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Extract from the Register of European Patents

EP About this file: EP0889511

EP0889511 - Trench contact process [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  08.08.2008
Database last updated on 24.07.2024
Most recent event   Tooltip08.08.2008Refusal of applicationpublished on 10.09.2008  [2008/37]
Applicant(s)For all designated states
HARRIS CORPORATION
1025 West NASA Boulevard
Melbourne, Florida 32919 / US
[N/P]
Former [1999/01]For all designated states
HARRIS CORPORATION
1025 West NASA Boulevard
Melbourne Florida 32919 / US
Inventor(s)01 / Huang, Quin
208 Cherokee Drive
Blacksburg, Virginia / US
[1999/01]
Representative(s)Van Berlyn, Ronald Gilbert
30 The Green Calne
Wiltshire SN11 8DJ / GB
[N/P]
Former [1999/01]van Berlyn, Ronald Gilbert
23, Centre Heights
London NW3 6JG / GB
Application number, filing date98305023.825.06.1998
[1999/01]
Priority number, dateUS1997088587930.06.1997         Original published format: US 885879
[1999/01]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0889511
Date:07.01.1999
Language:EN
[1999/01]
Type: A3 Search report 
No.:EP0889511
Date:31.03.1999
[1999/13]
Search report(s)(Supplementary) European search report - dispatched on:EP12.02.1999
ClassificationIPC:H01L21/336, H01L21/331, H01L29/78, H01L29/739
[1999/01]
CPC:
H01L29/7813 (EP,US); H01L21/76 (KR); H01L29/66348 (EP,US);
H01L29/66727 (EP,US); H01L29/7396 (EP,US); H01L29/7397 (EP,US);
H01L29/7811 (EP,US); H01L29/1095 (EP,US); H01L29/41766 (EP,US) (-)
Designated contracting statesDE,   FR,   GB,   IT [1999/50]
Former [1999/01]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Graben-Kontakt-Verfahren[1999/01]
English:Trench contact process[1999/01]
French:Procédé de contact en tranchée[1999/01]
Examination procedure30.09.1999Examination requested  [1999/48]
25.03.2004Despatch of a communication from the examining division (Time limit: M06)
25.09.2004Reply to a communication from the examining division
04.11.2004Despatch of a communication from the examining division (Time limit: M04)
17.02.2005Reply to a communication from the examining division
29.07.2005Observations by third parties
08.04.2008Despatch of communication that the application is refused, reason: substantive examination [2008/37]
18.04.2008Application refused, date of legal effect [2008/37]
Fees paidRenewal fee
05.06.2000Renewal fee patent year 03
06.06.2001Renewal fee patent year 04
24.06.2002Renewal fee patent year 05
23.06.2003Renewal fee patent year 06
23.06.2004Renewal fee patent year 07
21.06.2005Renewal fee patent year 08
28.06.2006Renewal fee patent year 09
27.06.2007Renewal fee patent year 10
25.06.2008Renewal fee patent year 11
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Documents cited:Search[Y]US4853345  (HIMELICK JAMES M [US]) [Y] 1 * column 3, line 6; figures 1,2 *;
 [XA]DE4300806  (SIEMENS AG [DE]) [X] 2-4 * figures 1-8 * [A] 1;
 [XA]US5366914  (TAKAHASHI NOBUMITSU [JP], et al) [X] 2-4 * figures 3,4 * [A] 1;
 [A]WO9630947  (SILICONIX INC [US]) [A] 1* figure 6 *;
 [XY]EP0747967  (SGS THOMSON MICROELECTRONICS [US]) [X] 2-5 * column 6, line 35 - column 7, line 54; figures 3,4 * [Y] 1
otherJPS63224260
 US4879254
 WO9747045
    - MATSUMOTO S. ET AL, "ULTRALOW SPECIFIC ON RESISTANCE UMOSFET WITH TRENCH CONTACTS FOR SOURCE AND BODY REGIONS REALISED BY SELFALIGNED PROCESS", (19910829), vol. 27, no. 18, pages 1640 - 1642, XP000264480

DOI:   http://dx.doi.org/10.1049/el:19911025
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.