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EP0866341
European procedure
Extract from the Register of European Patents
EP About this file: EP0866341
| EP0866341 - Alternating current magnetic force microscopy system with probe having integrated coil [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 13.10.2006 Database last updated on 16.07.2024 | Most recent event Tooltip | 21.11.2008 | Change - lapse in a contracting state Updated state(s): FR | published on 24.12.2008 [2008/52] | Applicant(s) | For all designated states International Business Machines Corporation Armonk, NY 10504 / US | [2005/49] |
| Former [1998/39] | For all designated states INTERNATIONAL BUSINESS MACHINES CORPORATION Armonk, NY 10504 / US | Inventor(s) | 01 /
Moser, Andreas 388B Nature Drive San Jose, California 95123 / US | 02 /
Weller, Dieter Klaus 7080 Brooktree Way San Jose, California 95120 / US | [1998/39] | Representative(s) | Burt, Roger James, et al IBM United Kingdom Limited Intellectual Property Department Hursley Park Winchester Hampshire SO21 2JN / GB | [N/P] |
| Former [1999/37] | Burt, Roger James, Dr., et al IBM United Kingdom Limited Intellectual Property Department Hursley Park Winchester Hampshire SO21 2JN / GB | ||
| Former [1998/39] | Burrington, Alan Graham Headford Alan Burrington & Associates 4 Burney Close Great Bookham Leatherhead, Surrey KT22 9HW / GB | Application number, filing date | 98301117.2 | 16.02.1998 | [1998/39] | Priority number, date | US19970821982 | 20.03.1997 Original published format: US 821982 | [1998/39] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0866341 | Date: | 23.09.1998 | Language: | EN | [1998/39] | Type: | A3 Search report | No.: | EP0866341 | Date: | 25.07.2001 | [2001/30] | Type: | B1 Patent specification | No.: | EP0866341 | Date: | 07.12.2005 | Language: | EN | [2005/49] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.06.2001 | Classification | IPC: | G01R33/038 | [1998/39] | CPC: |
G01Q60/54 (EP,US);
B82Y35/00 (US);
G01Q60/56 (EP,US);
G01R33/0385 (EP,US);
B82Y25/00 (US);
Y10S977/849 (EP,US);
Y10S977/86 (EP,US);
Y10S977/865 (EP,US);
Y10S977/873 (EP,US);
Y10S977/887 (EP,US)
(-)
| Designated contracting states | DE, FR, GB [2002/16] |
| Former [1998/39] | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Wechselstrom Magnetkraftmikroskop mit integriertem Spulkopf | [2005/26] | English: | Alternating current magnetic force microscopy system with probe having integrated coil | [1998/39] | French: | Système de microscope à force magnétique à courant alternatif muni d'une tête comportant un bobinage intégré | [2005/26] |
| Former [1998/39] | Wechselstrom Magnetkraftmikroskop mit integrierten Spulkopf | ||
| Former [1998/39] | Système d'un microscope à force magnétique à courant alternatif muni d'un tête comportant un bobinage intégré | Examination procedure | 09.08.2001 | Examination requested [2001/41] | 26.01.2002 | Loss of particular rights, legal effect: designated state(s) | 03.06.2002 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, DK, ES, FI, GR, IE, IT, LU, MC, NL, PT, SE | 06.04.2004 | Despatch of a communication from the examining division (Time limit: M06) | 07.10.2004 | Reply to a communication from the examining division | 24.06.2005 | Communication of intention to grant the patent | 29.08.2005 | Fee for grant paid | 29.08.2005 | Fee for publishing/printing paid | Opposition(s) | 08.09.2006 | No opposition filed within time limit [2006/46] | Fees paid | Renewal fee | 17.02.2000 | Renewal fee patent year 03 | 15.02.2001 | Renewal fee patent year 04 | 14.02.2002 | Renewal fee patent year 05 | 13.02.2003 | Renewal fee patent year 06 | 16.02.2004 | Renewal fee patent year 07 | 15.02.2005 | Renewal fee patent year 08 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 06.03.2002 | AT M01 Not yet paid | 06.03.2002 | BE M01 Not yet paid | 06.03.2002 | CH M01 Not yet paid | 06.03.2002 | DK M01 Not yet paid | 06.03.2002 | ES M01 Not yet paid | 06.03.2002 | FI M01 Not yet paid | 06.03.2002 | GR M01 Not yet paid | 06.03.2002 | IE M01 Not yet paid | 06.03.2002 | IT M01 Not yet paid | 06.03.2002 | LU M01 Not yet paid | 06.03.2002 | MC M01 Not yet paid | 06.03.2002 | NL M01 Not yet paid | 06.03.2002 | PT M01 Not yet paid | 06.03.2002 | SE M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | FR | 07.12.2005 | [2008/52] |
| Former [2008/40] | FR | 28.02.2006 | Documents cited: | Search | [A]US4629984 (SCALESE JOSEPH J [US]) [A] 1* abstract *; | [Y]US5266897 (WATANUKI OSAAKI [JP], et al) [Y] 1 * abstract * * column 8, line 50 - column 9, line 29 *; | [Y]US5454158 (FONTANA JR ROBERT E [US], et al) [Y] 1 * abstract *; | [A] - ANONYMOUS, "Magneto-Registive-Head Tester for Simultaneous Measurement of Topography of Head Surface and High-Frequency Magnetic Sensitivity", IBM TECHNICAL DISCLOSURE BULLETIN, New York, US, (19941201), vol. 37, no. 12, pages 153 - 154, XP002168628 [A] 1 * the whole document * |