 | Withdrawal of application | published on 05.01.2000 [2000/01] | Applicant(s) | For all designated states NEC Corporation 7-1, Shiba 5-chome Minato-ku Tokyo 108-8001 / JP | [N/P] |
Former [1999/23] | For all designated states NEC CORPORATION 7-1, Shiba 5-chome Minato-ku Tokyo / JP | Inventor(s) | 01 /
Hayashimoto, Hajime, NEC IC Microcomputer Sys. Ltd 403-53, Kosugimachi 1-chome, Nakahara-ku Kawaski-shi, Kanagawa / JP | [1999/23] | Representative(s) | Glawe, Delfs, Moll Partnerschaft mbB von Patent- und Rechtsanwälten Postfach 26 01 62 80058 München / DE | [N/P] |
Former [1999/23] | Glawe, Delfs, Moll & Partner Patentanwälte Postfach 26 01 62 80058 München / DE | Application number, filing date | 98123288.7 | 07.12.1998 | [1999/23] | Priority number, date | JP19970337472 | 08.12.1997 Original published format: JP 33747297 | [1999/23] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0921619 | Date: | 09.06.1999 | Language: | EN | [1999/23] | Type: | A3 Search report | No.: | EP0921619 | Date: | 22.12.1999 | [1999/51] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 05.11.1999 | Classification | IPC: | H02H9/04, H01L27/02 | [1999/23] | CPC: |
G11C5/14 (KR);
H01L27/0629 (EP);
H02H9/046 (EP)
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [1999/23] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | Stromversorgungsschaltung für eine integrierte Halbleiterschaltung | [1999/23] | English: | A power source circuit of a semiconductor integrated circuit | [1999/23] | French: | Circuit d'alimentation pour circuit intégré semi-conducteur | [1999/23] | Examination procedure | 04.11.1999 | Application withdrawn by applicant [2000/01] |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US5625278 (THIEL FRANK L [US], et al) [Y] 1-11 * the whole document *; | [Y]EP0656661 (NIPPON DENSO CO [JP]) [Y] 1-11 * column 6, line 41 - column 8, line 48 * |