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Extract from the Register of European Patents

EP About this file: EP0903566

EP0903566 - Imaging system functioning on submillimeter waves [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  07.10.2005
Database last updated on 03.10.2024
Most recent event   Tooltip07.10.2005No opposition filed within time limitpublished on 23.11.2005  [2005/47]
Applicant(s)For all designated states
Oxford Instruments Analytical Oy
Nihtisillankuja 5
02631 Espoo / FI
[2005/01]
Former [1999/12]For all designated states
Metorex International OY
Nihtisillankuja 5
02630 Espoo / FI
Inventor(s)01 / Luukanen, Arttu
Aurorankatu 13 A 2
00100 Helsinki / FI
02 / Sipilä, Heikki
Hannuksenkuja 1 C
02270 Espoo / FI
03 / Viitanen, Veli-Pekka
Männistöntie 6 E 17
02880 Veikkola / FI
[1999/12]
Representative(s)Brax, Matti Juhani
Berggren Oy
P.O. Box 16
00101 Helsinki / FI
[N/P]
Former [1999/12]Brax, Matti Juhani
Berggren Oy Ab, P.O. Box 16
00101 Helsinki / FI
Application number, filing date98660091.415.09.1998
[1999/12]
Priority number, dateFI1997000369916.09.1997         Original published format: FI 973699
[1999/12]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0903566
Date:24.03.1999
Language:EN
[1999/12]
Type: A3 Search report 
No.:EP0903566
Date:03.05.2000
[2000/18]
Type: B1 Patent specification 
No.:EP0903566
Date:01.12.2004
Language:EN
[2004/49]
Search report(s)(Supplementary) European search report - dispatched on:EP22.03.2000
ClassificationIPC:G01J5/20
[1999/12]
CPC:
G01J3/2823 (EP,US); H04N5/30 (US); G01J5/0837 (EP,US);
G01J5/20 (EP,US); G01S17/89 (EP,US); G01S3/784 (EP,US);
G01V8/005 (EP,US); G01S13/887 (EP,US) (-)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2001/02]
Former [1999/12]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Bildgebendes System mit Submillimeterwellen[1999/12]
English:Imaging system functioning on submillimeter waves[1999/12]
French:Système d'imagerie avec des ondes submillimétriques[1999/12]
Examination procedure23.09.2000Examination requested  [2000/48]
13.10.2003Despatch of a communication from the examining division (Time limit: M04)
07.01.2004Reply to a communication from the examining division
15.06.2004Communication of intention to grant the patent
06.10.2004Fee for grant paid
06.10.2004Fee for publishing/printing paid
Opposition(s)02.09.2005No opposition filed within time limit [2005/47]
Fees paidRenewal fee
28.09.2000Renewal fee patent year 03
20.09.2001Renewal fee patent year 04
20.09.2002Renewal fee patent year 05
23.09.2003Renewal fee patent year 06
21.09.2004Renewal fee patent year 07
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Documents cited:Search[A]EP0354369  (TEXAS INSTRUMENTS INC [US]) [A] 1* page 3, line 31 - line 40; figure 1 *;
 [A]US5171733  (HU QING [US]) [A] 1 * column 3, line 7 - line 15 * * column 4, line 51 - line 61 * * column 5, line 20 - line 28 *
ExaminationEP0459010
 WO9325877
 US5286976
 FR2735574
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.