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EP0890820
European procedure
Extract from the Register of European Patents
EP About this file: EP0890820
| EP0890820 - Scanning probe microscope [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 28.01.2005 Database last updated on 02.09.2024 | Most recent event Tooltip | 28.01.2005 | No opposition filed within time limit | published on 16.03.2005 [2005/11] | Applicant(s) | For all designated states JEOL LTD. 1-2, Musashino 3-chome Akishima Tokyo 196-8558 / JP | [N/P] |
| Former [1999/02] | For all designated states Jeol Ltd. 1-2, Musashino 3-chome Akishima, Tokyo 196-8558 / JP | Inventor(s) | 01 /
Kitamura, Shinichi 2-8-1, Yokota Hidaka, Saitama, 350-1257 / JP | 02 /
Sueyoshi, Takashi 1-21-304, Fujimidai 1-27 Kunitachi, Tokyo, 186-003 / JP | [1999/02] | Representative(s) | Cross, Rupert Edward Blount, et al Boult Wade Tennant Verulam Gardens 70 Gray's Inn Road London WC1X 8BT / GB | [N/P] |
| Former [1999/02] | Cross, Rupert Edward Blount, et al BOULT WADE TENNANT, 27 Furnival Street London EC4A 1PQ / GB | Application number, filing date | 98305412.3 | 08.07.1998 | [1999/02] | Priority number, date | JP19970182305 | 08.07.1997 Original published format: JP 18230597 | [1999/02] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0890820 | Date: | 13.01.1999 | Language: | EN | [1999/02] | Type: | B1 Patent specification | No.: | EP0890820 | Date: | 24.03.2004 | Language: | EN | [2004/13] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.10.1998 | Classification | IPC: | G01B7/34, G01N27/00, G01N27/22 | [1999/02] | CPC: |
G01Q60/32 (EP,US);
G01Q60/30 (EP,US);
Y10S977/851 (EP,US);
Y10S977/852 (EP,US);
Y10S977/86 (EP,US);
Y10S977/873 (EP,US)
| Designated contracting states | DE, FR, GB [1999/38] |
| Former [1999/02] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Rastersondenmikroskop | [1999/02] | English: | Scanning probe microscope | [1999/02] | French: | Microscope à sonde de balayage | [1999/02] | Examination procedure | 02.02.1999 | Examination requested [1999/13] | 31.07.2002 | Despatch of a communication from the examining division (Time limit: M06) | 20.02.2003 | Reply to a communication from the examining division | 16.07.2003 | Communication of intention to grant the patent | 13.01.2004 | Fee for grant paid | 13.01.2004 | Fee for publishing/printing paid | Opposition(s) | 28.12.2004 | No opposition filed within time limit [2005/11] | Request for further processing for: | 20.02.2003 | Request for further processing filed | 20.02.2003 | Full payment received (date of receipt of payment) Request granted | 07.03.2003 | Decision despatched | Fees paid | Renewal fee | 29.05.2000 | Renewal fee patent year 03 | 25.05.2001 | Renewal fee patent year 04 | 14.06.2002 | Renewal fee patent year 05 | 23.05.2003 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [YA]US5631410 (KITAMURA SHINICHI [JP]) [Y] 1-3,5 * the whole document * [A] 4; | [Y]US5440121 (YASUTAKE MASATOSHI [JP], et al) [Y] 1-3,5 * the whole document *; | [A]US5168159 (YAGI AKIRA [JP]) [A] 1-5; | [A]US5185572 (YAGI AKIRA [JP], et al) [A] 1-5; | [A]US5267471 (ABRAHAM DAVID W [US], et al) [A] 1-5 * the whole document *; | [A]JPH09120593 ; | [PA]US5777977 (FUJIWARA ICHIRO [JP], et al) [PA] 1-5; | [A] - PATENT ABSTRACTS OF JAPAN, (19970930), vol. 097, no. 009, & JP09120593 A 19970506 (SONY CORP) [A] 1-5 * abstract * | [A] - YASUTAKE M ET AL, "SURFACE POTENTIAL MEASUREMENTS USING THE KELVIN PROBE FORCE MICROSCOPE", THIN SOLID FILMS, (199602), vol. 273, no. 1/02, pages 279 - 283, XP000624951 [A] 1-5 * the whole document * DOI: http://dx.doi.org/10.1016/0040-6090(95)06772-8 |